Smart Nanostructured Materials Deliver High Reliability Completion Tools for Gas Shale Fracturing

Author(s):  
Zhiyue Xu ◽  
Gaurav Agrawal ◽  
Bobby J. Salinas
2021 ◽  
Vol 196 ◽  
pp. 108048
Author(s):  
Muhammed Rashik Mojid ◽  
Berihun Mamo Negash ◽  
Hesham Abdulelah ◽  
Shiferaw Regassa Jufar ◽  
Babatunde Kawthar Adewumi

2014 ◽  
Vol 28 (6) ◽  
pp. 3638-3644 ◽  
Author(s):  
Hai-Jing Wang ◽  
Albina Mutina ◽  
Ravinath Kausik

2021 ◽  
Vol 35 (19) ◽  
pp. 15842-15855
Author(s):  
Muhammed Rashik Mojid ◽  
Berihun Mamo Negash ◽  
Kawthar Adewumi Babatunde ◽  
Tigabwa Y. Ahmed ◽  
Shiferaw Regassa Jufar

Author(s):  
John R. Devaney

Occasionally in history, an event may occur which has a profound influence on a technology. Such an event occurred when the scanning electron microscope became commercially available to industry in the mid 60's. Semiconductors were being increasingly used in high-reliability space and military applications both because of their small volume but, also, because of their inherent reliability. However, they did fail, both early in life and sometimes in middle or old age. Why they failed and how to prevent failure or prolong “useful life” was a worry which resulted in a blossoming of sophisticated failure analysis laboratories across the country. By 1966, the ability to build small structure integrated circuits was forging well ahead of techniques available to dissect and analyze these same failures. The arrival of the scanning electron microscope gave these analysts a new insight into failure mechanisms.


Author(s):  
M. José-Yacamán

Electron microscopy is a fundamental tool in materials characterization. In the case of nanostructured materials we are looking for features with a size in the nanometer range. Therefore often the conventional TEM techniques are not enough for characterization of nanophases. High Resolution Electron Microscopy (HREM), is a key technique in order to characterize those materials with a resolution of ~ 1.7A. High resolution studies of metallic nanostructured materials has been also reported in the literature. It is concluded that boundaries in nanophase materials are similar in structure to the regular grain boundaries. That work therefore did not confirm the early hipothesis on the field that grain boundaries in nanostructured materials have a special behavior. We will show in this paper that by a combination of HREM image processing, and image calculations, it is possible to prove that small particles and coalesced grains have a significant surface roughness, as well as large internal strain.


Polymer News ◽  
2005 ◽  
Vol 30 (7) ◽  
pp. 214-216
Author(s):  
G. Carotenuto

Polymer News ◽  
2004 ◽  
Vol 29 (3) ◽  
pp. 77-81
Author(s):  
G. Carotenuto

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