scholarly journals Location capability of a sparse regional network (RSTN) using a multi-phase earthquake location algorithm (REGLOC)

1994 ◽  
Author(s):  
L. Hutchings
Keyword(s):  
Earthquake Location ◽  
Regional Network ◽  
Location Algorithm ◽  
Multi Phase

Nonlinear earthquake location: Theory and examples

1985 ◽  
Vol 75 (3) ◽  
pp. 779-790
Author(s):  
Clifford H. Thurber
Keyword(s):  
Travel Time ◽  
Location Theory ◽  
Nonlinear Behavior ◽  
Second Order ◽  
Earthquake Location ◽  
Source Position ◽  
Realistic Assessment ◽  
Location Algorithm ◽  
Expected Benefits ◽  
Derivatives Of

Abstract A fundamental modification to Geiger's method of earthquake location for local earthquakes is described which incorporates nonlinear behavior of travel time as a function of source position. The use of Newton's method rather than the usual Gauss-Newton method allows the inclusion of second-order partial derivatives of travel time with respect to source coordinates in the location algorithm. These second-order derivatives can be calculated quite easily for half-space and layered crustal models. Expected benefits are improved convergence and stability, as demonstrated in a series of examples, and more realistic assessment of solution uncertainty.

Some Applications of the U. S. Steel MVEM

1973 ◽  
Vol 31 ◽  
pp. 4-5
Author(s):  
J. S. Lally ◽  
L. E. Thomas ◽  
R. M. Fisher
Keyword(s):  
Electron Diffraction ◽  
Debye Temperature ◽  
Metals And Alloys ◽  
Critical Voltage ◽  
Dynamical Diffraction ◽  
Phase Structures ◽  
Structure Factors ◽  
Local Bonding ◽  
Diffraction Phenomenon ◽  
Multi Phase

A variety of materials containing many different microstructures have been examined with the USS MVEM. Three topics have been selected to illustrate some of the more recent studies of diffraction phenomena and defect, grain and multi-phase structures of metals and minerals.(1) Critical Voltage Effects in Metals and Alloys - This many-beam dynamical diffraction phenomenon, in which some Bragg resonances vanish at certain accelerating voltages, Vc, depends sensitively on the spacing of diffracting planes, Debye temperature θD and structure factors. Vc values can be measured to ± 0.5% in the HVEM ana used to obtain improved extinction distances and θD values appropriate to electron diffraction, as well as to probe local bonding effects and composition variations in alloys.

Digital imaging and quantitative image analysis of polymer blends

1996 ◽  
Vol 54 ◽  
pp. 170-171
Author(s):  
Xiao Zhang
Keyword(s):  
Digital Imaging ◽  
Imaging Techniques ◽  
Imaging Systems ◽  
Polymer Science ◽  
Key Factors ◽  
Multiple Imaging ◽  
Quantitative Image ◽  
Digital Imaging Systems ◽  
Multi Phase ◽  
Network Technologies

Polymer microscopy involves multiple imaging techniques. Speed, simplicity, and productivity are key factors in running an industrial polymer microscopy lab. In polymer science, the morphology of a multi-phase blend is often the link between process and properties. The extent to which the researcher can quantify the morphology determines the strength of the link. To aid the polymer microscopist in these tasks, digital imaging systems are becoming more prevalent. Advances in computers, digital imaging hardware and software, and network technologies have made it possible to implement digital imaging systems in industrial microscopy labs.

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