Optimal Outlier Tests for a Weibull Model - To Identify Process Changes or to Predict Failure Times

1981 ◽  
Author(s):  
Nancy R. Mann
Author(s):  
Wahid Shehata ◽  
Haitham M. Yousof

A new four-parameter lifetime model is introduced and studied. The new model derives its flexibility and wide applicability from the well-known exponentiated Weibull model. Many bivariate and the multivariate type versions are derived using the Morgenstern family and Clayton copula. The new density can exhibit many important shapes with different skewness and kurtosis which can be unimodal and bimodal. The new hazard rate can be decreasing, J-shape, U-shape, constant, increasing, upside down and increasing-constant hazard rates. Various of its structural mathematical properties are derived. Graphical simulations are used in assessing the performance of the estimation method. We proved empirically the importance and flexibility of the new model in modeling various types of data such as failure times, remission times, survival times and strengths data.


2017 ◽  
Vol 14 (1) ◽  
pp. 31-51
Author(s):  
Akbar Asgharzadeh ◽  
Zahra Mirzazadeh Ganji ◽  
Javad Ahmadi ◽  
Reza Valiollahi ◽  
◽  
...  

Complexity ◽  
2021 ◽  
Vol 2021 ◽  
pp. 1-19
Author(s):  
Yen Liang Tung ◽  
Zubair Ahmad ◽  
Omid Kharazmi ◽  
Clement Boateng Ampadu ◽  
E.H. Hafez ◽  
...  

Modelling data in applied areas particularly in reliability engineering is a prominent research topic. Statistical models play a vital role in modelling reliability data and are useful for further decision-making policies. In this paper, we study a new class of distributions with one additional shape parameter, called a new generalized exponential-X family. Some of its properties are taken into account. The maximum likelihood approach is adopted to obtain the estimates of the model parameters. For assessing the performance of these estimators, a comprehensive Monte Carlo simulation study is carried out. The usefulness of the proposed family is demonstrated by means of a real-life application representing the failure times of electronic components. The fitted results show that the new generalized exponential-X family provides a close fit to data. Finally, considering the failure times data, the Bayesian analysis and performance of Gibbs sampling are discussed. The diagnostics measures such as the Raftery–Lewis, Geweke, and Gelman–Rubin are applied to check the convergence of the algorithm.


2021 ◽  
Vol 53 (1) ◽  
pp. 107-132
Author(s):  
Tomasz Rychlik ◽  
Fabio Spizzichino

AbstractWe study the distributions of component and system lifetimes under the time-homogeneous load-sharing model, where the multivariate conditional hazard rates of working components depend only on the set of failed components, and not on their failure moments or the time elapsed from the start of system operation. Then we analyze its time-heterogeneous extension, in which the distributions of consecutive failure times, single component lifetimes, and system lifetimes coincide with mixtures of distributions of generalized order statistics. Finally we focus on some specific forms of the time-nonhomogeneous load-sharing model.


2020 ◽  
Vol 48 (1) ◽  
pp. 138-153
Author(s):  
Muhammad Aslam ◽  
Muhammad Ali Raza ◽  
Rehan Ahmad Khan Sherwani ◽  
Muhammad Farooq ◽  
Jun Yong Jeong ◽  
...  

Author(s):  
A. C. Davison ◽  
F. Louzada-Neto
Keyword(s):  

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