CORRELATION TECHNIQUES FOR INFRARED DETECTION SYSTEMS

1960 ◽  
Author(s):  
TERENCE J. WIETING
Keyword(s):  
Infrared Detection ◽  
Detection Systems ◽  
Correlation Techniques

scholarly journals Towards Improved Airborne Fire Detection Systems Using Beetle Inspired Infrared Detection and Fire Searching Strategies

Micromachines ◽  
2015 ◽  
Vol 6 (6) ◽  
pp. 718-746 ◽  
Author(s):  
Herbert Bousack ◽  
Thilo Kahl ◽  
Anke Schmitz ◽  
Helmut Schmitz
Keyword(s):  
Fire Detection ◽  
Infrared Detection ◽  
Detection Systems

The Potentials of Scanning Microscopy

1968 ◽  
Vol 26 ◽  
pp. 352-353
Author(s):  
A. V. Crewe
Keyword(s):  
Salient Feature ◽  
Secondary Emission ◽  
Resolving Power ◽  
X Rays ◽  
Scanning Microscope ◽  
Forming Process ◽  
Additional Tool ◽  
Detection Systems ◽  
Conventional Microscope ◽  
Present Information

If the resolving power of a scanning electron microscope can be improved until it is comparable to that of a conventional microscope, it would serve as a valuable additional tool in many investigations.The salient feature of scanning microscopes is that the image-forming process takes place before the electrons strike the specimen. This means that several different detection systems can be employed in order to present information about the specimen. In our own particular work we have concentrated on the use of energy loss information in the beam which is transmitted through the specimen, but there are also numerous other possibilities (such as secondary emission, generation of X-rays, and cathode luminescence).Another difference between the pictures one would obtain from the scanning microscope and those obtained from a conventional microscope is that the diffraction phenomena are totally different. The only diffraction phenomena which would be seen in the scanning microscope are those which exist in the beam itself, and not those produced by the specimen.

The effect of back-melting on the continuity of crystallographic orientation and composition in HgZnTe

1992 ◽  
Vol 50 (2) ◽  
pp. 1696-1697
Author(s):  
H.J. Zuo ◽  
M.W. Price ◽  
R.D. Griffin ◽  
R.A. Andrews ◽  
G.M. Janowski
Keyword(s):  
Directional Solidification ◽  
Space Shuttle ◽  
Solidification Process ◽  
Space Experiment ◽  
Infrared Detection ◽  
Directionally Solidified ◽  
Crystallographic Defects ◽  
Semiconducting Alloys ◽  
Uniform Composition ◽  
Growth Experiments

The II-VI semiconducting alloys, such as mercury zinc telluride (MZT), have become the materials of choice for numerous infrared detection applications. However, compositional inhomogeneities and crystallographic imperfections adversly affect the performance of MZT infrared detectors. One source of imperfections in MZT is gravity-induced convection during directional solidification. Crystal growth experiments conducted in space should minimize gravity-induced convection and thereby the density of related crystallographic defects. The limited amount of time available during Space Shuttle experiments and the need for a sample of uniform composition requires the elimination of the initial composition transient which occurs in directionally solidified alloys. One method of eluding this initial transient involves directionally solidifying a portion of the sample and then quenching the remainder prior to the space experiment. During the space experiment, the MZT sample is back-melted to exactly the point at which directional solidification was stopped on earth. The directional solidification process then continues.

Universal ESEM

1993 ◽  
Vol 51 ◽  
pp. 786-787
Author(s):  
G.D. Danilatos
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
High Vacuum ◽  
Natural Extension ◽  
Necessary Condition ◽  
Environmental Scanning ◽  
Detection Systems ◽  
Small Gain ◽  
Detection Medium ◽  
Scanning Electron

The environmental scanning electron microscope (ESEM) has evolved as the natural extension of the scanning electron microscope (SEM), both historically and technologically. ESEM allows the introduction of a gaseous environment in the specimen chamber, whereas SEM operates in vacuum. One of the detection systems in ESEM, namely, the gaseous detection device (GDD) is based on the presence of gas as a detection medium. This might be interpreted as a necessary condition for the ESEM to remain operational and, hence, one might have to change instruments for operation at low or high vacuum. Initially, we may maintain the presence of a conventional secondary electron (E-T) detector in a "stand-by" position to switch on when the vacuum becomes satisfactory for its operation. However, the "rough" or "low vacuum" range of pressure may still be considered as inaccessible by both the GDD and the E-T detector, because the former has presumably very small gain and the latter still breaks down.

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