scholarly journals High efficiency noble gas electron impact ion source for isotope separation

2016 ◽  
Author(s):  
A. D. Appelhans ◽  
J. E. Olson ◽  
D. A. Dahl ◽  
M. B. Ward
Keyword(s):  
Electron Impact ◽  
High Efficiency ◽  
Noble Gas ◽  
Isotope Separation ◽  
Ion Source

A high efficiency cavity ion source using TIMS for nuclear forensic analysis

2007 ◽  
Vol 444-445 ◽  
pp. 660-662 ◽  
Author(s):  
S. Bürger ◽  
L.R. Riciputi ◽  
S. Turgeon ◽  
D. Bostick ◽  
E. McBay ◽  
...  
Keyword(s):  
High Efficiency ◽  
Forensic Analysis ◽  
Ion Source ◽  
Nuclear Forensic

scholarly journals Interaction of Fullerenes with Organosilanes in the Ionization Chamber of a Mass Spectrometer under Electron Impact and the Reaction of C60with Tetraphenylsilane in Solution under UV Irradiation

2016 ◽  
Vol 2016 ◽  
pp. 1-9
Author(s):  
Yury I. Lyakhovetsky ◽  
Elena A. Shilova ◽  
Alexandra P. Pleshkova ◽  
Alexander I. Belokon ◽  
Sergey O. Yakushin ◽  
...  
Keyword(s):  
Electron Impact ◽  
Mass Spectrometer ◽  
Uv Irradiation ◽  
Ionization Chamber ◽  
Ion Source ◽  
Organic Radicals ◽  
Mechanistic Study ◽  
Mass Spectral ◽  
Additional Support ◽  
Derivatives Of

C60was shown to react with organosilanes Me4Si, Ph2SiH2, Ph2MeSiH, Ph4Si, andα-naphthylphenylmethylsilane in the electron ionization ion source of a mass spectrometer with the transfer of the corresponding organic radicals (Me, Ph, andα-naphthyl) from the silanes to the fullerene. The reactions were accompanied by hydrogen addition to some products and hydrogen loss from them. C70reacted with Me4Si analogously. A reaction mechanism involving homolytic dissociation of the silanes under electron impact to the corresponding organic radicals, which react further with C60at the surface of the ionization chamber of the mass spectrometer to give the respective adducts, was offered. A mechanistic study of the reaction of C60with Me4Si supported it. No silicon containing derivatives of the fullerenes were found. C60reacted with Ph4Si in solution under UV irradiation in a similar fashion furnishing phenyl derivatives of the fullerene. These results provide an additional support to the hypothesis formulated earlier thatthe homolytic reactive mass spectrometry of fullerenes (the reactions of fullerenes with other species in the ionization chambers of mass spectrometers and their mass spectral monitoring)can predict the reactivity of them toward the same reagents in solution to a significant extent.

Notizen: Fast Pulsed Laser Induced Electron Generation for Electron Impact Mass Spectrometry

1988 ◽  
Vol 43 (12) ◽  
pp. 1151-1153 ◽  
Author(s):  
E. R. Rohwer ◽  
R.C. Beavis ◽  
C. Köster ◽  
J. Lindner ◽  
J. Grotemeyer ◽  
...  
Keyword(s):  
Electron Impact ◽  
Mass Spectra ◽  
Ion Source ◽  
Electron Impact Mass Spectrometry ◽  
Uv Laser ◽  
Electron Generation ◽  
Medium Resolution ◽  
Electron Impact Mass ◽  
Impact Mass ◽  
Tof Ms

A new ultra fast electron impact (El) ion source is pre­sented that produces a very short, high intensity electron beam, allowing medium resolution mass spectra to be re­corded without pulsing the ion accelerating voltages in a time-of-flight mass spectrometer (TOF-MS). The ion source requires minimum modification of any TOF-MS equipped with an electrostatic ion reflector and UV-laser. El-spectra are presented for comparison with literature spectra.

A New Type of Cluster-Ion Source for Thin Film Deposition

1990 ◽  
Vol 206 ◽  
Author(s):  
Hellmut Haberland ◽  
Martin Karrais ◽  
Martin Mall
Keyword(s):  
Electron Impact ◽  
Plane Surface ◽  
Thin Film Deposition ◽  
Ion Source ◽  
Film Deposition ◽  
Cluster Ions ◽  
Cluster Ion ◽  
Impact Ionisation ◽  
Aggregation Technique ◽  
High Degree

ABSTRACTAtoms are gas discharge sputtered from a solid target. They are condensed to form clusters using the gas aggregation technique. An intense beam of clusters of all solid materials can be obtained. Up to 80 % of the clusters can be ionised without using additional electron impact ionisation. Total deposition rates vary between 1 and 1000 Å per second depending on cluster diameter, which can be varied between 3 and 500 nm. Thin films of Al, Cu, and Mo have been produced so far. For non accelerated beams a weakly adhering mostly coulored deposit is obtained. Accelerating the cluster ions this changes to a strongly adhering film, having a shiny metallic appearance, and a very sharp and plane surface as seen in an electron microscope. The advantages compared to Kyoto ICB-method are: easy control of the cluster size, no electron impact ionisation, high degree of ionisation, and sputtering is used instead of thermal evaporation, which allows the use of high melting point materials.

scholarly journals ISOLDE target and ion source chemistry

2001 ◽  
Vol 89 (11-12) ◽  
Author(s):  
U. Köster
Keyword(s):  
Liquid Metals ◽  
Molecular Form ◽  
Isotope Separation ◽  
Thick Target ◽  
Ion Source ◽  
Resonance Ionization ◽  
Surface Ionization ◽  
Laser Ion Source ◽  
Reaction Products ◽  
On Line

For the production of radioactive ion beams by means of the ISOL (isotope separation on-line) method in which the nuclei of interest are stopped in a thick target, chemistry plays a crucial role. It serves to separate the nuclear reaction products in atomic or molecular form from the bulk target and to transfer them efficiently to an ion source. This article gives an overview of ISOLDE radiochemical methods where targets (liquid metals, solid metals, carbides and oxides) and ion sources are optimized with respect to efficiency, speed and chemical selectivity. Rather pure beams of non-metals and volatile metals can be obtained with a temperature-controlled transfer line acting as thermo-chromatograph. For less volatile metals the temperature of the target and ion source units needs to be kept as high as possible, but a selective ion source can be used: positive surface ionization for metals with ionization potentials below about 6 eV and the RILIS (resonance ionization laser ion source) technique for most other metals.

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