Reliable and Cost Effective Reservoir Characterization of Thin, Layered and Heterogeneous Reservoirs: Case Studies

2003 ◽  
Author(s):  
C.S. Singh ◽  
J. Singh ◽  
N. Baruah ◽  
P.K. Neog ◽  
B.N. Talukdar
Geophysics ◽  
2021 ◽  
pp. 1-65
Author(s):  
Hemin Yuan ◽  
Majken C. Looms ◽  
Lars Nielsen

The characterization of shallow subsurface formations is essential for geological mapping and interpretation, reservoir characterization, and prospecting related to mining/quarrying. To analyze elastic and electromagnetic properties, we characterize near-surface chalk formations deposited on a shallow seabed during the Late Cretaceous–Early Paleogene (Maastrichtian-Danian). Electromagnetic and elastic properties, both of which are related to mineralogy, porosity, and water saturation, are combined to characterize the physical properties of chalk formations. We also perform rock physics modeling of elastic velocities and permittivity and analyze their relationships. We then use measured ground penetrating radar and P-wave velocity field data to determine the key model parameters, which are essential for the validity of the models and can be used to evaluate the consolidation degree of the rocks. Based on the models, a scheme is developed to estimate the porosity and water saturation by combining the two rock physics templates. The predictions are consistent with previous findings. Our templates facilitate fast mapping of near-surface porosity and saturation distributions and represent an efficient and cost-effective method for near-surface hydrological, environmental, and petrophysical studies. In the current formulation, the method is only applicable to rock type (chalk) comprising a single mineral (pure calcite). It is possible to tailor the formulation to include more than one mineral; however, this will increase the uncertainty of the results.


Author(s):  
Randal Mulder ◽  
Sam Subramanian ◽  
Tony Chrastecky

Abstract The use of atomic force probe (AFP) analysis in the analysis of semiconductor devices is expanding from its initial purpose of solely characterizing CMOS transistors at the contact level with a parametric analyzer. Other uses found for the AFP include the full electrical characterization of failing SRAM bit cells, current contrast imaging of SOI transistors, measuring surface roughness, the probing of metallization layers to measure leakages, and use with other tools, such as light emission, to quickly localize and identify defects in logic circuits. This paper presents several case studies in regards to these activities and their results. These case studies demonstrate the versatility of the AFP. The needs and demands of the failure analysis environment have quickly expanded its use. These expanded capabilities make the AFP more valuable for the failure analysis community.


2018 ◽  
Author(s):  
D. Basak ◽  
L. H. Ponce

Abstract Two case-studies on uncommon metals whiskers, performed at the Reliability Analysis Laboratory (RAL) of Northrop Grumman Innovation Systems, are presented. The components analyzed are an Oven Controlled Crystal Oscillator (OCXO) and an Electromechanical Relay. Investigative techniques were used to determine the chemical and physical makeup of the metal whiskers and develop an understanding of the underlying effects and mechanisms that caused the conditions conducive to whisker growth.


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