Advanced Technology Completion Strategies for Marginal Tight Gas Sand Reservoirs: A Production Optimization Case Study in South Texas

2007 ◽  
Author(s):  
David Lloyd Fairhurst ◽  
Shirley Indriati ◽  
Brian Wayne Reynolds ◽  
Jerry Wayne Lewis ◽  
Mark Wade Holcomb ◽  
...  
Keyword(s):  
Production Optimization ◽  
South Texas ◽  
Advanced Technology ◽  
Tight Gas

Fracturing Previously Bypassed Highly Laminated Tight Gas Sands, A Production Optimization Case Study in South Texas

2007 ◽  
Author(s):  
David Lloyd Fairhurst ◽  
Mark E. Semmelbeck ◽  
Brian Reynolds ◽  
Shirley Indriati ◽  
Jerry Wayne Lewis ◽  
...  
Keyword(s):  
Production Optimization ◽  
South Texas ◽  
Tight Gas ◽  
Tight Gas Sands

Successful Control of Water Production in Slimhole Completions in a Tight-Gas Sandstone: South Texas Case Study

2011 ◽  
Author(s):  
Robert Xavier Rodriquez ◽  
Richard Tucker ◽  
Charles Mike Pawlik ◽  
Jordan Ciezobka
Keyword(s):  
South Texas ◽  
Tight Gas ◽  
Water Production ◽  
Successful Control ◽  
Tight Gas Sandstone

Root Cause Analysis for Pin Leakage

2016 ◽  
Author(s):  
Zhigang Song ◽  
Jochonia Nxumalo ◽  
Manuel Villalobos ◽  
Sweta Pendyala
Keyword(s):  
Failure Analysis ◽  
Root Cause Analysis ◽  
Advanced Technology ◽  
Process Step ◽  
Cause Analysis ◽  
Hard Mask ◽  
Technology Node ◽  
Root Cause ◽  
Tools And Techniques

Abstract Pin leakage continues to be on the list of top yield detractors for microelectronics devices. It is simply manifested as elevated current with one pin or several pins during pin continuity test. Although many techniques are capable to globally localize the fault of pin leakage, root cause analysis and identification for it are still very challenging with today’s advanced failure analysis tools and techniques. It is because pin leakage can be caused by any type of defect, at any layer in the device and at any process step. This paper presents a case study to demonstrate how to combine multiple techniques to accurately identify the root cause of a pin leakage issue for a device manufactured using advanced technology node. The root cause was identified as under-etch issue during P+ implantation hard mask opening for ESD protection diode, causing P+ implantation missing, which was responsible for the nearly ohmic type pin leakage.

scholarly journals Impact of 5D regularization and interpolation on subsurface imaging: A case study of Stratton field, South Texas, United States of America

2020 ◽  
Vol 32 (6) ◽  
pp. 2733-2740
Author(s):  
Maan Al-Gain ◽  
Kamal Abdelrahman ◽  
Ali Kahal ◽  
Saleh Al-Zahrani ◽  
Elkhedr Ibrahim ◽  
...  
Keyword(s):  
United States ◽  
United States Of America ◽  
South Texas ◽  
Subsurface Imaging

scholarly journals Case Study: Effect of Natural Fracture on Stimulation Strategy in Keshen Tight Gas

2020 ◽  
Vol 570 ◽  
pp. 062025
Author(s):  
Y Zhang ◽  
Z Chen ◽  
X Yang ◽  
Y Qiao ◽  
Q Teng ◽  
...  
Keyword(s):  
Natural Fracture ◽  
Tight Gas

Case Study: Modeling of a Large-Scale Tight-Gas Gathering System

2006 ◽  
Vol 1 (03) ◽  
pp. 1-5
Author(s):  
Brett K. Stevenson ◽  
Casey D. O'Shea
Keyword(s):  
Large Scale ◽  
Tight Gas
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