Structural analysis of oxide ion conductor, Ba2-xSrxIn2O5 and Ba2In2-xGaxO5 - Significance of synchrotron X-ray diffraction at high temperatures
2009 ◽
Vol 117
(1361)
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pp. 56-59
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Keyword(s):
X Ray
◽
1999 ◽
pp. 1137-1142
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2005 ◽
Vol 81
(10)
◽
pp. 2576-2580
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Keyword(s):