Biophysical Modeling of Fragment Length Distributions of DNA Plasmids after X and Heavy-Ion Irradiation Analyzed by Atomic Force Microscopy

2008 ◽  
Vol 169 (6) ◽  
pp. 649-659 ◽  
Author(s):  
Thilo Elsässer ◽  
Stephan Brons ◽  
Katarzyna Psonka ◽  
Michael Scholz ◽  
Ewa Gudowska-Nowak ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Fragment Length ◽  
Ion Irradiation ◽  
Heavy Ion ◽  
Biophysical Modeling ◽  
Force Microscopy ◽  
Heavy Ion Irradiation ◽  
Atomic Force

BIOPHYSICAL MODELING OF FRAGMENT DISTRIBUTIONS OF DNA PLASMIDS AFTER HEAVY ION IRRADIATION

2008 ◽  
pp. 389-398 ◽  
Author(s):  
TH. ELSÄSSER ◽  
M. SCHOLZ ◽  
G. TAUCHER-SCHOLZ ◽  
S. BRONS ◽  
K. PSONKA ◽  
...  
Keyword(s):  
Ion Irradiation ◽  
Heavy Ion ◽  
Biophysical Modeling ◽  
Heavy Ion Irradiation

Study of Swift Heavy Ion Irradiation Induced Nanophases of TiO2

2013 ◽  
Vol 24 ◽  
pp. 133-139 ◽  
Author(s):  
Madhavi Thakurdesai ◽  
A. Mahadkar ◽  
Varsha Bhattacharyya
Keyword(s):  
Thin Films ◽  
Ion Irradiation ◽  
Ion Beam ◽  
Heavy Ion ◽  
High Energy ◽  
X Ray Diffraction ◽  
Force Microscopy ◽  
Atomic Force ◽  
Transmission Electron ◽  
Non Equilibrium

Ion beam irradiation is a unique non-equilibrium technique for phase formation and material modification. Localized rise in temperature and ultra fast (~1012 s) dissipations of impinging energy make it an attractive tool for nanostructure synthesize. Dense electronic excitation induced spatial and temporal confinement of high energy in a narrow dimension leads the system to a highly non-equilibrium state and the system then relaxes dynamically inducing nucleation of nanocrystals along the latent track. In the present investigation, amorphous thin films of TiO2 are irradiated by 100 MeV Ag ion beam. These irradiated thin films are characterized by Atomic Force Microscopy (AFM), Glancing Angle X-ray Diffraction (GAXRD), Transmission Electron Microscopy (TEM) and UV-VIS absorption spectroscopy. AFM and TEM studies indicate formation of circular nanoparticles of size 10±2 nm in a film irradiated at a fluence of 1×1012 ions.cm-2. Nanophase formation is also inferred from the blueshift observed in UV-VIS absorption band edge.

Ionizing radiation-induced fragmentation of plasmid DNA – Atomic force microscopy and biophysical modeling

2007 ◽  
Vol 39 (6) ◽  
pp. 1043-1049 ◽  
Author(s):  
K. Psonka ◽  
E. Gudowska-Nowak ◽  
S. Brons ◽  
Th. Elsässer ◽  
M. Heiss ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Ionizing Radiation ◽  
Plasmid Dna ◽  
Biophysical Modeling ◽  
Force Microscopy ◽  
Atomic Force ◽  
Radiation Induced

SWIFT HEAVY ION INDUCED NANOHILL FORMATION ON THE SURFACE OF GaP

2011 ◽  
Vol 10 (01n02) ◽  
pp. 105-109 ◽  
Author(s):  
R. L. DUBEY ◽  
S. K. DUBEY ◽  
A. D. YADAV ◽  
D. KANJILAL
Keyword(s):  
Atomic Force Microscopy ◽  
Crystallite Size ◽  
Gallium Phosphide ◽  
Phonon Mode ◽  
Heavy Ion ◽  
X Ray Diffraction ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Swift Heavy Ion

Gallium phosphide ( GaP ) samples were irradiated with swift (100 MeV)56 Fe 9+ ions for various ion fluences varying from 1 × 1011 to 1 × 1014 cm -2. Atomic force microscopy, Raman scattering, and X-ray diffraction techniques have been used to investigate the irradiation effect. Atomic force microscopy studies showed the presence of nanosized hills separated with valleys at the surface of irradiated gallium phosphide. The average diameters of hills were found to be 19.76, 19.81, 20.70, and 22.64 nm for ion fluences 5 × 1012, 1 × 1013, 5 × 1013, and 1 × 1014 cm -2, respectively. Root mean square surface roughness analysis has been used to characterize the nature of the surface under swift heavy ion irradiation. The features observed in the Raman spectra at 402.18 cm-1 and 365.05 cm-1 were assigned to the characteristic first-order longitudinal optical (LO) phonon mode and transverse optical (TO) phonon mode of gallium phosphide, respectively. We have also observed the second-order overtones and combinations of optical modes giving rise to three characteristic peaks in the region between 700 and 800 cm-1. X-ray diffraction technique has been used to determine the crystallite size. The crystallite size was found to decrease with increase in ion fluence.

Folding Graphene with Swift Heavy Ions

2011 ◽  
Vol 1354 ◽  
Author(s):  
Sevilay Akcöltekin ◽  
Hanna Bukowska ◽  
Ender Akcöltekin ◽  
Henning Lebius ◽  
Marika Schleberger
Keyword(s):  
Raman Spectroscopy ◽  
Atomic Force Microscopy ◽  
Kinetic Energy ◽  
Heavy Ions ◽  
Standard Technique ◽  
Heavy Ion ◽  
Force Microscopy ◽  
Swift Heavy Ions ◽  
Atomic Force ◽  
Swift Heavy Ion

ABSTRACTSwift heavy ion induced modifications on graphene were investigated by means of atomic force microscopy and Raman spectroscopy. For the experiment graphene was exfoliated onto different substrates (SrTiO3 (100), TiO2(100), Al2O3(1102) and 90 nm SiO2/Si) by the standard technique. After irradiation with heavy ions of 93 MeV kinetic energy and under glancing angles of incidence, characteristic folding structures are observed. The folding patterns on crystalline substrates are generally larger and are created with a higher efficiency than on the amorphous SiO2. This difference is attributed to the relatively large distance between graphene and SiO2 of d ≈ 1 nm.

The heavy ion tracks in polymers investigation by means of high-effective liquid chromatography and atomic-force microscopy

2001 ◽  
Vol 34 (1-6) ◽  
pp. 75-80 ◽  
Author(s):  
A.I Vilensky ◽  
O.G Larionov ◽  
R.V Gainutdinov ◽  
A.L Tolstikhina ◽  
V.Ya Kabanov ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Liquid Chromatography ◽  
Heavy Ion ◽  
Force Microscopy ◽  
Ion Tracks ◽  
Atomic Force

Direct visualisation of heavy ion induced DNA fragmentation using Atomic Force Microscopy

2004 ◽  
Vol 73 ◽  
pp. S112-S114 ◽  
Author(s):  
Stephan Brons ◽  
Katarzyna Psonka ◽  
Markus Heiß ◽  
Ewa Gudowska-Nowak ◽  
Gisela Taucher-Scholz ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Dna Fragmentation ◽  
Heavy Ion ◽  
Force Microscopy ◽  
Atomic Force

Study of the Effects of Heavy-Ion Radiation on Nanocomposite Carbon Films

2003 ◽  
Vol 777 ◽  
Author(s):  
Kathleen E. Kristian ◽  
Nadia M. Medina-Emmanuelli ◽  
Oscar O. Ortiz ◽  
Adolfo González ◽  
Juan A. González ◽  
...  
Keyword(s):  
Ion Irradiation ◽  
Chemical Vapor ◽  
Heavy Ion ◽  
Carbon Films ◽  
Information Storage ◽  
Force Microscopy ◽  
Atomic Force ◽  
Composite Nature ◽  
Hot Filament ◽  
Carbon Bonding

AbstractThe compositional and microstructural transformations induced by heavy ions (GeV/amu Fe and Si ions) on nanocomposite carbon (n-C) films were investigated by Raman Spectroscopy (RS), Atomic Force Microscopy (AFM), and X-ray Photoelectron Spectrscopy (XPS). Two identical sets of n-C films were prepared in a sulfur-assisted hot filament chemical vapor deposition (HFCVD) system using methane, hydrogen and hydrogen sulfide. Films with various sp3 C and sp2 C bonding distributions were present within each set, which were obtained by varying the substrate temperature (400-600 °C). One set of films was submitted to a 20 krad dose of energetic Si and Fe ions at the NASA space radiation simulation facility hosted in Brookhaven National Laboratory's Alternating Gradient Synchrotron (AGS). All the films showed the characteristic diamond (tetragonal sp3 C) band at around 1332 cm-1 and the graphitic (trigonal sp2 C) D and G bands at around 1350 and 1590 cm-1, respectively, evidencing their composite nature. The results indicate that sp2 C ←sp3 C interconversions take place in the nanocomposite carbon material during heavy ion irradiation. A mechanism is proposed to explain this behavior. The overall results imply that there could be a range of sp3/sp2 C ratios for which carbon bonding interconversion takes place under ion radiation without significant changes to the average composition of the material. Nanocomposite carbon materials with this characteristic would be radiation insensitive. A technique could be developed based on this carbon bonding interconversion property by using focused energetic beams onto carbon films to produce a robust information storage technology that would survive catastrophic events.

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