Validation Plan for the ESTCP Wide Area Assessment Pilot Program Demonstration at Pueblo Precision Bombing Range #2, CO

An efficient, robust, and widely-applicable technique is presented for computational synthesis of high-resolution, wide-area images of a specimen from a series of overlapping partial views. This technique can also be used to combine the results of various forms of image analysis, such as segmentation, automated cell counting, deblurring, and neuron tracing, to generate representations that are equivalent to processing the large wide-area image, rather than the individual partial views. This can be a first step towards quantitation of the higher-level tissue architecture. The computational approach overcomes mechanical limitations, such as hysterisis and backlash, of microscope stages. It also automates a procedure that is currently done manually. One application is the high-resolution visualization and/or quantitation of large batches of specimens that are much wider than the field of view of the microscope.The automated montage synthesis begins by computing a concise set of landmark points for each partial view. The type of landmarks used can vary greatly depending on the images of interest. In many cases, image analysis performed on each data set can provide useful landmarks. Even when no such “natural” landmarks are available, image processing can often provide useful landmarks.

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On convenient use of nanoprobe and scanning without a stem unit in an EM-420

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100125622 ◽

1987 ◽

Vol 45 ◽

pp. 138-139

Author(s):

K. K. Christenson ◽

J. A. Eades

Keyword(s):

Wide Area ◽

Pole Piece ◽

Operating Condition ◽

Objective System

One of the strengths of the Philips EM-400 series of TEMs is their ability to operate under two distinct optical configurations: “microprobe”, the normal TEM operating condition which allows wide area illumination, and “nanoprobe”, which gives very small probes with high angular convergence for STEM imaging, microchemical and microstructural analyses. This change is accomplished by effectively turning off the twin lens located in the upper pole piece which changes the illumination from a telefocus system to a condenser-objective system. The deflection and tilt controls and alignments are designed for microprobe use and do not function properly when in nanoprobe. For instance, in nanoprobe the deflection control gives a mix of deflection and tilt; as does the tilt control.

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