scholarly journals Test Scheduling of Core Based System-on-Chip Using Modified Ant Colony Optimization

2019 ◽  
Vol 52 (6) ◽  
pp. 599-605 ◽  
Author(s):  
Gokul Chandrasekaran ◽  
Vanchinathan Kumarasamy ◽  
Gnanavel Chinraj
Keyword(s):  
Ant Colony Optimization ◽  
System On Chip ◽  
Ant Colony ◽  
Test Scheduling ◽  
On Chip

Test scheduling of System-on-Chip using Dragonfly and Ant Lion optimization algorithms

2020 ◽  
pp. 1-13
Author(s):  
Gokul Chandrasekaran ◽  
P.R. Karthikeyan ◽  
Neelam Sanjeev Kumar ◽  
Vanchinathan Kumarasamy
Keyword(s):  
Ant Colony Optimization ◽  
Artificial Bee Colony ◽  
Optimization Algorithms ◽  
System On Chip ◽  
Test Time ◽  
Test Scheduling ◽  
Bee Colony ◽  
Ant Lion Optimization ◽  
Ant Lion ◽  
On Chip

Test scheduling of System-on-Chip (SoC) is a major problem solved by various optimization techniques to minimize the cost and testing time. In this paper, we propose the application of Dragonfly and Ant Lion Optimization algorithms to minimize the test cost and test time of SoC. The swarm behavior of dragonfly and hunting behavior of Ant Lion optimization methods are used to optimize the scheduling time in the benchmark circuits. The proposed algorithms are tested on p22810 and d695 ITC’02 SoC benchmark circuits. The results of the proposed algorithms are compared with other algorithms like Ant Colony Optimization, Modified Ant Colony Optimization, Artificial Bee Colony, Modified Artificial Bee Colony, Firefly, Modified Firefly, and BAT algorithms to highlight the benefits of test time minimization. It is observed that the test time obtained for Dragonfly and Ant Lion optimization algorithms is 0.013188 Sec for D695, 0.013515 Sec for P22810, and 0.013432 Sec for D695, 0.013711 Sec for P22810 respectively with TAM Width of 64, which is less as compared to the other well-known optimization algorithms.

Minimization of test time in system on chip using artificial intelligence-based test scheduling techniques

2019 ◽  
Vol 32 (9) ◽  
pp. 5303-5312 ◽  
Author(s):  
Gokul Chandrasekaran ◽  
Sakthivel Periyasamy ◽  
Karthikeyan Panjappagounder Rajamanickam
Keyword(s):  
Artificial Intelligence ◽  
System On Chip ◽  
Test Time ◽  
Test Scheduling ◽  
On Chip

scholarly journals Test scheduling for system on chip using modified firefly and modified ABC algorithms

2019 ◽  
Vol 1 (9) ◽  
Author(s):  
Gokul Chandrasekaran ◽  
Sakthivel Periyasamy ◽  
P. R. Karthikeyan
Keyword(s):  
System On Chip ◽  
Test Scheduling ◽  
On Chip

scholarly journals NoC-Based SoC Test Scheduling Using Ant Colony Optimization

ETRI Journal ◽  
2008 ◽  
Vol 30 (1) ◽  
pp. 129-140 ◽  
Author(s):  
Jin-Ho Ahn ◽  
Sungho Kang
Keyword(s):  
Ant Colony Optimization ◽  
Ant Colony ◽  
Test Scheduling ◽  
Soc Test

Test Scheduling Method Based on Cellular Genetic Algorithm for System on Chip

2010 ◽  
Vol 663-665 ◽  
pp. 670-673
Author(s):  
Zhong Liang Pan ◽  
Ling Chen
Keyword(s):  
Genetic Algorithm ◽  
System On Chip ◽  
Test Time ◽  
Test Scheduling ◽  
Scheduling Problem ◽  
Good Test ◽  
Cellular Genetic Algorithm ◽  
Scheduling Method ◽  
On Chip ◽  
Feasible Solutions

The main aspects for the test of system on chip (SoC) are designing testability architectures and solving the test scheduling. The test time of SoC can be reduced by using good test scheduling schemes. A test scheduling method based on cellular genetic algorithm is presented in this paper. In the method, the individuals are used to represent the feasible solutions of the test scheduling problem, the individuals are distributed over a grid or connected graph, the genetic operations such as selection and mutation are applied locally in some neighborhood of each individual. The test scheduling schemes are obtained by carrying out the evolutionary operations for the populations. A lot of experiments are performed for the SoC benchmark circuits, the experimental results show that the better test scheduling schemes can be obtained by the method in this paper.

A SIMULATED ANNEALING ALGORITHM FOR SYSTEM-ON-CHIP TEST SCHEDULING WITH, POWER AND PRECEDENCE CONSTRAINTS

2006 ◽  
Vol 06 (04) ◽  
pp. 511-530 ◽  
Author(s):  
HAIDAR M. HARMANANI ◽  
HASSAN A. SALAMY
Keyword(s):  
Simulated Annealing ◽  
Simulated Annealing Algorithm ◽  
System On Chip ◽  
Precedence Constraints ◽  
Test Scheduling ◽  
Optimal Test ◽  
Power Constraints ◽  
Soc Test ◽  
On Chip ◽  
Minimum System

This paper presents an efficient method to determine minimum system-on-chip (SOC) test schedules with precedence and power constraints based on simulated annealing. The problem is solved using a partitioned testing scheme with run to completion that minimizes the number of idle test slots. The method can handle SOC test scheduling with and without power constraints in addition to precedence constraints that preserve desirable orderings among tests. We present experimental results for various SOC examples that demonstrate the effectiveness of the method. The method achieved optimal test schedules in all attempted cases in a short CPU time.

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