scholarly journals An In-Situ Ellipsometric Study of Aqueous NH(4)OH Treatment of Silicon

1989 ◽  
Author(s):  
G. Gould ◽  
E. A. Irene
Keyword(s):  
Ellipsometric Study

In Situ Ellipsometric Study of PEG∕Cl[sup −] Coadsorption on Cu, Ag, and Au

2005 ◽  
Vol 152 (6) ◽  
pp. C403 ◽  
Author(s):  
M. L. Walker ◽  
L. J. Richter ◽  
T. P. Moffat
Keyword(s):  
Ellipsometric Study

In Situ Ellipsometric Study of the Dependence of a-Si:H Film Growth on Substrate Properties and Ignition Procedures

1994 ◽  
Vol 336 ◽  
Author(s):  
U.I. Schmidt ◽  
W. Herbst ◽  
B. Schröder ◽  
H. Oechsner
Keyword(s):  
Film Growth ◽  
Particle Formation ◽  
Soft Start ◽  
Bulk Film ◽  
Layer Deposition ◽  
Special Power ◽  
Substrate Properties ◽  
Ellipsometric Study ◽  
Quality Material

ABSTRACTIn situ ellipsometry reveals that particle formation influences the growth of glow discharge a-Si:H. This particle formation is observed even under discharge conditions leading to the deposition of device quality Material. It is found that less dense material is deposited during the particle-induced initial transient stage of the discharge which influences the properties of the subsequently growing “bulk” film. The effect of special power gradient ignition procedures is discussed. A significant increase of solar cell efficency is achieved by choosing “soft” start conditions for the i-layer deposition.

scholarly journals Electrochromism and Swelling of Polypyrrole Membranes: An Electrochemical and Ellipsometric Study

2011 ◽  
Vol 2011 ◽  
pp. 1-11 ◽  
Author(s):  
J. O. Zerbino ◽  
M. G. Sustersic ◽  
C. Falivene ◽  
N. Avaca ◽  
A. Maltz
Keyword(s):  
Film Thickness ◽  
Gold Electrodes ◽  
Applied Potential ◽  
Neutral Ph ◽  
Ellipsometric Study

The growth of polypyrrole (Ppy) layers on gold electrodes in nearly neutral pH solutions is analysed using “in situ” voltametric and ellipsometric techniques. Different film structures are obtained depending on the potentiodynamic programme and the composition of the electrolyte. More compact dodecylsulphate-(DS) doped Ppy layers were grown at 1.2 V versus RHE than those obtained by applying a higher potential. The more compact layers correspond to the growth of an oxidised Ppy/DS layer that shows low pseudo capacity behaviour. After dipping, the doped Ppy/DS film in KCl solution-significant variations in optical indices and thickness are detected as a function of the applied potential. Higher electrochromism as well as decrease in film thickness after cathodisation is achieved. The optical indices and the thickness of the Ppy layer formed under different applied potential/time programmes are estimated.

In-situ ellipsometric study of the phenomenon of photodoping of Ag metal As2S3 film

1996 ◽  
Author(s):  
Shuichi Kawabata ◽  
Yuka Miyanishi ◽  
Tsumoto Ogawa ◽  
Moriaki Wakaki
Keyword(s):  
Ellipsometric Study
Sign in / Sign up

Export Citation Format

Share Document