TRANSIENT RADIATION EFFECTS ON ELECTRONIC COMPONENTS AND SEMICONDUCTOR DEVICES

Mapping Intimacies ◽

10.21236/ad0403117 ◽

1963 ◽

Cited By ~ 1

Author(s):

D. C. Jones ◽

F. J. Reid ◽

W. E. Chapin ◽

D. J. Hamman ◽

E. N. Wyler

Keyword(s):

Radiation Effects ◽

Semiconductor Devices ◽

Electronic Components ◽

Transient Radiation

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Transient Radiation Effects in Semiconductor Devices

Radiation Effects in Electronics ◽

10.1520/stp44607s ◽

2009 ◽

pp. 61-61-39 ◽

Cited By ~ 2

Author(s):

J. W. Crowe ◽

A. J. Sauer

Keyword(s):

Radiation Effects ◽

Semiconductor Devices ◽

Transient Radiation

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A Coupled Algorithm of Finite Volume Method with Monte-Carlo Method for Simulating Transient Radiation Effects of Semiconductor Devices

2012 Spring Congress on Engineering and Technology ◽

10.1109/scet.2012.6342052 ◽

2012 ◽

Author(s):

Yuan Wei ◽

Honggang Xie ◽

Ding Gong ◽

Jinhui Zhu ◽

Shengli Niu

Keyword(s):

Monte Carlo ◽

Monte Carlo Method ◽

Finite Volume Method ◽

Finite Volume ◽

Radiation Effects ◽

Semiconductor Devices ◽

Transient Radiation ◽

Volume Method

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Harmonized system of quality assessment for electronic components. Semiconductor devices

10.3403/00150161 ◽

1985 ◽

Keyword(s):

Quality Assessment ◽

Semiconductor Devices ◽

Electronic Components

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Harmonized system of quality assessment for electronic components. Discrete semiconductor devices. Sectional specification

10.3403/00162871u ◽

2015 ◽

Keyword(s):

Quality Assessment ◽

Semiconductor Devices ◽

Electronic Components

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Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices

10.3403/00172970 ◽

1987 ◽

Keyword(s):

Quality Assessment ◽

Semiconductor Devices ◽

Electronic Components

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Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Sectional specification for film and hybrid integrated circuits: qualification approval

10.3403/00260360 ◽

1992 ◽

Keyword(s):

Integrated Circuits ◽

Quality Assessment ◽

Semiconductor Devices ◽

Electronic Components

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Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits.Blank detail specification. Microprocessor integrated circuits

10.3403/00268898 ◽

1992 ◽

Keyword(s):

Integrated Circuits ◽

Quality Assessment ◽

Semiconductor Devices ◽

Electronic Components

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Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Bipolar monolithic digital integrated circuit gates (excluding uncommitted logic arrays)

10.3403/00261613 ◽

1992 ◽

Keyword(s):

Integrated Circuits ◽

Quality Assessment ◽

Integrated Circuit ◽

Semiconductor Devices ◽

Electronic Components ◽

Digital Integrated Circuit

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Harmonized system of quality assessment for electronic components. Semiconductor devices. Sectional specification for optoelectronic devices

10.3403/00259688u ◽

2015 ◽

Keyword(s):

Quality Assessment ◽

Semiconductor Devices ◽

Optoelectronic Devices ◽

Electronic Components

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Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Monolithic integrated operational amplifiers

10.3403/00259285u ◽

2015 ◽

Keyword(s):

Integrated Circuits ◽

Quality Assessment ◽

Semiconductor Devices ◽

Operational Amplifiers ◽

Electronic Components

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