scholarly journals Letter to the editor

2020 ◽  
Vol V (3) ◽  
pp. 171-173
Author(s):  
D. Ginzburg-Shik

Dear Mr. Editor! In the section "Chronicle and mixture", issue 2 of the V volume of "Neurological Bulletin", there is a note in which it is said that "in the Kherson psychiatric hospital, an audit is being carried out regarding the abuse discovered by the head physician, who has been temporarily removed from the performance of his duties." This naturally leads the author of the lock "to very sad reflections." One cannot but agree with the author that "it is extremely sad to mark such sad facts in our literature!" But first of all the facts or other facts should be recognized as sad on the moral and ethical side and published, it would seem, one must a priori be convinced of their validity.

1975 ◽  
Vol 40 (4) ◽  
pp. 549-549
Author(s):  
A. Damien Martin

Two lines were omitted from A. Damien Martin’s letter to the editor, “Reply to Aten, Darley, Deal, and Johns,” which appeared on pages 420–422 of the August, 1975, Volume 40, issue of this journal. The paragraph should read: The writers state flatly “But the simple fact, known to everyone … is that not all aphasic patients display phonologic impairment. Only some of them do. And some patients display phonological impairment in pure culture with no associated problems in the use of lexicon or syntax.” There is not total agreement on this. Schuell (1965) pointed out that her Group I and II patients presented inconsistent misarticulation, while Group III patients presented phonological difficulties as a major presenting symptom. In some of my own research (Martin and Rigrodsky, 1974a, 1974b) patients who did not present phonological impairment as a major symptom showed it within certain tasks. In a later study (Martin et al., 1975) we found that the incidence, type, and position of error were related to the presence or absence of morphological inflection. The arguments presented by Aten et al. illustrate one of the dangers of categorization, especially dischotomous categorization. It can reflect “the old error of observing only the most obvious symptoms that fit some a priori assumption, or symptoms prominent at one point in time” (Schuell, Jenkins, and Jimenez-Pabon, 1964, p. 101).


Author(s):  
D. E. Luzzi ◽  
L. D. Marks ◽  
M. I. Buckett

As the HREM becomes increasingly used for the study of dynamic localized phenomena, the development of techniques to recover the desired information from a real image is important. Often, the important features are not strongly scattering in comparison to the matrix material in addition to being masked by statistical and amorphous noise. The desired information will usually involve the accurate knowledge of the position and intensity of the contrast. In order to decipher the desired information from a complex image, cross-correlation (xcf) techniques can be utilized. Unlike other image processing methods which rely on data massaging (e.g. high/low pass filtering or Fourier filtering), the cross-correlation method is a rigorous data reduction technique with no a priori assumptions.We have examined basic cross-correlation procedures using images of discrete gaussian peaks and have developed an iterative procedure to greatly enhance the capabilities of these techniques when the contrast from the peaks overlap.


Author(s):  
H.S. von Harrach ◽  
D.E. Jesson ◽  
S.J. Pennycook

Phase contrast TEM has been the leading technique for high resolution imaging of materials for many years, whilst STEM has been the principal method for high-resolution microanalysis. However, it was demonstrated many years ago that low angle dark-field STEM imaging is a priori capable of almost 50% higher point resolution than coherent bright-field imaging (i.e. phase contrast TEM or STEM). This advantage was not exploited until Pennycook developed the high-angle annular dark-field (ADF) technique which can provide an incoherent image showing both high image resolution and atomic number contrast.This paper describes the design and first results of a 300kV field-emission STEM (VG Microscopes HB603U) which has improved ADF STEM image resolution towards the 1 angstrom target. The instrument uses a cold field-emission gun, generating a 300 kV beam of up to 1 μA from an 11-stage accelerator. The beam is focussed on to the specimen by two condensers and a condenser-objective lens with a spherical aberration coefficient of 1.0 mm.


1978 ◽  
Vol 9 (3) ◽  
pp. 197-200
Author(s):  
Peter B. Smith
Keyword(s):  

1994 ◽  
Vol 3 (1) ◽  
pp. 89-89
Author(s):  
Lawrence I. Shotland
Keyword(s):  

1994 ◽  
Vol 3 (1) ◽  
pp. 87-87
Author(s):  
David Cieliczka
Keyword(s):  

1994 ◽  
Vol 3 (1) ◽  
pp. 92-93
Author(s):  
Larry Engelmann
Keyword(s):  

1994 ◽  
Vol 3 (1) ◽  
pp. 92-92
Author(s):  
Gregory Frazer
Keyword(s):  

1994 ◽  
Vol 3 (1) ◽  
pp. 92-92
Author(s):  
Edwin L. Harless
Keyword(s):  

1995 ◽  
Vol 4 (3) ◽  
pp. 89-89
Author(s):  
Bill Fitzgibbon
Keyword(s):  

Sign in / Sign up

Export Citation Format

Share Document