scholarly journals TRISP: Three axes spin echo spectrometer

2015 ◽  
Vol 1 ◽  
Author(s):  
Thomas Keller ◽  
Bernhard Keimer
Keyword(s):  
Solid State ◽  
High Resolution ◽  
Spin Echo ◽  
Max Planck ◽  
Neutron Spectrometer ◽  
State Research

TRISP, operated by the Max-Planck-Institute for Solid State Research, is a high-resolution neutron spectrometer combining the three axes and <strong>n</strong>eutron <strong>r</strong>esonance <strong>s</strong>pin <strong>e</strong>cho (NRSE) techniques.

scholarly journals NREX: Neutron reflectometer with X-ray option

2015 ◽  
Vol 1 ◽  
Author(s):  
Yury Khaydukov ◽  
Olaf Soltwedel ◽  
Thomas Keller
Keyword(s):  
Thin Film ◽  
Magnetic Properties ◽  
Solid State ◽  
High Resolution ◽  
Max Planck ◽  
X Ray ◽  
Neutron Reflectometer ◽  
State Research ◽  
Structural And Magnetic Properties

The high resolution neutron/ X-ray contrast reflectometer NREX, operated by the Max Planck Institute for Solid State Research, is designed for the determination of structural and magnetic properties of surfaces, interfaces, and thin film systems.

The use of high-resolution FESEM to study solid-state phase transformations and reactions

1994 ◽  
Vol 52 ◽  
pp. 1028-1029
Author(s):  
P. G. Kotula ◽  
D. D. Erickson ◽  
C. B. Carter
Keyword(s):  
Solid State ◽  
High Resolution ◽  
Phase Transformations ◽  
High Efficiency ◽  
Sol Gel ◽  
Quantitative Information ◽  
Solid State Reactions ◽  
Critical Dimensions ◽  
Backscattered Electrons ◽  
Backscattered Electron

High-resolution field-emission-gun scanning electron microscopy (FESEM) has recently emerged as an extremely powerful method for characterizing the micro- or nanostructure of materials. The development of high efficiency backscattered-electron detectors has increased the resolution attainable with backscattered-electrons to almost that attainable with secondary-electrons. This increased resolution allows backscattered-electron imaging to be utilized to study materials once possible only by TEM. In addition to providing quantitative information, such as critical dimensions, SEM is more statistically representative. That is, the amount of material that can be sampled with SEM for a given measurement is many orders of magnitude greater than that with TEM.In the present work, a Hitachi S-900 FESEM (operating at 5kV) equipped with a high-resolution backscattered electron detector, has been used to study the α-Fe2O3 enhanced or seeded solid-state phase transformations of sol-gel alumina and solid-state reactions in the NiO/α-Al2O3 system. In both cases, a thin-film cross-section approach has been developed to facilitate the investigation. Specifically, the FESEM allows transformed- or reaction-layer thicknesses along interfaces that are millimeters in length to be measured with a resolution of better than 10nm.

Solid State Research

2000 ◽  
Author(s):  
David C. Shaver
Keyword(s):  
Solid State ◽  
State Research

Solid State Research

2001 ◽  
Author(s):  
David C. Shaver
Keyword(s):  
Solid State ◽  
State Research
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