Room Temperature Single-Spin Tunneling Force Microscopy for Characterization of Paramagnetic Defects in Electronic Materials
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2001 ◽
Vol 74
(1)
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pp. 139-149
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2011 ◽
Vol 133
(8)
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pp. 2334-2337
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2009 ◽
Vol 615-617
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pp. 457-460
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Vol 81
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pp. 623-629
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