scholarly journals Variational full wave calculation of fast wave current drive in DIII-D using the ALCYON code

1992 ◽  
Author(s):  
A. Becoulet ◽  
D. Moreau
2012 ◽  
Vol 490-495 ◽  
pp. 706-710
Author(s):  
Yan Liu ◽  
Xue Yu Gong ◽  
Lei Yang ◽  
Xiao Wei Peng ◽  
Wen Yan Liu

This paper uses the full wave method to study the fast wave current drive (FWCD) problem for Ion cyclotron resonance frequency (ICRF). It exists in such plasma bodies as circumferential Tokamak. The research has considered finite Larmor radius effect (FLR) and flattened dispersion. It found the physical model for full wave calculation-full wave method. Through the numerical solution of full wave method, the distribution of electric field strength can be obtained, which is stimulated and produced when fast wave stays in plasma body.


1985 ◽  
Author(s):  
J. Goree ◽  
M. Ono ◽  
P. Colestock ◽  
R. Horton ◽  
D. McNeill ◽  
...  
Keyword(s):  

1992 ◽  
Author(s):  
T. C. Luce ◽  
S. C. Chiu ◽  
R. W. Harvey ◽  
M. J. Mayberry ◽  
C. C. Petty ◽  
...  
Keyword(s):  

1998 ◽  
Vol 5 (6) ◽  
pp. 2284-2290 ◽  
Author(s):  
C. N. Lashmore-Davies ◽  
V. Fuchs ◽  
R. A. Cairns

1997 ◽  
Author(s):  
Yves Peysson ◽  
Eric Sébelin ◽  
Xavier Litaudon ◽  
Didier Moreau ◽  
Jean-Claude Miellou ◽  
...  

1989 ◽  
Vol 104 (3) ◽  
pp. 263-272 ◽  
Author(s):  
Altair S. De Assis ◽  
J. Busnardo-Neto

Author(s):  
Wouter Tierens ◽  
James R Myra ◽  
Roberto Bilato ◽  
Laurent Colas

Abstract Perkins et al. PRL 2012 [1] reported unexpected power losses during High Harmonic Fast Wave (HHFW) heating and current drive in NSTX. Recently, Tierens et al [2] proposed that these losses may be attributable to surface waves on field-aligned plasma filaments, which carry power along the filaments, to be lost at the endpoints where the filaments intersect the limiters. In this work, we show that there is indeed a resonant loss mechanism associated with the excitation of these surface waves, and derive an analytic expression for the power lost to surface wave modes at each filament.


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