P-9: Unified Model and Prediction Technique for On-Current Degradation Caused by Drain-Avalanche Hot Carriers in Low-Temperature Poly-Silicon Thin-Film Transistors
2007 ◽
Vol 38
(1)
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pp. 202-205
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2007 ◽
Vol 28
(7)
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pp. 599-602
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2013 ◽
Vol 9
(S1)
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pp. 13-16
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2005 ◽
Vol 36
(1)
◽
pp. 352
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2008 ◽
Vol 52
(3)
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pp. 365-371
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2011 ◽
Vol 24
(6)
◽
pp. 433-439
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