Summary of Conference: Atomic Diffusion on Amorphous and Crystalline Surfaces Held in Piscataway, New Jersey on April 8-9, 1982

1982 ◽  
Author(s):  
S. H. Garofalini
Author(s):  
William Krakow ◽  
Alec N. Broers

Low-loss scanning electron microscopy can be used to investigate the surface topography of solid specimens and provides enhanced image contrast over secondary electron images. A high resolution-condenser objective lens has allowed the low-loss technique to resolve separations of Au nucleii of 50Å and smaller dimensions of 25Å in samples coated with a fine grained carbon-Au-palladium layer. An estimate of the surface topography of fine grained vapor deposited materials (20 - 100Å) and the surface topography of underlying single crystal Si in the 1000 - 2000Å range has also been investigated. Surface imaging has also been performed on single crystals using diffracted electrons scattered through 10−2 rad in a conventional TEM. However, severe tilting of the specimen is required which degrades the resolution 15 to 100 fold due to image forshortening.


1999 ◽  
Vol 63 (12) ◽  
pp. 969-975 ◽  
Author(s):  
WR Cinotti ◽  
RA Saporito ◽  
CA Feldman ◽  
G Mardirossian ◽  
J DeCastro

JAMA ◽  
1966 ◽  
Vol 196 (7) ◽  
pp. 645-646
Author(s):  
F. B. Rogers
Keyword(s):  

1978 ◽  
Vol 33 (10) ◽  
pp. 959-961 ◽  
Author(s):  
Nancy S. Breland
Keyword(s):  

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