An Innovative Two-Year Engineering Design Capstone Experience at James Madison University

In order for our future engineers to be able to work toward a sustainable future, they must be versed not only in sustainable engineering but also in engineering design. An engineering education must train our future engineers to think flexibly and to be adaptive as it is unlikely that their future will have them working in one domain. They must, instead, be versatilists. The School of Engineering at James Madison University has been developed from the ground up to provide this general engineering training with an emphasis on engineering design, systems thinking, and sustainability. Students take courses in math and science, business and liberal arts, engineering science, sustainability, and design. In this paper, we discuss how sustainability is taught in a multi-context perspective through the School’s curriculum and pedagogy. We do not mean to present the School’s approach as an all or nothing model, but instead as a collection of approaches of which hopefully one or more may be appropriate at another university.

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A New Vision for Engineering Design Instruction: On the Innovative Six Course Design Sequence of James Madison University

10.18260/1-2--20841 ◽

2020 ◽

Cited By ~ 1

Author(s):

Olga Pierrakos ◽

Eric Pappas ◽

Robert Nagel ◽

Jacquelyn Nagel

Keyword(s):

Engineering Design ◽

Course Design ◽

James Madison ◽

New Vision

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Resolution and measurement in the scanning electron microscope

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100127256 ◽

1987 ◽

Vol 45 ◽

pp. 534-537 ◽

Cited By ~ 2

Author(s):

Michael T. Postek

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Engineering Design ◽

Resolving Power ◽

Practical Applications ◽

Instrument Resolution ◽

Accurate Definition ◽

Definition Of ◽

Scanning Electron ◽

Better Than

The term ultimate resolution or resolving power is the very best performance that can be obtained from a scanning electron microscope (SEM) given the optimum instrumental conditions and sample. However, as it relates to SEM users, the conventional definitions of this figure are ambiguous. The numbers quoted for the resolution of an instrument are not only theoretically derived, but are also verified through the direct measurement of images on micrographs. However, the samples commonly used for this purpose are specifically optimized for the measurement of instrument resolution and are most often not typical of the sample used in practical applications.SEM RESOLUTION. Some instruments resolve better than others either due to engineering design or other reasons. There is no definitively accurate definition of how to quantify instrument resolution and its measurement in the SEM.

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