Failure Analysis of an AH-64 Main Rotor Damper Blade Rod End, P/N 7-211411186-5

2003 ◽  
Author(s):  
Scott M. Grendahl ◽  
Marc S. Pepi
Keyword(s):  
Failure Analysis ◽  
Main Rotor

Failure analysis of a composite main rotor helicopter hub

2011 ◽  
Vol 18 (1) ◽  
pp. 97-109 ◽  
Author(s):  
F. Viganò ◽  
A. Manes ◽  
M. Giglio ◽  
U. Mariani
Keyword(s):  
Failure Analysis ◽  
Main Rotor

scholarly journals Crack of a helicopter main rotor actuator attachment: failure analysis and lessons learned

2013 ◽  
Vol 7 (26) ◽  
pp. 104-122
Author(s):  
L. Allegrucci ◽  
F. De Paolis ◽  
A. Coletta ◽  
M. Bernabei
Keyword(s):  
Failure Analysis ◽  
Lessons Learned ◽  
Main Rotor ◽  
Helicopter Main Rotor

Failure Analysis of a Helicopter's Main Rotor Bearing

2012 ◽  
Vol 510-511 ◽  
pp. 399-405
Author(s):  
M. Shahzad ◽  
A.H. Qureshi ◽  
H. Waqas ◽  
N. Hussain ◽  
L. Ali
Keyword(s):  
Thermal Analysis ◽  
Failure Analysis ◽  
Environmental Degradation ◽  
Mechanical Damage ◽  
Main Rotor ◽  
Micro Hardness ◽  
Hardness Testing ◽  
Rotor Bearing ◽  
Microstructural Studies

Presented results report some of the findings of a detailed failure analysis carried out on a main rotor hub assembly, which had symptoms of burning and mechanical damage. The analysis suggests environmental degradation of the grease which causes pitting on bearing-balls. The consequent inefficient lubrication raises the temperature which leads to the smearing of cage material (brass) on the bearing-balls and ultimately causes the failure. The analysis has been supported by the microstructural studies, thermal analysis and micro-hardness testing performed on the affected main rotor bearing parts.

Failure analysis of the Joint Bearing of the Main Rotor of the Robinson R44 Helicopter: A case study

Wear ◽  
2021 ◽  
pp. 203862
Author(s):  
Deqiang Tan ◽  
Rui Li ◽  
Qiang He ◽  
Xiaoqiang Yang ◽  
Changchun Zhou ◽  
...  
Keyword(s):  
Failure Analysis ◽  
Main Rotor

Failure analysis of the main rotor grip of a civil helicopter

2005 ◽  
Vol 12 (1) ◽  
pp. 43-47 ◽  
Author(s):  
N.J. Lourenço ◽  
C.F.A. Von Dollinger ◽  
M.L.A. Graça ◽  
P.P. de Campos
Keyword(s):  
Failure Analysis ◽  
Main Rotor

Failure Analysis With the Scanning Electron Microscope

1972 ◽  
Vol 30 ◽  
pp. 482-483
Author(s):  
John R. Devaney
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Integrated Circuits ◽  
Failure Analysis ◽  
High Reliability ◽  
Military Applications ◽  
Small Structure ◽  
Useful Life ◽  
Insight Into ◽  
Scanning Electron

Occasionally in history, an event may occur which has a profound influence on a technology. Such an event occurred when the scanning electron microscope became commercially available to industry in the mid 60's. Semiconductors were being increasingly used in high-reliability space and military applications both because of their small volume but, also, because of their inherent reliability. However, they did fail, both early in life and sometimes in middle or old age. Why they failed and how to prevent failure or prolong “useful life” was a worry which resulted in a blossoming of sophisticated failure analysis laboratories across the country. By 1966, the ability to build small structure integrated circuits was forging well ahead of techniques available to dissect and analyze these same failures. The arrival of the scanning electron microscope gave these analysts a new insight into failure mechanisms.

Using the scanning electron microscope for failure analysis of high density magnetic media

1987 ◽  
Vol 45 ◽  
pp. 392-393
Author(s):  
Evelyn R. Ackerman ◽  
Gary D. Burnett
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Failure Analysis ◽  
High Density ◽  
Magnetic Media ◽  
Specific Data ◽  
Retrieval Systems ◽  
Operating Environments ◽  
The Media ◽  
Scanning Electron

Advancements in state of the art high density Head/Disk retrieval systems has increased the demand for sophisticated failure analysis methods. From 1968 to 1974 the emphasis was on the number of tracks per inch. (TPI) ranging from 100 to 400 as summarized in Table 1. This emphasis shifted with the increase in densities to include the number of bits per inch (BPI). A bit is formed by magnetizing the Fe203 particles of the media in one direction and allowing magnetic heads to recognize specific data patterns. From 1977 to 1986 the tracks per inch increased from 470 to 1400 corresponding to an increase from 6300 to 10,800 bits per inch respectively. Due to the reduction in the bit and track sizes, build and operating environments of systems have become critical factors in media reliability.Using the Ferrofluid pattern developing technique, the scanning electron microscope can be a valuable diagnostic tool in the examination of failure sites on disks.

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