scholarly journals A computer program to process data from a direct current plasma emission spectrometer

1981 ◽  
Author(s):  
Donald C. Bankston
Keyword(s):  
Computer Program ◽  
Direct Current ◽  
Plasma Emission ◽  
Process Data ◽  
Direct Current Plasma

A Spatial Study of the Influence of Plasma Length on Interference Effects in a Six-Electrode, Direct-Current, Variable-Length Plasma

1988 ◽  
Vol 42 (4) ◽  
pp. 693-698 ◽  
Author(s):  
James P. Shields ◽  
Edward H. Piepmeier
Keyword(s):  
Direct Current ◽  
Variable Length ◽  
Emission Source ◽  
Plasma Emission ◽  
Careful Selection ◽  
Interference Effects ◽  
Simple Effect ◽  
Direct Current Plasma ◽  
Interference Mechanism ◽  
Selection Of

Vertical spatial profiles of a six-electrode, direct-current plasma emission source were used to study the influence of plasma length on the interference of Na on Ca and Zn and P on Ca. For the shortest plasma (11.5 mm), depression of the Ca atom line is observed in the region up to 10 mm above the tip of the sample bullet when Na is present. A cross-over to enhancement occurs for higher regions. This is directly opposite to the observations in the ICP for the Na interference on Ca. Increasing the plasma length causes downward shifts in the cross-over point which are not a simple effect of the lowering of the sample bullet. When P is present, the Ca atom emission is initially depressed in the region directly above the sample bullet. At higher observation heights, little effect is observed. Similar behavior is observed for the Ca ion line in the presence of P, suggesting the possibility of a classical vaporization-type interference mechanism. The interference effects studied here can be virtually eliminated by careful selection of plasma length and observation height.

Silicon measurement in serum and urine by direct current plasma emission spectrometry

1990 ◽  
Vol 36 (8) ◽  
pp. 1460-1465 ◽  
Author(s):  
N B Roberts ◽  
P Williams
Keyword(s):  
Renal Failure ◽  
Chronic Renal Failure ◽  
Direct Current ◽  
Aluminum Toxicity ◽  
Renal Stones ◽  
Emission Spectrometry ◽  
Plasma Emission ◽  
Direct Current Plasma ◽  
Plasma Emission Spectrometry ◽  
Serum And Urine

Abstract Elemental silicon, present as soluble silicic acid in serum and urine, has been measured by direct current plasma emission spectrometry. The method is precise and accurate, yields a standard curve that is linear up to 1000 mumol/L, and requires only a simple dilution in 10 mL/L HNO3. No spectral or background interferences have been observed from serum or urine; the absolute detection limit for silicon was 0.5 mumol/L. Silicon concentrations in serum increase by up to 20-fold in patients with chronic renal failure on hemodialysis, an increase apparently related to dietary silicon intake. No relationship with aluminum was observed in hemodialysis patients, with or without aluminum toxicity. In the undialyzed patient with chronic renal failure, the concentrations of silicon in plasma increased with decreasing glomerular filtration rate. This increase may protect renal-failure patients from possible aluminum toxicity by promoting formation of the relatively inactive aluminosilicate complex. Silicon concentrations in urine of healthy individuals exceed their serum concentrations by 20- to 100-fold. Silicon excretion in patients with renal stones was not different from that in healthy controls and showed no relationship with calcium and (or) oxalate excretion.

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