scholarly journals Morphology and structure of bright electrodeposited metal coatings

2011 ◽  
Vol 30 (1) ◽  
pp. 29
Author(s):  
Miomir G. Pavlović ◽  
Ljubica J. Pavlović
Keyword(s):  
Metal Surfaces ◽  
Layer Structure ◽  
Scanning Tunneling ◽  
Mirror Reflection ◽  
Tunneling Microscopy ◽  
Metal Coatings ◽  
Copper Surfaces ◽  
Copper Coatings ◽  
Electrodeposited Metal ◽  
High Degree

The properties which determine whether the metal surface is mirror bright are precisely determined by scanning electron microscopy (SEM), atomic forces microscopy (AFM), scanning tunneling microscopy (STM) and reflectance spectrophotometry investigations. Mirror brightness of metal surfaces can be associated with the high degree of mirror reflection which approaches very nearly the ideal reflectance of the same metal with the lowest degree of diffuse reflection. Mirror brightness of the copper coatings and the copper surfaces polished both mechanically and electrochemically was determined by flat and mutually parallel parts of the surface, which are smooth on the atomic level and which point out towards layer structure of these surfaces. Mirror bright metal surfaces can be obtained only by electrochemical polishing or electrochemical deposition in the presence of brightening addition agents.

Influence of Layer Structure on Antiferromagnetic Exchange Coupling of Iron Films through Chromium Interlayers

1991 ◽  
Vol 231 ◽  
Author(s):  
A.P. Payne ◽  
H. Kataoka ◽  
M. Farle ◽  
B.M. Clemens
Keyword(s):  
Layer Structure ◽  
Buffer Layers ◽  
Antiferromagnetic Coupling ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Iron Films ◽  
Saturation Field ◽  
Topographic Roughness ◽  
Measure Surface Roughness ◽  
Sputtering Pressure

AbstractThe effect of layer structure perturbations on antiferromagnetic coupling in Fe-Cr-Fe trilayer systems is investigated. By varying the sputtering pressure, the layer structure of Fe-Cr-Fe trilayers is systematically altered, as indicated by changes in the low angle superlattice spectra of multilayers fabricated under identical conditions. The effect of topographic roughness is investigated by fabricating identical trilayers on Cr buffer layers of different thickness. Scanning tunneling microscopy is used to measure surface roughness. In each case the saturation field is measured as a function of Cr interlayer thickness by means of tapered Cr interlayer structures in which the thickness of the spacer varies linearly from 0 to 28 Å upon a single substrate. Antiferromagnetic coupling is measured locally by means of the magneto-optic Kerr effect. Results show that although the coupling is diminished by structural perturbations, it is a remarkably robust effect which persists even in instances of poor layer structure.

PHOTON EMISSION FROM TRANSITION METAL SURFACES IN SCANNING TUNNELING MICROSCOPY

1993 ◽  
Vol 07 (01n03) ◽  
pp. 516-519 ◽  
Author(s):  
RICHARD BERNDT ◽  
JAMES K. GIMZEWSKI
Keyword(s):  
Scanning Tunneling Microscope ◽  
Metal Surfaces ◽  
Light Emission ◽  
Local Density ◽  
Photon Emission ◽  
Scanning Tunneling ◽  
Local Density Of States ◽  
Tunneling Microscopy ◽  
Photon Intensity ◽  
Plasmon Modes

Light emission from noble metal surfaces excited by a scanning tunneling microscope has been interpreted as arising from in elastic tunneling excitation of tip-induced plasmon modes. We have extended this work to study the adsorption of oxygen on Ti and have observed the formation of structures with subnanometer lateral dimensions which give rise to clear contrasts in STM topographs and photon intensity maps. The experimental results strongly indicate that these contrasts are due to oxygen-induced variations of the local density of states.

Scanning tunneling microscopy of metal surfaces in air

1987 ◽  
Vol 181 (1-2) ◽  
pp. 119-125 ◽  
Author(s):  
S. Morita ◽  
T. Okada ◽  
Y. Ishigame ◽  
N. Mikoshiba
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Metal Surfaces ◽  
Scanning Tunneling ◽  
Tunneling Microscopy
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