scholarly journals Characterization of polysilicon films by Raman spectroscopy and transmission electron microscopy: A comparative study

1993 ◽  
Author(s):  
D.R. Tallant ◽  
T.J. Headley ◽  
J.W. Medernach ◽  
F. Geyling
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Raman Spectroscopy ◽  
Comparative Study ◽  
Transmission Electron ◽  
Polysilicon Films

scholarly journals Characterization of Polysilicon Films by Raman Spectroscopy and Transmission Electron Microscopy: a Comparative Study

1993 ◽  
Vol 324 ◽  
Author(s):  
David R. Tallant ◽  
Thomas J. Headley ◽  
John W. Medernach ◽  
Franz Geyling
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Raman Spectroscopy ◽  
Raman Spectra ◽  
Cross Section ◽  
Nanometer Scale ◽  
Sampling Depth ◽  
Transmission Electron ◽  
Polysilicon Films

AbstractSamples of chemically-vapor-deposited sub-micrometer-thick films of polysilicon were analyzed by transmission electron microscopy (TEM) in cross-section and by Raman spectroscopy with illumination at their surface. TEM and Raman spectroscopy both find varying amounts of polycrystalline and amorphous silicon in the wafers. Raman spectra obtained using blue, green and red excitation wavelengths to vary the Raman sampling depth are compared with TEM crosssections of these films. Some films have Raman spectra with a band near 497 cm−1, corresponding to numerous nanometer-scale faulted regions in the TEM micrographs.

Study and characterization of the carbon-based nanoparticles obtained from PET

2013 ◽  
Vol 1549 ◽  
pp. 149-154
Author(s):  
Alena Borisovna Kharissova ◽  
Edgar de Casas Ortiz ◽  
Oxana V. Kharissova ◽  
Ubaldo Ortiz Mendez ◽  
Boris I. Kharisov
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Raman Spectroscopy ◽  
Normal Pressure ◽  
Transmission Electron ◽  
Polymer Type ◽  
Scanning Electron ◽  
Carbon Based

ABSTRACTMaterial like PET {polyethylene terephthalate (C10H8O4)n} are usually thrown away present in glasses of refreshments, water bottles between others which are hard to be degraded. However, this material can be recycled and used to acquire nanostructures. During this investigation the objective was to obtain nanoparticles and carbon based nanostructures from the polymer type PET by means of microwave irradiation at the temperature of 260°C at normal pressure and at 600 psi in the presence of acids, ethylene glycol and by means of calcinations. The obtained nanoparticles of ultrananocrystalline diamonds were studied by means of scanning electron microscopy (SEM), high-resolution transmission electron microscopy (TEM), and Raman spectroscopy.

Structural Characterization of Nc-Si/A-Sio2 Superlattices Subjected To Thermal Treatment

1998 ◽  
Vol 536 ◽  
Author(s):  
G. F. Grom ◽  
L. Tsybeskov ◽  
K. D. Hirschman ◽  
P. M. Fauchet ◽  
J. P. McCaffrey ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Raman Spectroscopy ◽  
Defect Density ◽  
High Temperature Annealing ◽  
Force Microscopy ◽  
Atomic Force ◽  
Transmission Electron ◽  
Si Nanocrystals

AbstractThe morphology of nanocrystalline (nc)-Si/amorphous (a)-SiO2 superlattices (SLs) is studied using Raman spectroscopy in the acoustic and optical phonon ranges, transmission electron microscopy (TEM), and atomic force microscopy (AFM). It is demonstrated that high temperature annealing (up to 1100°C) and oxidation in O2/H2O ambient do not destroy the SL structure, which retains its original periodicity and nc-Si/a-SiO2 interface abruptness. It is found that oxidation at high temperatures reduces the defect density in nc-Si/a-SiO2 SLs and induces the lateral coalescence of Si nanocrystals (NCs). The size, shape, packing density, and crystallographic orientation of the Si nanocrystals are studied as a function of the oxidation time.

scholarly journals Characterization of structural alteration in diamond turned silicon crystal by means of micro raman spectroscopy and transmission electron microscopy

2005 ◽  
Vol 8 (3) ◽  
pp. 261-268
Author(s):  
Renato Goulart Jasinevicius ◽  
Arthur José Vieira Porto ◽  
Paulo Sérgio Pizani ◽  
Jaime Gilberto Duduch ◽  
Francisco José Santos
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Raman Spectroscopy ◽  
Silicon Crystal ◽  
Structural Alteration ◽  
Micro Raman Spectroscopy ◽  
Transmission Electron

scholarly journals Micro- and Nanometric Characterization of the Celestite Skeleton of Acantharian Species (Radiolaria, Rhizaria)

2021 ◽  
Author(s):  
Rina Fujimaki ◽  
Noritoshi Suzuki ◽  
Katsunori Kimoto ◽  
Yukiko Nagai ◽  
Yuya Oaki ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Computed Tomography ◽  
Transmission Electron Microscopy ◽  
Raman Spectroscopy ◽  
Sea Water ◽  
X Ray ◽  
Transmission Electron ◽  
Regular Arrangement ◽  
X Ray Computed

Abstract We studied the micrometric morphology and nanometric structure of the celestite (SrSO4) skeleton of acantharian family Acanthometridae. A body of the skeleton composed of 20 radial spines with four blades was characterized using microfocus X-ray computed tomography. The regular arrangement of three types of spines was clarified with the connection of the blades around the root of each spine. The surface of the spines was covered with a chitin-based organic membrane to prevent dissolution in sea water. On the nanometric scale, the mesocrystalline structure that consists of nanoscale grains having a distorted single-crystal nature was revealed using scanning and transmission electron microscopy, electron diffraction, and Raman spectroscopy. The acantharian skeletons have a crystallographically controlled architecture that is covered with a protective organic membrane.

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