State-of-the-Art Assessment of Testing and Testability of Custom LSI/VLSI Circuits. Volume II. Hardware Design Verification.
Keyword(s):
Keyword(s):
2003 ◽
2012 ◽
Vol 42
(6)
◽
pp. 465-473
◽
1988 ◽
pp. 504-525
Keyword(s):