scholarly journals Изучение особенностей формирования композитных структур на основе столбиков никеля в матрице диоксида кремния с помощью синхротронных XANES исследований в режиме регистрации выхода электронов или фотонов

2019 ◽  
Vol 21 (1) ◽  
pp. 116-125
Author(s):  
Elena V. Parinova ◽  
Aleksander K. Fedotov ◽  
Dmitry А. Koyuda ◽  
Julia А. Fedotova ◽  
Eugene А. Streltsov ◽  
...  
Keyword(s):  
Solid State ◽  
Materials Science ◽  
Condensed Matter ◽  
Thin Solid Films ◽  
Edge Structure ◽  
X Ray ◽  
Solid Films ◽  
Nexafs Spectroscopy ◽  
X Ray Absorption ◽  
Two Hybrid

Методом синхротронной спектроскопии ближней тонкой структуры края рентгеновского поглощения (X-ray Absorption Near Edge Structure – XANES) проведена диагностика массивов столбиков никеля, случайным образом распределенных в слое SiO2 на подложке кремния. Столбики никеля были получены методом электрохимического осаждения металла в поры матрицы диоксида кремния, сформированные трековым методом. Латентные треки формировались путем облучения слоя SiO2 тяжелыми ионами золота на ускорителе института Хан-Майтнер (Берлин, Германия). Методом растровой электронной микроскопии установлены особенности заполнения пор металлом, показана специфика образования столбиков Ni, их морфология (поверхность и сколы). Для исследований электронно-энергетического строения массивов Ni столбиков методом XANES использовалось высокоинтенсивное синхротронное излучение ультрамягкого рентгеновского диапазона накопительного кольца BESSY II Гельмгольц Центра Берлин. Путем анализа локального окружения атомов никеля и кислорода по данным синхротронного метода XANES изучена специфика фазового состава поверхностных слоев, включая интерфейс столбик-матрица. Возможное образование фазы силицида никеля показано лишь при определенных режимах формирования массивов столбиков, в случае частичного разрушения матрицы диоксида кремния и при контакте металла с подложкой Si. Изучена специфика естественного окисления поверхности гетероструктуры столбик никеля - диоксид кремния.   ИСТОЧНИК ФИНАНСИРОВАНИЯ Исследование выполнено при поддержке гранта РФФИ (проект №18-32-01046 мол_а) и при частичной поддержке Миниcтеpcтва обpазования и науки Pоccийcкой Федеpации в pамкаx гоcудаpcтвенного задания ВУЗам в cфеpе научной деятельности на 2017–2020 гг. – пpоект № 16.8158.2017/8.9. БЛАГОДАРНОСТИ Авторы работы выражают благодарность Директору и администрации Гельмгольц Центра Берлин, а также Координаторам Российско-Германской лаборатории и каналов синхротрона BESSY II Гельмгольц Центра Берлин.     ЛИТЕРАТУРА Herino R. Sci. Eng. B, 2000, vol. 69-70, pp. 70-76. https://doi.org/10.1016/S0921-5107(99)00269-X Sasano J., Murota R., Yamauchi Y., Sakka T., Ogata Y. H. Electroanal. Chem., 2003, vol. 559, pp. 125-130. https://doi.org/10.1016/S0022-0728(03)00383-8 Rumpf K., Granitzer P., Pölt P., Reichmann A., Krenn H. Thin Solid Films, 2006, vol. 515, pp. 716-720. https://doi.org/1016/S0022-0728(03)00383-810.1016/j.tsf.2005.12.182 Granitzer P., Rumpf K., Krenn H. Thin Solid Films, 2006, vol. 515, pp. 735-738. https://doi.org/10.1016/j.tsf.2005.12.259 Fink D., Alegaonkar P. S., Petrov A. V., Wilhelm M., Szimkowiak P., Behar M., Sinha D., Fahrner W. R., Hoppe K., Chadderton L. T. Instr. Meth B, 2005, vol. 236, pp. 11-20. https://doi.org/10.1016/j.nimb.2005.03.243 Ivanou D. K., Streltsov Е. A., Fedotov A. K., Mazanik A. V., Fink D., Petrov A. Thin Solid Films, 2005, vol. 490, pp. 154-160. https://doi.org/1016/j.tsf.2005.04.046 Ivanova Yu. A., Ivanou D. K., Fedotov A. K., Streltsov Е. A., Demyanov S. E., Petrov A. V., Kaniukov E. Yu., Fink D. Materials Science, 2007, vol. 42, pp. 9163–9169. https://doi.org/10.1007/s10853-007-1926-x Ragoisha G. A., Bondarenko A. S., Osipovich N. P., Rabchynski S. M., Streltsov E. A. Electrochimica Acta., 2008, vol. 53, pp. 3879-3888. https://doi.org/10.1016/j.electacta.2007.09.017 Turishchev S. Yu., Parinova E. V., Fedotova J. A., Mazanik A. V., Fedotov A. K., Apel P. Yu. Condensed Matter and Interfaces, 2013, vol. 15, no. 1, pp. 54-58. URL: http://www.kcmf.vsu.ru/resources/t_15_1_2013_010.pdf (in Russ.) Erbil A., Cargill III G. S., Frahm R., Boehme R. F. Rev. B, 1988, vol. 37, pp. 2450-2465. https://doi.org/10.1103/PhysRevB.37.2450 Turishchev S. Yu., Terekhov V. A., Nesterov D. N., Koltygina K. G., Parinova E. V., Koyuda D. A., Schleusener A., Sivakov V., Domashevskaya E. P. Condensed Matter and Interfaces, 2016, V. 18, no. 1, pp. 130-141. URL: http://www.kcmf.vsu.ru/resources/t_18_1_2016_014.pdf (in Russ.) Chuvenkova O. A., Domashevskaya E. P., Ryabtsev S. V., Yurakov Yu. A., Popov A. E., Koyuda D. A., Nesterov D. N., Spirin D. E., Ovsyannikov R. Yu., Turishchev S. Yu. Physics of the Solid State, 2015, vol. 57, no. 1, pp. 153-161. https://doi.org/10.1134/S1063783415010072 Turishchev S. Yu., Terekhov V. A., Koyuda D. A., Ershov A. V., Mashin A. I., Parinova E. V., Nesterov D. N., Grachev D. A., Karabanova I. A., Domashevskaya E. P. Semiconductors, 2017, vol. 51, no. 3 pp. 349-352. https://doi.org/10.1134/S1063782617030241 Kasrai M., Lennard W. N., Brunner R. W., Bancroft G. M., Bardwell J. A., Tan K. H. Surf. Sci., 1996, vol. 99, pp. 303-312. https://doi.org/10.1016/0169-4332(96)00454-0 Fedotova J., Saad A., Ivanou D., Ivanova Yu., Fedotov A., Mazanik A., Svito I., Streltsov E., Tyutyunnikov S., Koltunowicz T. N. Electrical Review, 2012, vol. 88, pp. 305-308. Zimkina T. M., Fomichev V. A. Ultrasoft X-ray spectroscopy. Leningrad, LGU Publ., 1971, 132 p. Stohr J. NEXAFS Spectroscopy. Springer, Berlin, 1996, 403 p. Regan T. J., Ohldag H., Stamm C., et al. Rev. B, 2001, vol. 64, p. 214422. https://doi.org/10.1103/PhysRevB.64.214422 Barranco A., Yubero F., Espinós J. P., Groening P., González-Elipe A. R. Appl. Phys., 2005, vol. 97, p. 113714. https://doi.org/10.1063/1.1927278 Domashevskaya E. P., Storozhilov S. A., Turishchev S. Yu., Kashkarov V. M., Terekhov V. A., Stognei O. V., Kalinin Yu. E., Sitnikov A. V., Molodtsov S. L. Physics of the Solid State, 2008, vol. 50, no. 1, pp. 139-145. https://doi.org/10.1134/S1063783408010253 Terekhov V. A., Turishchev S. Y., and Domashevskaya E. P. / Ed. Sattler Klaus D. Systems of Silicon Nanocrystals and their Peculiarities (Chapter 5). Silicon Nanomaterials Sourcebook. Volume Two. Hybrid Materials, Arrays, Networks, and Devices. CRC Press, Taylor and Francis Group, 2017, 45 p.

Optimizing Homogeneous Thin Solid Films (HTSFs) from µL-Blood Droplets via Hyper-Hydrophilic Coatings (HemaDropTM) for Accurate Compositional Analysis via IBA, XRF, and XPS

MRS Advances ◽  
2019 ◽  
Vol 4 (46-47) ◽  
pp. 2489-2513
Author(s):  
Nicole Herbots ◽  
Nikhil C. Suresh ◽  
Shaurya Khanna ◽  
Saaketh R. Narayan ◽  
Amber A. Chow ◽  
...  
Keyword(s):  
Heavy Metals ◽  
Solid State ◽  
Liquid Phase ◽  
Phase Analysis ◽  
Thin Solid Films ◽  
X Ray ◽  
Blood Electrolytes ◽  
Solid Films ◽  
Blood Tests ◽  
Blood Volumes

ABSTRACTLiquid phase analysis dominates the field of blood diagnostics and requires drawing blood volumes of several ml for each test. To achieve acceptable accuracy, each single liquid blood test requires ∼7 mL per blood sample, and repeated blood tests are often needed. Frequent testing ca result in Hospital Acquired Anemia for infants, chronically ill, and critically ill patients. Blood testing methods that can be utilized with small amounts of blood are a critical need to save lives. Theranos claimed to have developed novel methods requiring only a few nL of blood. However, Theranos’ techniques led to errors that exceeded beyond the medically acceptable threshold of 10%. This work investigates solid state blood analysis using low volumes of several µL. The most common blood tests used as first line for diagnostics and monitoring patients’ status, always include blood electrolytes, iron, and in some cases, heavy metals.The present work investigates the formation of rapidly solidified Homogeneous Thin Solid Films (HTSFs) formed from blood drops, in order to make them suitable for solid state analysis in vacuo and in air. The solidification of ∼5 micro-liter (µL)-sized blood droplets into HTSFs is studied with two goals: achieve reproducible HTSFs optimized for producing accurate analysis, and successfully measure the potential accuracy of measurements made on HTSFs for blood electrolytes Na, K, Mg, Ca, and Cl and heavy metals such as Fe.The blood volumes selected for this work are in the µL range, one thousandth volumes drawn for current liquid phase analysis. Balanced Saline Solution (BSS) is used as an initial liquid for testing solidification uniformity and a potential calibration material. Next, canine and human blood are studied on two types of HemaDropTM coatings for solidification: super-hydrophilic and hyper-hydrophilic. HTSF formation from BSS and blood drops are compared on both coated and uncoated surfaces.Three solid state analytical methods are investigated in parallel to probe composition at different depths and test each for reproducibility and accuracy: Ion Beam Analysis (IBA), X-ray Fluorescence (XRF), and X-ray Photoelectron Spectroscopy (XPS). The results show that using solid films of blood yields composition, which can be reproducibly measured by IBA, XPS and XRF to varying degrees. XPS’s depth of analysis, limited to ∼5 nm, probes a small fraction of the HTSF, but provides insights into the range of thickness for homogeneous compositions in HTSFs. Statistical and error analysis help establish whether measurements taken in sets of three typically used in lab fall below the medically accepted error threshold (<10%) for each technique and element detected. Measurements are repeated and taken at various locations and on different HTSFs to establish reproducibility. XRF is of particular interest, because it is fast, accurate, portable and can be conducted in air, making it ideal for areas with limited resources.

Probing solid state N-doping in graphene by X-ray absorption near-edge structure spectroscopy

Carbon ◽  
2012 ◽  
Vol 50 (1) ◽  
pp. 335-338 ◽  
Author(s):  
Jun Zhong ◽  
Jiu-Jun Deng ◽  
Bao-Hua Mao ◽  
Tian Xie ◽  
Xu-Hui Sun ◽  
...  
Keyword(s):  
Solid State ◽  
Edge Structure ◽  
X Ray ◽  
N Doping ◽  
X Ray Absorption

Chemical and orientational imaging of polymeric samples

1994 ◽  
Vol 52 ◽  
pp. 68-69
Author(s):  
H. Ade ◽  
B. Hsiao ◽  
G. Mitchell ◽  
E. Rightor ◽  
A. P. Smith ◽  
...  
Keyword(s):  
Ethylene Terephthalate ◽  
National Laboratory ◽  
Brookhaven National Laboratory ◽  
Carbonyl Groups ◽  
Aromatic Rings ◽  
Edge Structure ◽  
X Ray ◽  
Scanning Transmission ◽  
Polymeric Samples ◽  
X Ray Absorption

We have used the Scanning Transmission X-ray Microscope at beamline X1A (X1-STXM) at Brookhaven National Laboratory (BNL) to acquire high resolution, chemical and orientation sensitive images of polymeric samples as well as point spectra from 0.1 μm areas. This sensitivity is achieved by exploiting the X-ray Absorption Near Edge Structure (XANES) of the carbon K edge. One of the most illustrative example of the chemical sensitivity achievable is provided by images of a polycarbonate/pol(ethylene terephthalate) (70/30 PC/PET) blend. Contrast reversal at high overall contrast is observed between images acquired at 285.36 and 285.69 eV (Fig. 1). Contrast in these images is achieved by exploring subtle differences between resonances associated with the π bonds (sp hybridization) of the aromatic groups of each polymer. PET has a split peak associated with these aromatic groups, due to the proximity of its carbonyl groups to its aromatic rings, whereas PC has only a single peak.

Full-Field Calcium K-Edge X-ray Absorption Near-Edge Structure Spectroscopy on Cortical Bone at the Micron-Scale: Polarization Effects Reveal Mineral Orientation

2016 ◽  
Vol 88 (7) ◽  
pp. 3826-3835 ◽  
Author(s):  
Bernhard Hesse ◽  
Murielle Salome ◽  
Hiram Castillo-Michel ◽  
Marine Cotte ◽  
Barbara Fayard ◽  
...  
Keyword(s):  
Cortical Bone ◽  
Edge Structure ◽  
Full Field ◽  
Polarization Effects ◽  
X Ray ◽  
X Ray Absorption

scholarly journals Database of ab initio L-edge X-ray absorption near edge structure

2021 ◽  
Vol 8 (1) ◽  
Author(s):  
Yiming Chen ◽  
Chi Chen ◽  
Chen Zheng ◽  
Shyam Dwaraknath ◽  
Matthew K. Horton ◽  
...  
Keyword(s):  
High Throughput ◽  
Scattering Theory ◽  
Research Community ◽  
Metal Compounds ◽  
Edge Structure ◽  
X Ray ◽  
Initial Release ◽  
Computational Workflow ◽  
X Ray Absorption

AbstractThe L-edge X-ray Absorption Near Edge Structure (XANES) is widely used in the characterization of transition metal compounds. Here, we report the development of a database of computed L-edge XANES using the multiple scattering theory-based FEFF9 code. The initial release of the database contains more than 140,000 L-edge spectra for more than 22,000 structures generated using a high-throughput computational workflow. The data is disseminated through the Materials Project and addresses a critical need for L-edge XANES spectra among the research community.

Theoretical and experimental investigation of point defects in cubic boron nitride

MRS Advances ◽  
2017 ◽  
Vol 2 (29) ◽  
pp. 1545-1550 ◽  
Author(s):  
Nicholas L. McDougall ◽  
Jim G. Partridge ◽  
Desmond W. M. Lau ◽  
Philipp Reineck ◽  
Brant C. Gibson ◽  
...  
Keyword(s):  
Boron Nitride ◽  
Cubic Boron Nitride ◽  
Optical Emission ◽  
Wide Band ◽  
Wide Band Gap ◽  
Edge Structure ◽  
X Ray ◽  
Substitutional Defects ◽  
X Ray Absorption ◽  
Annealing Experiments

ABSTRACTCubic boron nitride (cBN) is a synthetic wide band gap material that has attracted attention due to its high thermal conductivity, optical transparency and optical emission. In this work, defects in cBN have been investigated using experimental and theoretical X-ray absorption near edge structure (XANES). Vacancy and O substitutional defects were considered, with O substituted at the N site (ON) to be the most energetically favorable. All defects produce unique signatures in either the B or N K-edges and can thus be identified using XANES. The calculations coupled with electron-irradiation / annealing experiments strongly suggest that ON is the dominant defect in irradiated cBN and remains after annealing. This defect is a likely source of optical emission in cBN.

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