The Roles of VxB and Density Gradients in Plasma Electric Fields Measured from the Shuttle Orbiter.

1985 ◽  
Author(s):  
J. R. Lilley ◽  
Katz Jr. ◽  
Cooke I. ◽  
D. L.
Keyword(s):  
Electric Fields ◽  
Density Gradients

scholarly journals Auroral <i>E</i>-region electron density gradients measured

2000 ◽  
Vol 18 (9) ◽  
pp. 1172-1181 ◽  
Author(s):  
C. Haldoupis ◽  
K. Schlegel ◽  
G. Hussey
Keyword(s):  
Electric Field ◽  
Density Gradient ◽  
Electron Density ◽  
Electric Fields ◽  
Plasma Waves ◽  
Density Gradients ◽  
Electron Density Gradient ◽  
E Region ◽  
Gradient Drift ◽  
Region Plasma

Abstract. In the theory of E-region plasma instabilities, the ambient electric field and electron density gradient are both included in the same dispersion relation as the key parameters that provide the energy for the generation and growth of electrostatic plasma waves. While there exist numerous measurements of ionospheric electric fields, there are very few measurements and limited knowledge about the ambient electron density gradients, ∇Ne, in the E-region plasma. In this work, we took advantage of the EISCAT CP1 data base and studied statistically the vertical electron density gradient length, Lz=Ne/(dNe/dz), at auroral E-region heights during both eastward and westward electrojet conditions and different ambient electric field levels. Overall, the prevailing electron density gradients, with Lz ranging from 4 to 7 km, are found to be located below 100 km, but to move steadily up in altitude as the electric field level increases. The steepest density gradients, with Lz possibly less than 3 km, occur near 110 km mostly in the eastward electrojet during times of strong electric fields. The results and their implications are examined and discussed in the frame of the linear gradient drift instability theory. Finally, it would be interesting to test the implications of the present results with a vertical radar interferometer.Key words: Ionosphere (auroral ionosphere; ionospheric irregularities; plasma waves and instabilities)  

scholarly journals Scale sizes of intense auroral electric fields observed by Cluster

2007 ◽  
Vol 25 (11) ◽  
pp. 2413-2425 ◽  
Author(s):  
T. Johansson ◽  
G. Marklund ◽  
T. Karlsson ◽  
S. Liléo ◽  
P.-A. Lindqvist ◽  
...  
Keyword(s):  
Electric Field ◽  
Electric Fields ◽  
Geomagnetic Activity ◽  
Statistical Study ◽  
Density Gradients ◽  
Field Scale ◽  
Ionospheric Conductivity ◽  
Scale Size ◽  
Geocentric Distance ◽  
Scale Length

Abstract. The scale sizes of intense (>0.15 V/m, mapped to the ionosphere), high-altitude (4–7 RE geocentric distance) auroral electric fields (measured by the Cluster EFW instrument) have been determined in a statistical study. Monopolar and bipolar electric fields, and converging and diverging events, are separated. The relations between the scale size, the intensity and the potential variation are investigated. The electric field scale sizes are further compared with the scale sizes and widths of the associated field-aligned currents (FACs). The influence of, or relation between, other parameters (proton gyroradius, plasma density gradients, and geomagnetic activity), and the electric field scale sizes are considered. The median scale sizes of these auroral electric field structures are found to be similar to the median scale sizes of the associated FACs and the density gradients (all in the range 4.2–4.9 km) but not to the median proton gyroradius or the proton inertial scale length at these times and locations (22–30 km). (The scales are mapped to the ionospheric altitude for reference.) The electric field scale sizes during summer months and high geomagnetic activity (Kp>3) are typically 2–3 km, smaller than the typical 4–5 km scale sizes during winter months and low geomagnetic activity (Kp≤3), indicating a dependence on ionospheric conductivity.

Control of Metal Alloy Oxidation with Electric Fields

1973 ◽  
Vol 31 ◽  
pp. 164-165
Author(s):  
R. R. Dils ◽  
P. S. Follansbee
Keyword(s):  
Electric Fields ◽  
Oxidation Process ◽  
Base Alloy ◽  
Oxide Surface ◽  
Platinum Electrodes ◽  
Insulating Layer ◽  
Iron Base Alloy ◽  
Alloy Oxidation ◽  
Aluminum Oxide Layer ◽  
And Control

Electric fields have been applied across oxides growing on a high temperature alloy and control of the oxidation of the material has been demonstrated. At present, three-fold increases in the oxidation rate have been measured in accelerating fields and the oxidation process has been completely stopped in a retarding field.The experiments have been conducted with an iron-base alloy, Pe 25Cr 5A1 0.1Y, although, in principle, any alloy capable of forming an adherent aluminum oxide layer during oxidation can be used. A specimen is polished and oxidized to produce a thin, uniform insulating layer on one surface. Three platinum electrodes are sputtered on the oxide surface and the specimen is reoxidized.

Electron-Mirror Microscopic Aspects of Ferroelectric Domains of BaTiO3 And Ca2Sr (C2H5CO2)6

1970 ◽  
Vol 28 ◽  
pp. 478-479
Author(s):  
Teruo Someya ◽  
Jinzo Kobayashi
Keyword(s):  
Surface Layer ◽  
Electric Fields ◽  
Quantitative Study ◽  
Recent Progress ◽  
Ferroelectric Domain ◽  
Resolving Power ◽  
Surface Pattern ◽  
Crystal Surfaces ◽  
One Dimensional ◽  
Ferroelectric Domains

Recent progress in the electron-mirror microscopy (EMM), e.g., an improvement of its resolving power together with an increase of the magnification makes it useful for investigating the ferroelectric domain physics. English has recently observed the domain texture in the surface layer of BaTiO3. The present authors ) have developed a theory by which one can evaluate small one-dimensional electric fields and/or topographic step heights in the crystal surfaces from their EMM pictures. This theory was applied to a quantitative study of the surface pattern of BaTiO3).

Electron Microscope Observations of Magnetic and Electric Effects

1970 ◽  
Vol 28 ◽  
pp. 430-431
Author(s):  
John Silcox
Keyword(s):  
Electron Microscope ◽  
Electric Fields ◽  
Magnetic Image ◽  
Magnetic Effects ◽  
Ferromagnetic Films ◽  
Diffraction Contrast ◽  
Microscope Images ◽  
Electric Effects ◽  
Image Detail

Several aspects of magnetic and electric effects in electron microscope images are of interest and will be discussed here. Clearly electrons are deflected by magnetic and electric fields and can give rise to image detail. We will review situations in ferromagnetic films in which magnetic image effects are the predominant ones, others in which the magnetic effects give rise to rather subtle changes in diffraction contrast, cases of contrast at specimen edges due to leakage fields in both ferromagnets and superconductors and some effects due to electric fields in insulators.

Electron microscopy studies of PZT ferroelectric film capacitor structures

1992 ◽  
Vol 50 (2) ◽  
pp. 1364-1365
Author(s):  
V. Kaushik ◽  
P. Maniar ◽  
J. Olowolafe ◽  
R. Jones ◽  
A. Campbell ◽  
...  
Keyword(s):  
Electric Fields ◽  
Sol Gel ◽  
Ferroelectric Material ◽  
Dielectric Constants ◽  
Dielectric Films ◽  
Lead Zirconium Titanate ◽  
Si Substrate ◽  
Film Capacitor ◽  
Pzt Films ◽  
High Dielectric

Lead zirconium titanate films (Pb (Zr,Ti) O3 or PZT) are being considered for potential application as dielectric films in memory technology due to their high dielectric constants. PZT is a ferroelectric material which shows spontaneous polarizability, reversible under applied electric fields. We report herein some results of TEM studies on thin film capacitor structures containing PZT films with platinum-titanium electrodes.The wafers had a stacked structure consisting of PZT/Pt/Ti/SiO2/Si substrate as shown in Figure 1. Platinum acts as electrode material and titanium is used to overcome the problem of platinum adhesion to the oxide layer. The PZT (0/20/80) films were deposited using a sol-gel method and the structure was annealed at 650°C and 800°C for 30 min in an oxygen ambient. XTEM imaging was done at 200KV with the electron beam parallel to <110> zone axis of silicon.Figure 2 shows the PZT and Pt layers only, since the structure had a tendency to peel off at the Ti-Pt interface during TEM sample preparation.

Current Status of Solid-State X-Ray Systems

1985 ◽  
Vol 43 ◽  
pp. 158-161
Author(s):  
Martin Peckerar ◽  
Anastasios Tousimis
Keyword(s):  
Solid State ◽  
Electric Fields ◽  
Spectral Lines ◽  
Current Status ◽  
Mobile Charge ◽  
Electron Hole ◽  
X Ray ◽  
Sensing Systems ◽  
Transmission Electron ◽  
Electron Microscopes

Solid state x-ray sensing systems have been used for many years in conjunction with scanning and transmission electron microscopes. Such systems conveniently provide users with elemental area maps and quantitative chemical analyses of samples. Improvements on these tools are currently sought in the following areas: sensitivity at longer and shorter x-ray wavelengths and minimization of noise-broadening of spectral lines. In this paper, we review basic limitations and recent advances in each of these areas. Throughout the review, we emphasize the systems nature of the problem. That is. limitations exist not only in the sensor elements but also in the preamplifier/amplifier chain and in the interfaces between these components.Solid state x-ray sensors usually function by way of incident photons creating electron-hole pairs in semiconductor material. This radiation-produced mobile charge is swept into external circuitry by electric fields in the semiconductor bulk.

Atomic Spectroscopy in the FIM

1986 ◽  
Vol 44 ◽  
pp. 758-761
Author(s):  
J. J. Hren ◽  
S. D. Walck
Keyword(s):  
Electron Microscope ◽  
Electric Fields ◽  
Atom Probe ◽  
Atomic Spectroscopy ◽  
Single Atom ◽  
Statistical Sampling ◽  
Commercial Instrument ◽  
Available Technology ◽  
High Electric Fields ◽  
Field Ion Microscope

The field ion microscope (FIM) has had the ability to routinely image the surface atoms of metals since Mueller perfected it in 1956. Since 1967, the TOF Atom Probe has had single atom sensitivity in conjunction with the FIM. “Why then hasn't the FIM enjoyed the success of the electron microscope?” The answer is closely related to the evolution of FIM/Atom Probe techniques and the available technology. This paper will review this evolution from Mueller's early discoveries, to the development of a viable commercial instrument. It will touch upon some important contributions of individuals and groups, but will not attempt to be all inclusive. Variations in instrumentation that define the class of problems for which the FIM/AP is uniquely suited and those for which it is not will be described. The influence of high electric fields inherent to the technique on the specimens studied will also be discussed. The specimen geometry as it relates to preparation, statistical sampling and compatibility with the TEM will be examined.

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