scholarly journals Very High-Energy Synchrotron Radiation at Fermilab

1983 ◽  
Author(s):  
J. Haggerty
1998 ◽  
Vol 5 (3) ◽  
pp. 286-292 ◽  
Author(s):  
Th. Tschentscher ◽  
P. Suortti

The use of synchrotron radiation with very high photon energies has become possible only with the latest generation of storage rings. All high-electron-energy synchrotron sources will have a dedicated program for the use of very high photon energies. The high-energy beamline ID15 at the ESRF was the first beamline built and dedicated to this purpose, and it has now been in user operation for more than three years. The useful energy range of this beamline is 30–1000 keV and the superconducting insertion device for producing the highest attainable photon energies is described in detail. The techniques most often used today are diffraction and Compton scattering; an overview of the most important experiments is given. Both techniques have been used in the investigation of magnetic systems, and, additionally, the high resolution in reciprocal space, which can be achieved in diffraction, has led to a series of applications. Other fields of research are addressed, and attempts to indicate possible future research areas of high-energy synchrotron radiation are made.


1999 ◽  
Vol 592 ◽  
Author(s):  
F. Rochet ◽  
F. Jolly ◽  
G. Dufour ◽  
C. Grupp ◽  
A. Taleb-Ibrahimi

ABSTRACTSi 2p core-level spectroscopy is a unique tool to determine the chemical composition and spatial extension of the suboxide layer present at the Si/SiO2 interface. In the case of ultra-thin oxide films (thickness <10 Å), the high surface sensitivity provided by the tunability of synchrotron radiation allows the observation of four energetically well-separated oxidation states, generally attributed to a silicon atom with an increasing number of oxygen first neighbors, and hence often denoted Sin+(with n=1,…,4). After a brief review of two decades of XPS studies on the Si/SiO2 interface, we give an account of the recent debate concerning the possible contribution of the second oxygen neighbor shell to the chemical shift, which, if effective, would modify the picture of the interface. Then, we examine the benefit derived from the use of very high energy resolution (70 meV at hv=130 eV), and we try to determine, for this system, what are the limits of this spectroscopy. To illustrate the latter point, among various case studies (thermal oxides, room temperature adsorption etc.), we treat in more detail the case of the H-terminated Si(1 11) surface oxidized by atomic oxygen, and discuss our data in the light of previous XPS and vibrational spectroscopy studies.


1964 ◽  
Vol 82 (1) ◽  
pp. 3-81 ◽  
Author(s):  
Evgenii L. Feinberg ◽  
Dmitrii S. Chernavskii

2021 ◽  
Vol 11 (1) ◽  
Author(s):  
L. Whitmore ◽  
R. I. Mackay ◽  
M. van Herk ◽  
J. K. Jones ◽  
R. M. Jones

AbstractThis paper presents the first demonstration of deeply penetrating dose delivery using focused very high energy electron (VHEE) beams using quadrupole magnets in Monte Carlo simulations. We show that the focal point is readily modified by linearly changing the quadrupole magnet strength only. We also present a weighted sum of focused electron beams to form a spread-out electron peak (SOEP) over a target region. This has a significantly reduced entrance dose compared to a proton-based spread-out Bragg peak (SOBP). Very high energy electron (VHEE) beams are an exciting prospect in external beam radiotherapy. VHEEs are less sensitive to inhomogeneities than proton and photon beams, have a deep dose reach and could potentially be used to deliver FLASH radiotherapy. The dose distributions of unfocused VHEE produce high entrance and exit doses compared to other radiotherapy modalities unless focusing is employed, and in this case the entrance dose is considerably improved over existing radiations. We have investigated both symmetric and asymmetric focusing as well as focusing with a range of beam energies.


1981 ◽  
Vol 8 (3) ◽  
pp. 205-213 ◽  
Author(s):  
Kisei Kinoshita ◽  
Akira Minaka ◽  
Hiroyuki Sumiyoshi

2013 ◽  
Vol 777 (1) ◽  
pp. L18 ◽  
Author(s):  
Y. T. Tanaka ◽  
C. C. Cheung ◽  
Y. Inoue ◽  
Ł. Stawarz ◽  
M. Ajello ◽  
...  

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