scholarly journals Total ionizing dose effects on MOS and bipolar devices in the natural space radiation environment

1998 ◽  
Author(s):  
D.M. Fleetwood
Electronics ◽  
2018 ◽  
Vol 7 (9) ◽  
pp. 163 ◽  
Author(s):  
Honorio Martin ◽  
Pedro Martin-Holgado ◽  
Yolanda Morilla ◽  
Luis Entrena ◽  
Enrique San-Millan

Physical Unclonable Functions (PUFs) are hardware security primitives that are increasingly being used for authentication and key generation in ICs and FPGAs. For space systems, they are a promising approach to meet the needs for secure communications at low cost. To this purpose, it is essential to determine if they are reliable in the space radiation environment. In this work we evaluate the Total Ionizing Dose effects on a delay-based PUF implemented in SRAM-FPGA, namely a Ring Oscillator PUF. Several major quality metrics have been used to analyze the evolution of the PUF response with the total ionizing dose. Experimental results demonstrate that total ionizing dose has a perceptible effect on the quality of the PUF response, but it could still be used for space applications by making some appropriate corrections.


MRS Bulletin ◽  
2003 ◽  
Vol 28 (2) ◽  
pp. 136-140 ◽  
Author(s):  
Charles C. Foster

AbstractWhen exposed to radiation, the function of microelectronic devices is not only degraded by single-event phenomena but by cumulative effects. Most of the energy lost by radiation passing through semiconductors is through ionization. Buildup of charge in gate oxide layers and of interface and border traps due to ionization result in semipermanent damage to the device. These effects are known as total ionizing dose effects. A fraction of the energy of the radiation passing through semiconductors is lost to displacement of atoms from their sites in the crystal lattice structure. The buildup of displacement damage with radiation exposure causes gradual but permanent changes in device performance and limits device lifetime in a radiation environment. Displacement damage will be discussed in the context of non-ionizing energy loss.


2020 ◽  
Author(s):  
Jared J. Luxton ◽  
Miles J. McKenna ◽  
Lynn E. Taylor ◽  
Kerry A. George ◽  
Sara Zwart ◽  
...  

2021 ◽  
Vol 127 (3) ◽  
Author(s):  
Avashesh Dubey ◽  
Rakhi Narang ◽  
Manoj Saxena ◽  
Mridula Gupta

Author(s):  
Ryan Q. Rudy ◽  
Kyle M. Grove ◽  
Manuel Rivas ◽  
Jonathon Guerrier ◽  
Cory Cress ◽  
...  

2016 ◽  
Vol 15 ◽  
pp. 1923-1926 ◽  
Author(s):  
Christopher D. Woehrle ◽  
Derek T. Doyle ◽  
Steven A. Lane ◽  
Christos G. Christodoulou

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