Electronic Transport Properties of Hg1-xFexSe
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AbstractThe electrical resistivity, electron concentration, and mobility of Hg1-xFexSe are reported for 4.2K < T < 300K and for 0.0001 < x < 0.12. The data are interpreted within an electronic band structure model that assumes the existence of resonant donors (due to the presence of Fe ions) whose ground state energy coincides with the conduction band continuum. The electron concentration data enable determination of the value of the donor energy as a function of the temperature and the crystal composition. The low temperature electron mobility for ∼ 0.0003 ≤ x ≤ 0.01 is considerably higher than expected and indicates a reduction of the charged impurity scattering effects at low temperatures.
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1966 ◽
Vol 294
(1438)
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pp. 376-392
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2015 ◽
Vol 2015
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pp. 1-7
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1981 ◽
Vol 40
(5)
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pp. 529-533
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1982 ◽
Vol 13
(1-2)
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pp. 125-135
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2000 ◽
Vol 162-163
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pp. 78-85
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1981 ◽
Vol 39
(2)
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pp. 285-287
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