scholarly journals Electrochemistry and Spectroscopy Study on Nitrate Reduction Catalyzed by Iron and Cobalt Protoporphyrin Immobilized Pyrolytic Graphite

2020 ◽  
pp. 7175-7186
Author(s):  
Jing Shen ◽  
Keyword(s):  
Nitrate Reduction ◽  
Pyrolytic Graphite ◽  
Spectroscopy Study ◽  
Cobalt Protoporphyrin

Raman spectroscopy study of Ar+bombardment in highly oriented pyrolytic graphite

2009 ◽  
Vol 246 (11-12) ◽  
pp. 2689-2692 ◽  
Author(s):  
Ado Jorio ◽  
Marcia M. Lucchese ◽  
Fernando Stavale ◽  
Carlos A. Achete
Keyword(s):  
Raman Spectroscopy ◽  
Pyrolytic Graphite ◽  
Spectroscopy Study ◽  
Highly Oriented Pyrolytic Graphite

Tuneling Spectroscopy Study Of The Local Conductivity Features Of The Solid State Surface

2017 ◽  
Vol 12 (2) ◽  
pp. 129-137
Author(s):  
Genrich Shterk ◽  
Ren Kvon ◽  
Anna Nartova
Keyword(s):  
Solid State ◽  
Single Crystal ◽  
Surface Properties ◽  
Pyrolytic Graphite ◽  
Scanning Tunneling Spectroscopy ◽  
Scanning Tunneling ◽  
Spectroscopy Study ◽  
Model Sample ◽  
Graphite Single Crystal ◽  
Local Conductivity

The procedure of the scanning tunneling spectroscopy experiments on the base of air multimicroscope SMM2000T is developed. Highly oriented pyrolytic graphite single crystal was chosen as model sample. Proposed approach allows investigation of the local nonuniformity of the surface properties. The statistical confirmed difference of volt-ampere curves recorded over pyrolytic graphite terrace and steps determined by the structure features is shown

Incipient Anion Intercalation of Highly Oriented Pyrolytic Graphite Close to the Oxygen Evolution Potential: A Combined X-ray Photoemission and Raman Spectroscopy Study

2018 ◽  
Vol 123 (3) ◽  
pp. 1790-1797 ◽  
Author(s):  
Madan S. Jagadeesh ◽  
Gianlorenzo Bussetti ◽  
Alberto Calloni ◽  
Rossella Yivlialin ◽  
Luigi Brambilla ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Oxygen Evolution ◽  
Pyrolytic Graphite ◽  
Spectroscopy Study ◽  
Highly Oriented Pyrolytic Graphite ◽  
X Ray

Thin Pyrolytic Graphite Films for Electron Microscope Substrates

1971 ◽  
Vol 29 ◽  
pp. 226-227 ◽  
Author(s):  
George H. N. Riddle ◽  
Benjamin M. Siegel
Keyword(s):  
Vacuum Chamber ◽  
Pyrolytic Graphite ◽  
High Vacuum ◽  
Dark Field ◽  
Ultra High Vacuum ◽  
Graphite Substrate ◽  
Nickel Substrate ◽  
Routine Procedure ◽  
Field Electron Microscopy ◽  
Dark Field Electron

A routine procedure for growing very thin graphite substrate films has been developed. The films are grown pyrolytically in an ultra-high vacuum chamber by exposing (111) epitaxial nickel films to carbon monoxide gas. The nickel serves as a catalyst for the disproportionation of CO through the reaction 2C0 → C + CO2. The nickel catalyst is prepared by evaporation onto artificial mica at 400°C and annealing for 1/2 hour at 600°C in vacuum. Exposure of the annealed nickel to 1 torr CO for 3 hours at 500°C results in the growth of very thin continuous graphite films. The graphite is stripped from its nickel substrate in acid and mounted on holey formvar support films for use as specimen substrates.The graphite films, self-supporting over formvar holes up to five microns in diameter, have been studied by bright and dark field electron microscopy, by electron diffraction, and have been shadowed to reveal their topography and thickness. The films consist of individual crystallites typically a micron across with their basal planes parallel to the surface but oriented in different, apparently random directions about the normal to the basal plane.

Comparison of TEM and STM observations of small silver clusters on different carbon supports

1990 ◽  
Vol 48 (4) ◽  
pp. 264-265
Author(s):  
Bernd Tesche ◽  
Tobias Schilling
Keyword(s):  
Vibration Isolation ◽  
Pyrolytic Graphite ◽  
Carbon Film ◽  
Silver Clusters ◽  
Carbon Supports ◽  
Stacking Order ◽  
System P ◽  
High Resolution Tem ◽  
High Degree ◽  
Degree Of Order

The objective of our work is to determine:a) whether both of the imaging methods (TEM, STM) yield comparable data andb) which method is better suited for a reliable structure analysis of microclusters smaller than 1.5 nm, where a deviation of the bulk structure is expected.The silver was evaporated in a bell-jar system (p 10−5 pa) and deposited onto a 6 nm thick amorphous carbon film and a freshly cleaved highly oriented pyrolytic graphite (HOPG).The average deposited Ag thickness is 0.1 nm, controlled by a quartz crystal microbalance at a deposition rate of 0.02 nm/sec. The high resolution TEM investigations (100 kV) were executed by a hollow-cone illumination (HCI). For the STM investigations a commercial STM was used. With special vibration isolation we achieved a resolution of 0.06 nm (inserted diffraction image in Fig. 1c). The carbon film shows the remarkable reduction in noise by using HCI (Fig. 1a). The HOPG substrate (Fig. 1b), cleaved in sheets thinner than 30 nm for the TEM investigations, shows the typical arrangement of a nearly perfect stacking order and varying degrees of rotational disorder (i.e. artificial single crystals). The STM image (Fig. 1c) demonstrates the high degree of order in HOPG with atomic resolution.

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