48.1: A New Monolithic Polysilicon Ambient Light Sensor System with Wide Dynamic Range for Active-Matrix Displays by Employing an Adaptive Sensitivity Control Method

2008 ◽  
Vol 39 (1) ◽  
pp. 716 ◽  
Author(s):  
Hyun-Sang Park ◽  
Tae-Jun Ha ◽  
Min-Koo Han ◽  
Doo-Hyung Woo ◽  
Kwang-Sub Shin ◽  
...  
Keyword(s):  
Dynamic Range ◽  
Control Method ◽  
Sensor System ◽  
Ambient Light ◽  
Wide Dynamic Range ◽  
Active Matrix ◽  
Sensitivity Control ◽  
Light Sensor ◽  
Active Matrix Displays

Ambient-light sensor system with wide dynamic range enhanced by adaptive sensitivity control

2009 ◽  
Vol 17 (8) ◽  
pp. 681 ◽  
Author(s):  
Hyun-Sang Park ◽  
Seon-Beom Ji ◽  
Min-Koo Han ◽  
Jae-Sic Lee ◽  
Chi-Woo Kim ◽  
...  
Keyword(s):  
Dynamic Range ◽  
Sensor System ◽  
Ambient Light ◽  
Wide Dynamic Range ◽  
Sensitivity Control ◽  
Light Sensor

A self-reset ambient-light sensor system for low-temperature polycrystalline-silicon active-matrix displays

2008 ◽  
Vol 16 (8) ◽  
pp. 889 ◽  
Author(s):  
Hyun-Sang Park ◽  
Tae-Jun Ha ◽  
Yongtaek Hong ◽  
Min-Koo Han ◽  
Doo-Hyung Woo ◽  
...  
Keyword(s):  
Low Temperature ◽  
Polycrystalline Silicon ◽  
Sensor System ◽  
Ambient Light ◽  
Active Matrix ◽  
Light Sensor ◽  
Active Matrix Displays

An LTPS Ambient Light Sensor System with Sensitivity Correction Methods in LCD

2019 ◽  
Vol E102.C (7) ◽  
pp. 558-564
Author(s):  
Takashi NAKAMURA ◽  
Masahiro TADA ◽  
Hiroyuki KIMURA
Keyword(s):  
Sensor System ◽  
Ambient Light ◽  
Light Sensor

scholarly journals An ambient-light sensor system with startup correction for LTPS-TFT LCD

2014 ◽  
Vol 11 (5) ◽  
pp. 20140086-20140086 ◽  
Author(s):  
Ilku Nam ◽  
Doohyung Woo
Keyword(s):  
Sensor System ◽  
Ambient Light ◽  
Light Sensor

A Full p-Type Poly-Si TFT Shift Register for Active Matrix Displays

2010 ◽  
Vol 1245 ◽  
Author(s):  
Myoung-Hoon Jung ◽  
Hoon-Ju Chung ◽  
Young-Ju Park ◽  
Ohyun Kim
Keyword(s):  
Control Method ◽  
Light Emitting Diode ◽  
Shift Register ◽  
Active Matrix ◽  
Light Emitting ◽  
Organic Light Emitting Diode ◽  
Active Matrix Displays ◽  
Output Load ◽  
Voltage Swing ◽  
P Type

AbstractA new shift register using p-type poly-Si thin-film transistors (TFTs) for active matrix display is proposed. It utilizes only p-type TFTs to simplify the fabrication process, and provides time-shifted output signals with a voltage swing from VSS to VDD without signal-level loss. In the proposed shift register, output is structurally separated from carry and therefore has a high immunity to output signal distortion caused by output load capacitance. We also propose a new light emitting control method using this shift register for high image quality active-matrix organic light emitting diode (AMOLED) displays. The proposed shift register was verified by simulation and measurement.

P-174L: Late-News Poster: The System-LCD with Monolithic Ambient-Light Sensor System

2005 ◽  
Vol 36 (1) ◽  
pp. 356 ◽  
Author(s):  
Kazuhiro Maeda ◽  
Tomoyuki Nagai ◽  
Tamotsu Sakai ◽  
Nobuhiro Kuwabara ◽  
Shuji Nishi ◽  
...  
Keyword(s):  
Sensor System ◽  
Ambient Light ◽  
Light Sensor ◽  
Late News

Slow-Scan CCD Observation of Backscattering Patterns in SEM

1992 ◽  
Vol 50 (2) ◽  
pp. 1308-1309
Author(s):  
F. Ouyang ◽  
D. A. Ray ◽  
O. L. Krivanek
Keyword(s):  
Electron Beam ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Dynamic Range ◽  
High Sensitivity ◽  
Lens System ◽  
Wide Dynamic Range ◽  
Peltier Cooler ◽  
Diffraction Patterns ◽  
Scanning Electron

Electron backscattering Kikuchi diffraction patterns (BKDP) reveal useful information about the structure and orientation of crystals under study. With the well focused electron beam in a scanning electron microscope (SEM), one can use BKDP as a microanalysis tool. BKDPs have been recorded in SEMs using a phosphor screen coupled to an intensified TV camera through a lens system, and by photographic negatives. With the development of fiber-optically coupled slow scan CCD (SSC) cameras for electron beam imaging, one can take advantage of their high sensitivity and wide dynamic range for observing BKDP in SEM.We have used the Gatan 690 SSC camera to observe backscattering patterns in a JEOL JSM-840A SEM. The CCD sensor has an active area of 13.25 mm × 8.83 mm and 576 × 384 pixels. The camera head, which consists of a single crystal YAG scintillator fiber optically coupled to the CCD chip, is located inside the SEM specimen chamber. The whole camera head is cooled to about -30°C by a Peltier cooler, which permits long integration times (up to 100 seconds).

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