scholarly journals Secondary Containment System component failure data analysis from 1984 to 1991

1992 ◽  
Author(s):  
L.C. Cadwallader ◽  
D.P. Sanchez
Keyword(s):  
Data Analysis ◽  
System Component ◽  
Component Failure ◽  
Failure Data ◽  
Containment System

Failure Analysis Enhancement by Incorporating a Compact Scan Diagnosis System

2014 ◽  
Author(s):  
Rommel Estores ◽  
Pascal Vercruysse ◽  
Karl Villareal ◽  
Eric Barbian ◽  
Ralph Sanchez ◽  
...  
Keyword(s):  
Data Analysis ◽  
Failure Analysis ◽  
Real Analysis ◽  
Failure Data ◽  
Analysis Methodology ◽  
Efficiency And Effectiveness ◽  
Scan Chain ◽  
On Chip ◽  
Analysis Environment ◽  
Selection Of

Abstract The failure analysis community working on highly integrated mixed signal circuitry is entering an era where simultaneously System-On-Chip technologies, denser metallization schemes, on-chip dissipation techniques and intelligent packages are being introduced. These innovations bring a great deal of defect accessibility challenges to the failure analyst. To contend in this era while aiming for higher efficiency and effectiveness, the failure analysis environment must undergo a disruptive evolution. The success or failure of an analysis will be determined by the careful selection of tools, data and techniques in the applied analysis flow. A comprehensive approach is required where hardware, software, data analysis, traditional FA techniques and expertise are complementary combined [1]. This document demonstrates this through the incorporation of advanced scan diagnosis methods in the overall analysis flow for digital functionality failures and supporting the enhanced failure analysis methodology. For the testing and diagnosis of the presented cases, compact but powerful scan test FA Lab hardware with its diagnosis software was used [2]. It can therefore easily be combined with the traditional FA techniques to provide stimulus for dynamic fault localizations [3]. The system combines scan chain information, failure data and layout information into one viewing environment which provides real analysis power for the failure analyst. Comprehensive data analysis is performed to identify failing cells/nets, provide a better overview of the failure and the interactions to isolate the fault further to a smaller area, or to analyze subtle behavior patterns to find and rationalize possible faults that are otherwise not detected. Three sample cases will be discussed in this document to demonstrate specific strengths and advantages of this enhanced FA methodology.

SYSTEM RELIABILITY GROWTH ANALYSIS USING COMPONENT FAILURE DATA

1994 ◽  
Vol 01 (01) ◽  
pp. 71-83 ◽  
Author(s):  
M. XIE ◽  
T.N. GOH
Keyword(s):  
System Reliability ◽  
Growth Analysis ◽  
Simple Approach ◽  
System Level ◽  
Reliability Growth ◽  
System Failure ◽  
Component Level ◽  
Component Failure ◽  
Failure Data ◽  
Growth Estimation

In this paper the problem of system-level reliability growth estimation using component-level failure data is studied. It is suggested that system failure data should be broken down into component, or subsystem, failure data when the above problems have occurred during the system testing phase. The proposed approach is especially useful when the system is not unchanged over the time, when some subsystems are improved more than others, or when the testing has been concentrated on different components at different time. These situations usually happen in practice and it may also be the case even if the system failure data is provided. Two sets of data are used to illustrate the simple approach; one is a set of component failure data for which all subsystems are available for testing at the same time and for the other set of data, the starting times are different for different subsystems.

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