Carbon Wrapped Amorphous Ni–Co Binary Oxide Nano-Sheet for High Performance Pseudocapacitors

2021 ◽  
Author(s):  
Yongfeng Li ◽  
Yanzhen Liu
2015 ◽  
Vol 17 (2) ◽  
pp. 732-750 ◽  
Author(s):  
Kunfeng Chen ◽  
Congting Sun ◽  
Dongfeng Xue

A review of morphology engineering of high performance binary oxide electrode materials for electrochemical energy storage is presented.


2018 ◽  
Vol 148 (10) ◽  
pp. 3024-3034 ◽  
Author(s):  
Wei Xia ◽  
Fangfang Wang ◽  
Longxiang Wang ◽  
Junguo Wang ◽  
Xichuan Mu ◽  
...  

Author(s):  
Qimeng Ning ◽  
Zhihong Yin ◽  
Yunguo Liu ◽  
Xiaofei Tan ◽  
Guangming Zeng ◽  
...  

Fe–Mn binary oxide nanoparticles (FMBON) were reported to be high performance as adsorbent for pollutants removal from aqueous solution. However, there are still limitations in practice application due to the FMBON tend to aggregate into the micro millimeter level. In order to avoid the agglomeration of nanoparticles, this work synthesized the stabilized Fe–Mn binary oxide nanoparticles (CMC-FMBON) by using water-soluble carboxymethyl celluloses (CMC) as the stabilizer. The characteristics of CMC-FMBON and FMBON were measured by using Transmission electron microscopy (TEM), X-ray diffraction (XRD), Fourier transform infrared (FTIR) spectroscopy, and Zeta potential. This work systematically investigated the adsorption capacity of CMC-FMBON for 17β-estradiol (E2) and the influences of external environmental factors on E2 removal. The results indicated that CMC-FMBON had much smaller particles, wider dispersion and larger surface area than the FMBON. CMC-FMBON showed better adsorption performance for E2 than FMBON with the maximum adsorption capacity of CMC-FMBON and FMBON were 124.10 and 98.14 mg/g at 298 K, respectively. The experimental data can be well fitted by the model of pseudo-second-order and Langmuir model. The E2 removal by CMC-FMBON was obviously dependent on pH with the maximum adsorption occurring when the pH was acidic. The removal capacity of CMC-FMBON increased when enhancing ionic strength in solution. Background electrolytes promoted slightly E2 adsorption process whereas the presence of humic acid inhibited the E2 removal. π-π interactions, hydrogen bonds, and oxidation might be responsible for E2 removal. This research suggested that the CMC-FMBON has been considered to be a cost-efficient adsorbent for removing E2 from water.


Author(s):  
A. V. Crewe ◽  
M. Isaacson ◽  
D. Johnson

A double focusing magnetic spectrometer has been constructed for use with a field emission electron gun scanning microscope in order to study the electron energy loss mechanism in thin specimens. It is of the uniform field sector type with curved pole pieces. The shape of the pole pieces is determined by requiring that all particles be focused to a point at the image slit (point 1). The resultant shape gives perfect focusing in the median plane (Fig. 1) and first order focusing in the vertical plane (Fig. 2).


Author(s):  
N. Yoshimura ◽  
K. Shirota ◽  
T. Etoh

One of the most important requirements for a high-performance EM, especially an analytical EM using a fine beam probe, is to prevent specimen contamination by providing a clean high vacuum in the vicinity of the specimen. However, in almost all commercial EMs, the pressure in the vicinity of the specimen under observation is usually more than ten times higher than the pressure measured at the punping line. The EM column inevitably requires the use of greased Viton O-rings for fine movement, and specimens and films need to be exchanged frequently and several attachments may also be exchanged. For these reasons, a high speed pumping system, as well as a clean vacuum system, is now required. A newly developed electron microscope, the JEM-100CX features clean high vacuum in the vicinity of the specimen, realized by the use of a CASCADE type diffusion pump system which has been essentially improved over its predeces- sorD employed on the JEM-100C.


Author(s):  
John W. Coleman

In the design engineering of high performance electromagnetic lenses, the direct conversion of electron optical design data into drawings for reliable hardware is oftentimes difficult, especially in terms of how to mount parts to each other, how to tolerance dimensions, and how to specify finishes. An answer to this is in the use of magnetostatic analytics, corresponding to boundary conditions for the optical design. With such models, the magnetostatic force on a test pole along the axis may be examined, and in this way one may obtain priority listings for holding dimensions, relieving stresses, etc..The development of magnetostatic models most easily proceeds from the derivation of scalar potentials of separate geometric elements. These potentials can then be conbined at will because of the superposition characteristic of conservative force fields.


Author(s):  
J W Steeds ◽  
R Vincent

We review the analytical powers which will become more widely available as medium voltage (200-300kV) TEMs with facilities for CBED on a nanometre scale come onto the market. Of course, high performance cold field emission STEMs have now been in operation for about twenty years, but it is only in relatively few laboratories that special modification has permitted the performance of CBED experiments. Most notable amongst these pioneering projects is the work in Arizona by Cowley and Spence and, more recently, that in Cambridge by Rodenburg and McMullan.There are a large number of potential advantages of a high intensity, small diameter, focussed probe. We discuss first the advantages for probes larger than the projected unit cell of the crystal under investigation. In this situation we are able to perform CBED on local regions of good crystallinity. Zone axis patterns often contain information which is very sensitive to thickness changes as small as 5nm. In conventional CBED, with a lOnm source, it is very likely that the information will be degraded by thickness averaging within the illuminated area.


Author(s):  
Klaus-Ruediger Peters

A new generation of high performance field emission scanning electron microscopes (FSEM) is now commercially available (JEOL 890, Hitachi S 900, ISI OS 130-F) characterized by an "in lens" position of the specimen where probe diameters are reduced and signal collection improved. Additionally, low voltage operation is extended to 1 kV. Compared to the first generation of FSEM (JE0L JSM 30, Hitachi S 800), which utilized a specimen position below the final lens, specimen size had to be reduced but useful magnification could be impressively increased in both low (1-4 kV) and high (5-40 kV) voltage operation, i.e. from 50,000 to 200,000 and 250,000 to 1,000,000 x respectively.At high accelerating voltage and magnification, contrasts on biological specimens are well characterized1 and are produced by the entering probe electrons in the outmost surface layer within -vl nm depth. Backscattered electrons produce only a background signal. Under these conditions (FIG. 1) image quality is similar to conventional TEM (FIG. 2) and only limited at magnifications >1,000,000 x by probe size (0.5 nm) or non-localization effects (%0.5 nm).


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