New Generation of Uncertainty Analysis in Basin Modeling

A thoroughly investigated design of a new generation of Suezmax tankers incorporating the builder's consideration in the form of a condensed mathematical model is presented. The design model is provided for practical application and for a fast assessment of the conceptual design. The design model is subjected to different methods of design analysis in order determine an adequate design and the appropriate procedure applicable in the design office. In addition, the computational, building and operational uncertainties involved in the design and mathematical model are considered. The uncertainty analysis based on tolerances indicates a wider choice of designs within acceptable limits.

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Systematic Uncertainty Analysis of Reservoir Image from New Generation LWD Azimuthal Resistivity Measurements

10.2118/191710-ms ◽

2018 ◽

Author(s):

Qiuyang Shen ◽

Jiefu Chen ◽

Hanming Wang

Keyword(s):

Uncertainty Analysis ◽

Systematic Uncertainty ◽

Resistivity Measurements ◽

Azimuthal Resistivity ◽

New Generation

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Finding the Right Problems: Some HREM Applications to Interfaces

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100111938 ◽

1984 ◽

Vol 42 ◽

pp. 376-379

Author(s):

D. Cherns

Keyword(s):

Grain Boundaries ◽

High Resolution Electron Microscopy ◽

Boundary Structure ◽

Atomic Structures ◽

Grain Boundary Structure ◽

Resolution Electron ◽

Point To Point ◽

The Right ◽

New Generation ◽

Better Than

The use of high resolution electron microscopy (HREM) to determine the atomic structure of grain boundaries and interfaces is a topic of great current interest. Grain boundary structure has been considered for many years as central to an understanding of the mechanical and transport properties of materials. Some more recent attention has focussed on the atomic structures of metalsemiconductor interfaces which are believed to control electrical properties of contacts. The atomic structures of interfaces in semiconductor or metal multilayers is an area of growing interest for understanding the unusual electrical or mechanical properties which these new materials possess. However, although the point-to-point resolutions of currently available HREMs, ∼2-3Å, appear sufficient to solve many of these problems, few atomic models of grain boundaries and interfaces have been derived. Moreover, with a new generation of 300-400kV instruments promising resolutions in the 1.6-2.0 Å range, and resolutions better than 1.5Å expected from specialist instruments, it is an appropriate time to consider the usefulness of HREM for interface studies.

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