scholarly journals Low-energy beta spectroscopy using pin diodes to monitor tritium surface contamination

1994 ◽  
Author(s):  
W.R. Wampler ◽  
B.L. Doyle
Keyword(s):  
Low Energy ◽  
Surface Contamination ◽  
Pin Diodes ◽  
Beta Spectroscopy

SOFT X-RAY EMISSION IN THE (1.0–1.5 KEV) WINDOW WITH NITROGEN FILLING IN A LOW ENERGY PLASMA FOCUS

2002 ◽  
Vol 16 (09) ◽  
pp. 309-318 ◽  
Author(s):  
M. SHAFIQ ◽  
SARTAJ ◽  
S. HUSSAIN ◽  
M. SHARIF ◽  
S. AHMAD ◽  
...  
Keyword(s):  
Plasma Focus ◽  
Pressure Range ◽  
Filling Pressure ◽  
Pinhole Camera ◽  
Low Energy ◽  
X Rays ◽  
System Efficiency ◽  
Current Sheath ◽  
Pin Diodes ◽  
X Ray

A study of soft X-ray emission in the 1.0–1.5 keV energy range from a low energy (1.15 kJ) plasma focus has been conducted. X-rays are detected with the combination of Quantrad Si PIN-diodes masked with Al (50 μm), Mg (100 μm) and Ni (17.5 μm) filters and with a pinhole camera. The X-ray flux is found to be measurable within the pressure range of 0.1–1.0 mbar nitrogen. In the 1.0–1.3 keV and 1.0–1.5 keV windows, the X-ray yield in 4π-geometry is 1.03 J and 14.0-J, respectively, at a filling pressure of 0.25 mbar and the corresponding efficiencies are 0.04% and 1.22%. The total X-ray emission in 4π-geometry is 21.8 J, which corresponds to the system efficiency of about 1.9%. The X-ray emission is found dominantly as a result of the interaction of energetic electrons in the current sheath with the anode tip. Images recorded by the pinhole camera confirm the emission of X-rays from the tip of the anode.

Cryogenic micro-calorimeters for low energy beta spectroscopy

1993 ◽  
Vol 93 (3-4) ◽  
pp. 269-274 ◽  
Author(s):  
D. Deptuck ◽  
M. M. Lowry ◽  
I. C. Girit
Keyword(s):  
Low Energy ◽  
Beta Spectroscopy

Low energy electron bombardment induced surface contamination of Ru mirrors

2012 ◽  
Author(s):  
A. Al-Ajlony ◽  
A. Kanjilal ◽  
M. Catalfano ◽  
S. S. Harilal ◽  
A. Hassanein ◽  
...  
Keyword(s):  
Electron Bombardment ◽  
Low Energy ◽  
Surface Contamination ◽  
Energy Electron ◽  
Low Energy Electron

Dissociated Σ=27 boundaries in silicon

1988 ◽  
Vol 46 ◽  
pp. 624-625
Author(s):  
A. Garg ◽  
W.A.T. Clark ◽  
J.P. Hirth
Keyword(s):  
Electron Diffraction ◽  
Local Minimum ◽  
Boundary Energy ◽  
Coincidence Site Lattice ◽  
Boundary Plane ◽  
Low Energy ◽  
Theoretical Understanding ◽  
Site Lattice ◽  
Kikuchi Pattern ◽  
Analysis Techniques

In the last twenty years, a significant amount of work has been done in the theoretical understanding of grain boundaries. The various proposed grain boundary models suggest the existence of coincidence site lattice (CSL) boundaries at specific misorientations where a periodic structure representing a local minimum of energy exists between the two crystals. In general, the boundary energy depends not only upon the density of CSL sites but also upon the boundary plane, so that different facets of the same boundary have different energy. Here we describe TEM observations of the dissociation of a Σ=27 boundary in silicon in order to reduce its surface energy and attain a low energy configuration.The boundary was identified as near CSL Σ=27 {255} having a misorientation of (38.7±0.2)°/[011] by standard Kikuchi pattern, electron diffraction and trace analysis techniques. Although the boundary appeared planar, in the TEM it was found to be dissociated in some regions into a Σ=3 {111} and a Σ=9 {122} boundary, as shown in Fig. 1.

Transfer optics for high spatial resolution electron spectroscopy

1988 ◽  
Vol 46 ◽  
pp. 666-667
Author(s):  
G. G. Hembree ◽  
Luo Chuan Hong ◽  
P.A. Bennett ◽  
J.A. Venables
Keyword(s):  
Magnetic Field ◽  
Scanning Transmission Electron Microscope ◽  
Low Energy ◽  
Objective Lens ◽  
State University ◽  
Arizona State University ◽  
Initial Field ◽  
Resolution Electron ◽  
Scanning Transmission ◽  
Low Energy Electrons

A new field emission scanning transmission electron microscope has been constructed for the NSF HREM facility at Arizona State University. The microscope is to be used for studies of surfaces, and incorporates several surface-related features, including provision for analysis of secondary and Auger electrons; these electrons are collected through the objective lens from either side of the sample, using the parallelizing action of the magnetic field. This collimates all the low energy electrons, which spiral in the high magnetic field. Given an initial field Bi∼1T, and a final (parallelizing) field Bf∼0.01T, all electrons emerge into a cone of semi-angle θf≤6°. The main practical problem in the way of using this well collimated beam of low energy (0-2keV) electrons is that it is travelling along the path of the (100keV) probing electron beam. To collect and analyze them, they must be deflected off the beam path with minimal effect on the probe position.

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