New Generation Characteristic: Teachers and Students Approach

2016 ◽  
Vol 43 (2) ◽  
pp. 58-64
Author(s):  
Renata Sankauskienė
Keyword(s):  
Generation Characteristic ◽  
Teachers And Students ◽  
New Generation

scholarly journals Teaching and Learning with Mobile Devices in the 21st Century Digital World: Benefits and Challenges

2017 ◽  
Vol 5 (1) ◽  
pp. 339 ◽  
Author(s):  
Lina Dias ◽  
Angelin Victor
Keyword(s):  
Mobile Devices ◽  
21St Century ◽  
Teaching And Learning ◽  
The Other ◽  
Educational Tools ◽  
Learning And Teaching ◽  
Digital World ◽  
Teachers And Students ◽  
Training And Support ◽  
New Generation

Mobile devices have introduced a new generation of educational tools that afford creative use and instant access to a wealth of resources. These devices hold great potential for transforming learning. On one hand teachers and students are very positive about these devices, on the other hand, there are several obstacles faced. This paper examines the benefits and challenges of mobile devices on learning and teaching. The study shows that teachers and students are optimistic about the use and influence of these devices on students’ motivation, communication, collaboration and ability to research. Adequate training and support can help overcome the challenges faced.

scholarly journals Determination of Student Opinions on Usage of Social Media and Mobile Tools in Student-Teacher, Student-Student Communication

2019 ◽  
Vol 14 (22) ◽  
pp. 19
Author(s):  
Hasan Denizalp ◽  
Fezile Ozdamli
Keyword(s):  
Social Media ◽  
Student Teacher ◽  
Mobile Applications ◽  
Communication Technologies ◽  
Student Opinions ◽  
Teacher Student ◽  
Technological Advances ◽  
Teachers And Students ◽  
New Generation ◽  
The Impact

Since Depending on technological advances, development of social media and mobile applications today reshape communication, education and teaching system. The extent to which social media and mobile applications which are especially used by new generation youth frequently will be beneficial in student-teacher and student-student communication is becoming more and more important. This research is based on the opinions of students on the usage of social media and mobile applications in education which take considerable time of teachers and students, social networks and mobile applications were used with the purpose of communication in science and communication technologies for 12 weeks. Thirty-five teacher candidates attended the study. At the end of the application interviews were held with 20 students and according to the findings obtained, an effort was paid to determine the impact of social media and mobile applications in student-teacher and student-student communication. Discussions and recommendations on obtained findings were presented.

scholarly journals Pierre Bourdieu and his concept of Symbolic Violence: what´s happening into Colombian Classrooms?

2017 ◽  
Vol 10 (1) ◽  
pp. 55-67
Author(s):  
Jesús Antonio Quiñones
Keyword(s):  
Teaching Practice ◽  
Pierre Bourdieu ◽  
Power Relationships ◽  
Discussion Paper ◽  
Interesting Insight ◽  
Teachers And Students ◽  
The Government ◽  
Political Economic ◽  
New Generation ◽  
Interesting Reading

This discussion paper arises from the academic proposal made for elective seminar of the Doctorate in Education from Universidad Santo Tomás in Bogotá Colombia ‘la violencia simbólica en la obra de Pierre Bourdieu y el acto pedagógico’. In a very particular scenario being presented in the Colombian nation in recent months in which the political, economic and cultural academic country seeks ways out of decades of war between the government and armed opposition groups, it is necessary that this topic enters into the classroom and reflect about these very pointed and particular tensions that every day are fought at schools, colleges or universities. In this sense, one of them has to do with power relationships between teachers and students, the study of its genesis, its development and evolution are essential for understanding today's school as the setting in which they are educating the new generation of Colombians who, apparently, will be the first to live in a country at peace. It is assumed therefore that the author’s ideas on Bourdieu’s theory stem from the author’s experience of working in Colombia as a teacher in several schools and universities. After years of pedagogical experiences, this would make an interesting insight, through the lens of Bourdieu, into the dominant educational pedagogical approach in a country which is perceived to be unstable by other nations. A position paper on how students may be discriminated against or oppressed because of the power struggles or tensions within the classroom and what Bourdieu might call cultural arbitraries, would make interesting reading. For this  analysis, it is assumed that the theory of Pierre Bourdieu can be helpful to understand this phenomenon, since it allows to address the issue from the theoretical but also leaves the possibility of understanding the phenomenon from teaching practice and the school.

Finding the Right Problems: Some HREM Applications to Interfaces

1984 ◽  
Vol 42 ◽  
pp. 376-379
Author(s):  
D. Cherns
Keyword(s):  
Grain Boundaries ◽  
High Resolution Electron Microscopy ◽  
Boundary Structure ◽  
Atomic Structures ◽  
Grain Boundary Structure ◽  
Resolution Electron ◽  
Point To Point ◽  
The Right ◽  
New Generation ◽  
Better Than

The use of high resolution electron microscopy (HREM) to determine the atomic structure of grain boundaries and interfaces is a topic of great current interest. Grain boundary structure has been considered for many years as central to an understanding of the mechanical and transport properties of materials. Some more recent attention has focussed on the atomic structures of metalsemiconductor interfaces which are believed to control electrical properties of contacts. The atomic structures of interfaces in semiconductor or metal multilayers is an area of growing interest for understanding the unusual electrical or mechanical properties which these new materials possess. However, although the point-to-point resolutions of currently available HREMs, ∼2-3Å, appear sufficient to solve many of these problems, few atomic models of grain boundaries and interfaces have been derived. Moreover, with a new generation of 300-400kV instruments promising resolutions in the 1.6-2.0 Å range, and resolutions better than 1.5Å expected from specialist instruments, it is an appropriate time to consider the usefulness of HREM for interface studies.

Total etch dentin bonding systems: scanning electron microscopy of the resin-dentin hybrid layer

1992 ◽  
Vol 50 (2) ◽  
pp. 1092-1093
Author(s):  
Jorge Perdigao
Keyword(s):  
Composite Resin ◽  
Mechanical Interlocking ◽  
Hybrid Layer ◽  
Agent Based ◽  
Dentin Bonding ◽  
Acid Agent ◽  
Bond Strengths ◽  
Main Component ◽  
Bonding Systems ◽  
New Generation

In 1955, Buonocore introduced the etching of enamel with phosphoric acid. Bonding to enamel was created by mechanical interlocking of resin tags with enamel prisms. Enamel is an inert tissue whose main component is hydroxyapatite (98% by weight). Conversely, dentin is a wet living tissue crossed by tubules containing cellular extensions of the dental pulp. Dentin consists of 18% of organic material, primarily collagen. Several generations of dentin bonding systems (DBS) have been studied in the last 20 years. The dentin bond strengths associated with these DBS have been constantly lower than the enamel bond strengths. Recently, a new generation of DBS has been described. They are applied in three steps: an acid agent on enamel and dentin (total etch technique), two mixed primers and a bonding agent based on a methacrylate resin. They are supposed to bond composite resin to wet dentin through dentin organic component, forming a peculiar blended structure that is part tooth and part resin: the hybrid layer.

Low-voltage, high-resolution scanning electron microscopy of polymers

1987 ◽  
Vol 45 ◽  
pp. 466-467 ◽  
Author(s):  
S. J. Krause ◽  
W.W. Adams ◽  
S. Kumar ◽  
T. Reilly ◽  
T. Suziki
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Low Voltage ◽  
Chromatic Aberration ◽  
Image Resolution ◽  
Resolution Limit ◽  
Crossover Point ◽  
New Generation ◽  
Beam Damage ◽  
Scanning Electron

Scanning electron microscopy (SEM) of polymers at routine operating voltages of 15 to 25 keV can lead to beam damage and sample image distortion due to charging. Imaging polymer samples with low accelerating voltages (0.1 to 2.0 keV), at or near the “crossover point”, can reduce beam damage, eliminate charging, and improve contrast of surface detail. However, at low voltage, beam brightness is reduced and image resolution is degraded due to chromatic aberration. A new generation of instruments has improved brightness at low voltages, but a typical SEM with a tungsten hairpin filament will have a resolution limit of about 100nm at 1keV. Recently, a new field emission gun (FEG) SEM, the Hitachi S900, was introduced with a reported resolution of 0.8nm at 30keV and 5nm at 1keV. In this research we are reporting the results of imaging coated and uncoated polymer samples at accelerating voltages between 1keV and 30keV in a tungsten hairpin SEM and in the Hitachi S900 FEG SEM.

3-Dimensional immunolabeling and in situ hybridization detection using fluorescence photooxidation and intermediate-voltage Electron Microscopy

1994 ◽  
Vol 52 ◽  
pp. 164-165
Author(s):  
Thomas J. Deerinck ◽  
Maryann E. Martone ◽  
Varda Lev-Ram ◽  
David P. L. Green ◽  
Roger Y. Tsien ◽  
...  
Keyword(s):  
Laser Scanning ◽  
Reactive Oxygen ◽  
Confocal Laser Scanning Microscope ◽  
Fluorescent Dye ◽  
Confocal Laser ◽  
3 Dimensional ◽  
Voltage Electron ◽  
Dimensional Distribution ◽  
Electron Microscopes ◽  
New Generation

The confocal laser scanning microscope has become a powerful tool in the study of the 3-dimensional distribution of proteins and specific nucleic acid sequences in cells and tissues. This is also proving to be true for a new generation of high contrast intermediate voltage electron microscopes (IVEM). Until recently, the number of labeling techniques that could be employed to allow examination of the same sample with both confocal and IVEM was rather limited. One method that can be used to take full advantage of these two technologies is fluorescence photooxidation. Specimens are labeled by a fluorescent dye and viewed with confocal microscopy followed by fluorescence photooxidation of diaminobenzidine (DAB). In this technique, a fluorescent dye is used to photooxidize DAB into an osmiophilic reaction product that can be subsequently visualized with the electron microscope. The precise reaction mechanism by which the photooxidation occurs is not known but evidence suggests that the radiationless transfer of energy from the excited-state dye molecule undergoing the phenomenon of intersystem crossing leads to the formation of reactive oxygen species such as singlet oxygen. It is this reactive oxygen that is likely crucial in the photooxidation of DAB.

Recent developments in low-voltage SEM of polymers

1993 ◽  
Vol 51 ◽  
pp. 866-867
Author(s):  
S.J. Krause ◽  
W.W. Adams
Keyword(s):  
Low Voltage ◽  
Chromatic Aberration ◽  
Thermal Electron ◽  
Analytical Technique ◽  
Recent Developments ◽  
Beam Currents ◽  
New Generation ◽  
First Time ◽  
Voltage Scanning ◽  
Beam Damage

Over the past decade low voltage scanning electron microscopy (LVSEM) of polymers has evolved from an interesting curiosity to a powerful analytical technique. This development has been driven by improved instrumentation and in particular, reliable field emission gun (FEG) SEMs. The usefulness of LVSEM has also grown because of an improved theoretical and experimental understanding of sample-beam interactions and by advances in sample preparation and operating techniques. This paper will review progress in polymer LVSEM and present recent results and developments in the field.In the early 1980s a new generation of SEMs produced beam currents that were sufficient to allow imaging at low voltages from 5keV to 0.5 keV. Thus, for the first time, it became possible to routinely image uncoated polymers at voltages below their negative charging threshold, the "second crossover", E2 (Fig. 1). LVSEM also improved contrast and reduced beam damage in sputter metal coated polymers. Unfortunately, resolution was limited to a few tenths of a micron due to the low brightness and chromatic aberration of thermal electron emission sources.

The Contribution of Intermediate-Voltage, High-Resolution Electron Microscopy In Materials Science: An Appraisal

1990 ◽  
Vol 48 (1) ◽  
pp. 478-479
Author(s):  
John L. Hutchison
Keyword(s):  
High Resolution ◽  
Materials Science ◽  
High Resolution Electron Microscopy ◽  
Optical Diffraction ◽  
The Past ◽  
Resolution Electron ◽  
Extreme Sensitivity ◽  
Electron Microscopes ◽  
New Generation ◽  
Small Metal Particles

Over the past five years or so the development of a new generation of high resolution electron microscopes operating routinely in the 300-400 kilovolt range has produced a dramatic increase in resolution, to around 1.6 Å for “structure resolution” and approaching 1.2 Å for information limits. With a large number of such instruments now in operation it is timely to assess their impact in the various areas of materials science where they are now being used. Are they falling short of the early expectations? Generally, the manufacturers’ claims regarding resolution are being met, but one unexpected factor which has emerged is the extreme sensitivity of these instruments to both floor-borne and acoustic vibrations. Successful measures to counteract these disturbances may require the use of special anti-vibration blocks, or even simple oil-filled dampers together with springs, with heavy curtaining around the microscope room to reduce noise levels. In assessing performance levels, optical diffraction analysis is becoming the accepted method, with rotational averaging useful for obtaining a good measure of information limits. It is worth noting here that microscope alignment becomes very critical for the highest resolution.In attempting an appraisal of the contributions of intermediate voltage HREMs to materials science we will outline a few of the areas where they are most widely used. These include semiconductors, oxides, and small metal particles, in addition to metals and minerals.

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