scholarly journals High resolution energy loss research: Si compounds and ceramics. Annual progress report, June 1, 1987--January 1, 1988

1988 ◽  
Author(s):  
R.W. Carpenter ◽  
S.H. Lin
Keyword(s):  
High Resolution ◽  
Energy Loss ◽  
Progress Report ◽  
Annual Progress Report

Low-workfunction field-emission source for high-resolution EELS

1987 ◽  
Vol 45 ◽  
pp. 132-133
Author(s):  
P. E. Batson
Keyword(s):  
High Resolution ◽  
Energy Loss ◽  
Electron Probe ◽  
Collection Efficiency ◽  
Electron Sources ◽  
Wien Filter ◽  
Half Angle ◽  
Thermal Emitter ◽  
Electron Energy Loss ◽  
Intrinsic Energy

In recent years,instrumentation for electron energy loss spectroscopy (EELS) has been steadily improved to increase energy resolution and collection efficiency. At present 0.40eV at 10mR collection half angle is available with commercial magnetic sectors (e.g. Gatan, Inc. and VG Microscopes, Ltd.), and 70meV at 10mR has been demonstrated by use of a Wien filter within a large deceleration field. When these high resolution spectrometers are coupled to the modern small electron probe instrument, we obtain a tool which promises to reveal local changes in bandstructure and bonding near defects and interfaces in heterogeneous materials.Unfortunately, typical electron sources have intrinsic energy widths which limit attainable spectroscopic resolution in the absence of some monochromation system. For instance, the W thermal emitter has a half width of about 1eV.

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