REPOSITORY NEAR-FIELD THERMAL MODELING UPDATEINCLUDING ANALYSIS OF OPEN MODE DESIGN CONCEPTS - DRAFT REV. M

This paper describes an integrated model developed by the Korean Atomic Energy Research Institute (KAERI) to simulate options for disposal of spent nuclear fuel (SNF) and reprocessing products in South Korea. A companion paper (Hwang and Miller, 2009) describes a systems-level model of Korean options for spent nuclear fuel (SNF) management in the 21’st century. The model addresses alternative design concepts for disposal of SNF of different types (CANDU, PWR), high level waste, and fission products arising from a variety of alternative fuel cycle back ends. It uses the GoldSim software to simulate the engineered system, near-field and far-field geosphere, and biosphere, resulting in long-term dose predictions for a variety of receptor groups. The model’s results allow direct comparison of alternative repository design concepts, and identification of key parameter uncertainties and contributors to receptor doses.

Download Full-text

Investigations on Repository Near-Field Thermal Modeling

10.2172/1058105 ◽

2012 ◽

Author(s):

H Greenberg ◽

M Sharma ◽

M Sutton

Keyword(s):

Near Field ◽

Thermal Modeling

Download Full-text

Mechanical assembly of complex, 3D mesostructures from releasable multilayers of advanced materials

Science Advances ◽

10.1126/sciadv.1601014 ◽

2016 ◽

Vol 2 (9) ◽

pp. e1601014 ◽

Cited By ~ 111

Author(s):

Zheng Yan ◽

Fan Zhang ◽

Fei Liu ◽

Mengdi Han ◽

Dapeng Ou ◽

...

Keyword(s):

Near Field ◽

Three Dimensional ◽

Advanced Materials ◽

Near Field Communication ◽

Spiral Inductor ◽

Mechanical Assembly ◽

Inorganic Semiconductors ◽

Geometrical Properties ◽

Design Concepts ◽

Compressive Buckling

Capabilities for assembly of three-dimensional (3D) micro/nanostructures in advanced materials have important implications across a broad range of application areas, reaching nearly every class of microsystem technology. Approaches that rely on the controlled, compressive buckling of 2D precursors are promising because of their demonstrated compatibility with the most sophisticated planar technologies, where materials include inorganic semiconductors, polymers, metals, and various heterogeneous combinations, spanning length scales from submicrometer to centimeter dimensions. We introduce a set of fabrication techniques and design concepts that bypass certain constraints set by the underlying physics and geometrical properties of the assembly processes associated with the original versions of these methods. In particular, the use of releasable, multilayer 2D precursors provides access to complex 3D topologies, including dense architectures with nested layouts, controlled points of entanglement, and other previously unobtainable layouts. Furthermore, the simultaneous, coordinated assembly of additional structures can enhance the structural stability and drive the motion of extended features in these systems. The resulting 3D mesostructures, demonstrated in a diverse set of more than 40 different examples with feature sizes from micrometers to centimeters, offer unique possibilities in device design. A 3D spiral inductor for near-field communication represents an example where these ideas enable enhanced quality (Q) factors and broader working angles compared to those of conventional 2D counterparts.

Download Full-text

Investigations on Repository Near-Field Thermal Modeling

10.2172/1062213 ◽

2013 ◽

Cited By ~ 1

Author(s):

H Greenberg ◽

M Sharma ◽

M Sutton

Keyword(s):

Near Field ◽

Thermal Modeling

Download Full-text

Near-field scanning optical microscopy

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100144644 ◽

1986 ◽

Vol 44 ◽

pp. 642-643

Author(s):

E. Betzig ◽

A. Harootunian ◽

M. Isaacson ◽

A. Lewis

Keyword(s):

Near Field ◽

Optical Microscope ◽

Visible Radiation ◽

Field Methods ◽

Optical Elements ◽

Optical Region ◽

Order Of Magnitude ◽

Nondestructive Imaging ◽

Scanning Optical Microscopy ◽

Near Field Scanning

In general, conventional methods of optical imaging are limited in spatial resolution by either the wavelength of the radiation used or by the aberrations of the optical elements. This is true whether one uses a scanning probe or a fixed beam method. The reason for the wavelength limit of resolution is due to the far field methods of producing or detecting the radiation. If one resorts to restricting our probes to the near field optical region, then the possibility exists of obtaining spatial resolutions more than an order of magnitude smaller than the optical wavelength of the radiation used. In this paper, we will describe the principles underlying such "near field" imaging and present some preliminary results from a near field scanning optical microscope (NS0M) that uses visible radiation and is capable of resolutions comparable to an SEM. The advantage of such a technique is the possibility of completely nondestructive imaging in air at spatial resolutions of about 50nm.

Download Full-text

High resolution at low voltage: A new approach

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100152355 ◽

1989 ◽

Vol 47 ◽

pp. 76-77

Author(s):

Arthur V. Jones

Keyword(s):

Low Voltage ◽

Emission Sources ◽

New Approach ◽

Design Concepts ◽

Probe Diameter ◽

Low Voltage Operation ◽

Sufficient Intensity ◽

Electron Microscopes ◽

Scanning Electron Microscopes ◽

Immersion Type

With the introduction of field-emission sources and “immersion-type” objective lenses, the resolution obtainable with modern scanning electron microscopes is approaching that obtainable in STEM and TEM-but only with specific types of specimens. Bulk specimens still suffer from the restrictions imposed by internal scattering and the need to be conducting. Advances in coating techniques have largely overcome these problems but for a sizeable body of specimens, the restrictions imposed by coating are unacceptable.For such specimens, low voltage operation, with its low beam penetration and freedom from charging artifacts, is the method of choice.Unfortunately the technical dificulties in producing an electron beam sufficiently small and of sufficient intensity are considerably greater at low beam energies — so much so that a radical reevaluation of convential design concepts is needed.The probe diameter is usually given by

Download Full-text