scholarly journals ANALYSIS OF PASSIVATED SURFACES FOR MASS SPECTROMETER INLET SYSTEMS BY AUGER ELECTRON AND X-RAY PHOTOELECTRON SPECTROSCOPY

2010 ◽  
Author(s):  
H. Ajo ◽  
E. Clark
Keyword(s):  
Mass Spectrometer ◽  
Photoelectron Spectroscopy ◽  
Auger Electron ◽  
X Ray ◽  
Mass Spectrometer Inlet

scholarly journals Analysis Of Passivated A-286 Stainless Steel Surfaces for Mass Spectrometer Inlet Systems By Auger Electron and X-Ray Photoelectron Spectroscopy

2013 ◽  
Vol 19 (S2) ◽  
pp. 1758-1759
Author(s):  
H. Ajo ◽  
D. Blankenship ◽  
E. Clark
Keyword(s):  
Stainless Steel ◽  
Mass Spectrometer ◽  
Photoelectron Spectroscopy ◽  
Auger Electron ◽  
X Ray ◽  
Steel Surfaces ◽  
Mass Spectrometer Inlet

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Chromium implantation in silica glass

1996 ◽  
Vol 11 (1) ◽  
pp. 229-235 ◽  
Author(s):  
E. Cattaruzza ◽  
R. Bertoncello ◽  
F. Trivillin ◽  
P. Mazzoldi ◽  
G. Battaglin ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Photoelectron Spectroscopy ◽  
Silica Glass ◽  
Electron Spectroscopy ◽  
Auger Electron ◽  
Secondary Ion Mass Spectrometry ◽  
Rutherford Backscattering Spectrometry ◽  
X Ray ◽  
Chromium Silicide ◽  
Secondary Ion

Silica glass was implanted with chromium at the energy of 35 and 160 keV and at fluences varying from 1 × 1016 to 11 × 1016 ions cm−2. In a set of chromium-implanted samples significant amounts of carbon were detected. Samples were characterized by x-ray photoelectron spectroscopy, x-ray-excited Auger electron spectroscopy, secondary ion mass spectrometry, and Rutherford backscattering spectrometry. Chromium silicide and chromium oxide compounds were observed; the presence of carbon in the implanted layers induces the further formation of chromium carbide species. Thermodynamic considerations applied to the investigated systems supply indications in agreement with the experimental evidences.

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