High Frequency Propagation Studies in the Coastal Environment

1999 ◽  
Author(s):  
David Farmer
Keyword(s):  
High Frequency ◽  
Coastal Environment

Modern and Holocene microbial mats and associated microbially induced sedimentary structures (MISS) on the southeastern coast of Tunisia (Mediterranean Sea)

2020 ◽  
pp. 1-21
Author(s):  
Rached Lakhdar ◽  
Mohamed Soussi ◽  
Rachida Talbi
Keyword(s):  
Spatial Distribution ◽  
High Frequency ◽  
Depositional Environment ◽  
Microbial Mats ◽  
Coastal Environment ◽  
Tidal Dynamics ◽  
Very High Frequency ◽  
Intertidal Zones ◽  
Sedimentary Structures ◽  
Very High

Abstract On the southeastern Tunisian coastline, very diverse living microbial mats colonize the lower supratidal and intertidal zones, and locally may extend into the upper infratidal zone. The interaction between the benthic cyanobacteria and their siliciclastic substratum leads to the development of several types of microbially induced sedimentary structures (MISS). The mapping of the microbial mats has allowed the identification of the types of MISS that characterize the different segments of the coastal environment. The modern microbial mats have been compared with those recorded at the top of the Holocene deposits, which are composed of biodegraded microbial black mats alternating with white laminae made of clastic and evaporitic sediments, indicative of very high frequency cycles of flood and drought. A hypothetic profile showing their occurrences along the different areas bordering the coastline is proposed as a guide for the reconstruction of the ancient depositional environment. The roles of tidal dynamics, storms, and climate in controlling their genesis and spatial distribution, are discussed and highlighted. The modern MISS of southeastern Tunisia are compared with their equivalents that are well documented through the different geological eras.

Experimental demonstration of a high-frequency forward scattering acoustic barrier in a dynamic coastal environment

2010 ◽  
Vol 127 (6) ◽  
pp. 3430-3439 ◽  
Author(s):  
Karim G. Sabra ◽  
Stephane Conti ◽  
Philippe Roux ◽  
Tuncay Akal ◽  
William A. Kuperman ◽  
...  
Keyword(s):  
High Frequency ◽  
Coastal Environment ◽  
Forward Scattering ◽  
Experimental Demonstration

scholarly journals Investigating the Eddy Diffusivity Concept in the Coastal Ocean

2016 ◽  
Vol 46 (7) ◽  
pp. 2201-2218 ◽  
Author(s):  
I. I. Rypina ◽  
A. Kirincich ◽  
S. Lentz ◽  
M. Sundermeyer
Keyword(s):  
High Resolution ◽  
High Frequency ◽  
Eddy Diffusivity ◽  
Coastal Ocean ◽  
Coastal Environment ◽  
Radar System ◽  
Small Scale ◽  
Time Interval ◽  
High Frequency Radar ◽  
Diffusivity Tensor

AbstractThis paper aims to test the validity, utility, and limitations of the lateral eddy diffusivity concept in a coastal environment through analyzing data from coupled drifter and dye releases within the footprint of a high-resolution (800 m) high-frequency radar south of Martha’s Vineyard, Massachusetts. Specifically, this study investigates how well a combination of radar-based velocities and drifter-derived diffusivities can reproduce observed dye spreading over an 8-h time interval. A drifter-based estimate of an anisotropic diffusivity tensor is used to parameterize small-scale motions that are unresolved and underresolved by the radar system. This leads to a significant improvement in the ability of the radar to reproduce the observed dye spreading.

Performance of a high‐frequency acoustic forward‐scatter barrier in a dynamic coastal environment

2007 ◽  
Vol 121 (5) ◽  
pp. 3085-3086
Author(s):  
Karim G. Sabra ◽  
Stephane Conti ◽  
Philippe Roux ◽  
W. A. Kuperman ◽  
J. Mark Stevenson ◽  
...  
Keyword(s):  
High Frequency ◽  
Coastal Environment ◽  
Forward Scatter

The Microstructure of Steatite (Protoenstatite)

1985 ◽  
Vol 43 ◽  
pp. 236-237
Author(s):  
W. E. Lee ◽  
A. H. Heuer
Keyword(s):  
High Frequency ◽  
Glass Ceramics ◽  
Magnesium Silicate ◽  
Beam Current ◽  
Glassy Matrix ◽  
Angle Of Incidence ◽  
X Ray ◽  
Mechanical And Electrical Properties ◽  
Argon Ions ◽  
High Temperature Polymorph

IntroductionTraditional steatite ceramics, made by firing (vitrifying) hydrous magnesium silicate, have long been used as insulators for high frequency applications due to their excellent mechanical and electrical properties. Early x-ray and optical analysis of steatites showed that they were composed largely of protoenstatite (MgSiO3) in a glassy matrix. Recent studies of enstatite-containing glass ceramics have revived interest in the polymorphism of enstatite. Three polymorphs exist, two with orthorhombic and one with monoclinic symmetry (ortho, proto and clino enstatite, respectively). Steatite ceramics are of particular interest a they contain the normally unstable high-temperature polymorph, protoenstatite.Experimental3mm diameter discs cut from steatite rods (∼10” long and 0.5” dia.) were ground, polished, dimpled, and ion-thinned to electron transparency using 6KV Argon ions at a beam current of 1 x 10-3 A and a 12° angle of incidence. The discs were coated with carbon prior to TEM examination to minimize charging effects.

Simulations of high-resolution images of amorphous silicon films

1986 ◽  
Vol 44 ◽  
pp. 544-545
Author(s):  
G. Y. Fan ◽  
J. M. Cowley
Keyword(s):  
Electron Microscope ◽  
High Frequency ◽  
Fourier Transformation ◽  
Amorphous Materials ◽  
Low Frequency ◽  
Chromatic Aberration ◽  
Structure Information ◽  
Frequency Components ◽  
High Resolution Images ◽  
Spatial Frequency Spectrum

It is well known that the structure information on the specimen is not always faithfully transferred through the electron microscope. Firstly, the spatial frequency spectrum is modulated by the transfer function (TF) at the focal plane. Secondly, the spectrum suffers high frequency cut-off by the aperture (or effectively damping terms such as chromatic aberration). While these do not have essential effect on imaging crystal periodicity as long as the low order Bragg spots are inside the aperture, although the contrast may be reversed, they may change the appearance of images of amorphous materials completely. Because the spectrum of amorphous materials is continuous, modulation of it emphasizes some components while weakening others. Especially the cut-off of high frequency components, which contribute to amorphous image just as strongly as low frequency components can have a fundamental effect. This can be illustrated through computer simulation. Imaging of a whitenoise object with an electron microscope without TF limitation gives Fig. 1a, which is obtained by Fourier transformation of a constant amplitude combined with random phases generated by computer.

SEM image sharpness analysis

1996 ◽  
Vol 54 ◽  
pp. 142-143
Author(s):  
M. T. Postek ◽  
A. E. Vladar
Keyword(s):  
High Frequency ◽  
Low Frequency ◽  
Quantitative Information ◽  
Primary Electron ◽  
Image Sharpness ◽  
Critical Dimensions ◽  
Sem Image ◽  
Frequency Changes ◽  
Electron Microscopes ◽  
Scanning Electron

Fully automated or semi-automated scanning electron microscopes (SEM) are now commonly used in semiconductor production and other forms of manufacturing. The industry requires that an automated instrument must be routinely capable of 5 nm resolution (or better) at 1.0 kV accelerating voltage for the measurement of nominal 0.25-0.35 micrometer semiconductor critical dimensions. Testing and proving that the instrument is performing at this level on a day-by-day basis is an industry need and concern which has been the object of a study at NIST and the fundamentals and results are discussed in this paper.In scanning electron microscopy, two of the most important instrument parameters are the size and shape of the primary electron beam and any image taken in a scanning electron microscope is the result of the sample and electron probe interaction. The low frequency changes in the video signal, collected from the sample, contains information about the larger features and the high frequency changes carry information of finer details. The sharper the image, the larger the number of high frequency components making up that image. Fast Fourier Transform (FFT) analysis of an SEM image can be employed to provide qualitiative and ultimately quantitative information regarding the SEM image quality.

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