Analysis of Low-Energy Electron Track Structure in Liquid Water

2004 ◽  
Vol 161 (5) ◽  
pp. 591-596 ◽  
Author(s):  
W. E. Wilson ◽  
J. H. Miller ◽  
D. J. Lynch ◽  
R. R. Lewis ◽  
M. Batdorf
Keyword(s):  
Liquid Water ◽  
Low Energy ◽  
Energy Electron ◽  
Track Structure ◽  
Electron Track ◽  
Low Energy Electron

A Monte Carlo program for the analysis of low-energy electron tracks in liquid water

2011 ◽  
Vol 56 (7) ◽  
pp. 1985-2003 ◽  
Author(s):  
Kristin Wiklund ◽  
José M Fernández-Varea ◽  
Bengt K Lind
Keyword(s):  
Monte Carlo ◽  
Liquid Water ◽  
Low Energy ◽  
Energy Electron ◽  
Monte Carlo Program ◽  
Low Energy Electron

Monte Carlo assessment of low energy electron range in liquid water and dosimetry effects

2020 ◽  
Vol 80 ◽  
pp. 363-372
Author(s):  
Baljeet Seniwal ◽  
Bruno M. Mendes ◽  
Francisco Malano ◽  
Pedro Pérez ◽  
Mauro Valente ◽  
...  
Keyword(s):  
Monte Carlo ◽  
Liquid Water ◽  
Low Energy ◽  
Energy Electron ◽  
Low Energy Electron ◽  
Electron Range

scholarly journals Low-energy electron distributions from the photoionization of liquid water: a sensitive test of electron mean-free paths

2022 ◽  
Author(s):  
Titouan Gadeyne ◽  
Pengju Zhang ◽  
Axel Schild ◽  
Hans Jakob Wörner
Keyword(s):  
Aqueous Solutions ◽  
Liquid Water ◽  
Low Energy ◽  
Energy Electron ◽  
Sensitive Test ◽  
Electron Distributions ◽  
Low Energy Electron ◽  
Slow Electrons

The availability of accurate mean-free paths for slow electrons ($<$ 50~eV) in water is central to the understanding of many electron-driven processes in aqueous solutions, but their determination poses major...

scholarly journals Track structure simulation of low energy electron damage to DNA using Geant4-DNA

2018 ◽  
Vol 4 (6) ◽  
pp. 065009 ◽  
Author(s):  
Mojtaba Mokari ◽  
Mohammad Hassan Alamatsaz ◽  
Hossein Moeini ◽  
Ali Akbar Babaei-Brojeny ◽  
Reza Taleei
Keyword(s):  
Low Energy ◽  
Energy Electron ◽  
Track Structure ◽  
Structure Simulation ◽  
Low Energy Electron

Low-Energy Electron Penetration Range in Liquid Water

2002 ◽  
Vol 158 (5) ◽  
pp. 657-660 ◽  
Author(s):  
Jintana Meesungnoen ◽  
Jean-Paul Jay-Gerin ◽  
Abdelali Filali-Mouhim ◽  
Samlee Mankhetkorn
Keyword(s):  
Liquid Water ◽  
Low Energy ◽  
Energy Electron ◽  
Low Energy Electron

Performance Evaluation of a Novel Type of Low-Energy Electron Microscope

1990 ◽  
Vol 48 (1) ◽  
pp. 354-355
Author(s):  
Bertholdand Senftinger ◽  
Helmut Liebl
Keyword(s):  
Electron Microscope ◽  
High Resolution ◽  
Field Strength ◽  
Numerical Aperture ◽  
Low Energy ◽  
Energy Electron ◽  
High Resolution Imaging ◽  
Lens System ◽  
Resolution Imaging ◽  
Low Energy Electron

During the last few years the investigation of clean and adsorbate-covered solid surfaces as well as thin-film growth and molecular dynamics have given rise to a constant demand for high-resolution imaging microscopy with reflected and diffracted low energy electrons as well as photo-electrons. A recent successful implementation of a UHV low-energy electron microscope by Bauer and Telieps encouraged us to construct such a low energy electron microscope (LEEM) for high-resolution imaging incorporating several novel design features, which is described more detailed elsewhere.The constraint of high field strength at the surface required to keep the aberrations caused by the accelerating field small and high UV photon intensity to get an improved signal-to-noise ratio for photoemission led to the design of a tetrode emission lens system capable of also focusing the UV light at the surface through an integrated Schwarzschild-type objective. Fig. 1 shows an axial section of the emission lens in the LEEM with sample (28) and part of the sample holder (29). The integrated mirror objective (50a, 50b) is used for visual in situ microscopic observation of the sample as well as for UV illumination. The electron optical components and the sample with accelerating field followed by an einzel lens form a tetrode system. In order to keep the field strength high, the sample is separated from the first element of the einzel lens by only 1.6 mm. With a numerical aperture of 0.5 for the Schwarzschild objective the orifice in the first element of the einzel lens has to be about 3.0 mm in diameter. Considering the much smaller distance to the sample one can expect intense distortions of the accelerating field in front of the sample. Because the achievable lateral resolution depends mainly on the quality of the first imaging step, careful investigation of the aberrations caused by the emission lens system had to be done in order to avoid sacrificing high lateral resolution for larger numerical aperture.

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