Development and Application of In-Situ, Real Time and Ex-Situ Characterization Techniques to Study the Growth of High Temperature Superconducting (HTSC) Films and Interfaces,

1997 ◽  
Author(s):  
Eugene A. Irene ◽  
O. Auciello ◽  
A. R. Krauss ◽  
G. E. McGuire
1991 ◽  
Vol 222 ◽  
Author(s):  
B. Johs ◽  
J. L. Edwards ◽  
K. T. Shiralagi ◽  
R. Droopad ◽  
K. Y. Choi ◽  
...  

ABSTRACTA modular spectroscopic ellipsometer, capable of both in-situ and ex-situ operation, has been used to measure important growth parameters of GaAs/AIGaAs structures. The ex-situ measurements provided layer thicknesses and compositions of the grown structures. In-situ ellipsometric measurements allowed the determination of growth rates, layer thicknesses, and high temperature optical constants. By performing a regression analysis of the in-situ data in real-time, the thickness and composition of an AIGaAs layer were extracted during the MBE growth of the structure.


Crystals ◽  
2018 ◽  
Vol 8 (9) ◽  
pp. 360 ◽  
Author(s):  
Dunji Yu ◽  
Yan Chen ◽  
Lu Huang ◽  
Ke An

Real-time in situ neutron diffraction was used to characterize the crystal structure evolution in a transformation-induced plasticity (TRIP) sheet steel during annealing up to 1000 °C and then cooling to 60 °C. Based on the results of full-pattern Rietveld refinement, critical temperature regions were determined in which the transformations of retained austenite to ferrite and ferrite to high-temperature austenite during heating and the transformation of austenite to ferrite during cooling occurred, respectively. The phase-specific lattice variation with temperature was further analyzed to comprehensively understand the role of carbon diffusion in accordance with phase transformation, which also shed light on the determination of internal stress in retained austenite. These results prove the technique of real-time in situ neutron diffraction as a powerful tool for heat treatment design of novel metallic materials.


RSC Advances ◽  
2012 ◽  
Vol 2 (9) ◽  
pp. 3872 ◽  
Author(s):  
Yixin Liu ◽  
Yu Ding ◽  
Haiyong Gao ◽  
Lichun Zhang ◽  
Puxian Gao ◽  
...  

1999 ◽  
Vol 562 ◽  
Author(s):  
G. Renaud ◽  
A. Barbier ◽  
C. Mocuta

ABSTRACTCombined in situ structural and ex situ magnetic studies of the Co/NiO(111) and Ni81Fe19/NiO(111) interfaces are presented. The Co and Permalloy films were grown on NiO(111) single crystals. Structural studies were performed by Grazing Incidence X-ray Scattering during growth. The effect of the temperature of the substrate during deposition was investigated. Under specific growth conditions, almost pure FCC Co and NiFe films can be obtained, with small quantities of twins. Magnetic measurements were performed ex situ by Magneto-Optical Kerr Effect (MOKE). A strong correlation between the magnetic properties and the crystallographic structure of the Co film is evidenced. High coercive fields are measured for all samples. High temperature annealing of the NiFe film leads to an improved crystalline quality, but the interface becomes reactive and diffuse: part of the Fe diffuses into the NiO substrate and forms an interface compound, likely to be the spinel NiFe2O4. We also report an in situ grazing incidence X-ray scattering study of the Ni/MgO(001) interface during its formation at room temperature. In-plane measurements reveal that the interface is sharp and that the epitaxial relationship is complex. Two distinct lattices are found to exist: expanded Ni(001) and Ni(110). The latter exhibits several orientations with respect to the substrate depending on the thickness. The Ni(110) orientations disappear by annealing at high temperature, leaving only the Ni cube/cube orientation. The layer was also almost fully transformed into NiO(001) by high temperature oxidation.


2014 ◽  
Vol 485 ◽  
pp. 108-117 ◽  
Author(s):  
R.U. Ribeiro ◽  
D.M. Meira ◽  
C.B. Rodella ◽  
D.C. Oliveira ◽  
J.M.C. Bueno ◽  
...  

2014 ◽  
Vol 136 (2) ◽  
pp. 630-633 ◽  
Author(s):  
Stefan J. Sedlmaier ◽  
Simon J. Cassidy ◽  
Richard G. Morris ◽  
Michael Drakopoulos ◽  
Christina Reinhard ◽  
...  

Author(s):  
Justin Gullotta ◽  
Lakshmi Krishnan ◽  
Dylan Share ◽  
Daniel Walczyk ◽  
Raymond Puffer

The most critical step in high temperature proton exchange membrane (PEM) MEA manufacturing is sealing of the membrane between the two electrodes. This sealing process is typically conducted using a precision hydraulic thermal press. In order to achieve cost-effective high-volume MEA manufacturing, it is important to reduce the variability in MEA performance due to variations in incoming material properties and dimensions, and to reduce the unit process cycle time. This paper explains the application of real time adaptive process controls (APC) combined with effective in-situ diagnostics during the MEA sealing process to achieve greater uniformity and performance of high temperature PEM MEAs. The in-situ impedance measurement is carried out in a precision thermal press using a milliohmmeter by reading the complex impedance of the MEA at 1 kHz as the components of the MEA are sealed. This signal is then used to adjust the pressing process parameters in real time to achieve more uniform MEA performance. An experiment was carried out in an attempt to identify the impedance parameter which correlated most closely with the MEA’s future performance. Using these impedance parameters during pressing, we are able to reliably produce MEAs using the real time APC technique that perform consistently in a single cell test fixture with more than a 50% reduction in pressing time.


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