The Effect of Laser Heating on Optical Properties of Germania Doped Silica Optical Waveguides

1986 ◽  
Vol 88 ◽  
Author(s):  
E. M. Starr ◽  
N. Nourshargh ◽  
J. S. McCormack
Keyword(s):  
Refractive Index ◽  
Optical Properties ◽  
Laser Heating ◽  
Optical Waveguides ◽  
Xps Analysis ◽  
Direct Writing ◽  
Silica Films ◽  
Index Change ◽  
Uv Absorption Spectroscopy ◽  
Integrated Optical

ABSTRACTWe report the use of CO2 laser heating for inducing an increase in the refractive index of germania doped silica films. UV absorption spectroscopy and XPS analysis have confirmed that the index change is a result of GeO2 being reduced to GeO. The technique has been successfully used for the direct writing of integrated optical strip waveguides.

Refractive Index Profiles of High Dose Ti Implanted Optical Waveguides in LiNbO3

1989 ◽  
Vol 157 ◽  
Author(s):  
T. Bremer ◽  
P.R. Ashley ◽  
R. Irmscher ◽  
Ch. Buchal
Keyword(s):  
Refractive Index ◽  
Optical Waveguides ◽  
Refractive Index Change ◽  
Solubility Limit ◽  
High Dose ◽  
Sufficient Time ◽  
Index Change ◽  
Single Crystalline ◽  
Subsequent Processing ◽  
Extraordinary Refractive Index

ABSTRACTSingle crystalline substrates of LiNb03 have been implanted with 48Ti ions at 200 keV and doses up to 4 × 1017 cm−2. The implants have been performed at wafer temperatures of 77 K, 300 K and 620 K. Immediate subsequent processing at 1273 K in wet oxygen ambient led to good epitaxial regrowth at all doses, if sufficient time was allowed. The maximum observed extraordinary refractive index change after regrowth Δne=0.04, indicating a solubility limit of 3.3×l021 Ti cm−3 corresponding to 18 % of Nb5+ replaced by Ti4+.

FABRICATION OF MACH-ZEHNDER INTERFEROMETOR BASED ON PLANAR WAVEGUIDE FOR THE APPLICATION OF BIOSENSORS

2009 ◽  
Vol 23 (06n07) ◽  
pp. 1891-1896 ◽  
Author(s):  
JUN-HYONG KIM ◽  
HOE-YOUNG YANG ◽  
HYUN-YONG LEE
Keyword(s):  
Refractive Index ◽  
Optical Waveguides ◽  
Planar Waveguide ◽  
Refractive Index Change ◽  
Optical Power ◽  
Input Power ◽  
Design Rule ◽  
Integrated Optical ◽  
The Difference ◽  
Planar Lightwave

In this paper, designed and simulated Power Splitter (PS) integrated Mach-Zehnder interferometer (MZI) based planar waveguide devices (which is called here a PS-MZI). Moreover, we fabricated optical waveguide based on the PS-MZI for application to the biosensor. The integrated optical structure is sensitive to refractive index change induced due to the interaction of the evanescent field with an immobilized biological sample placed on one of the two arms of the interferometer. The PS-MZI sensor was preceded by a Y -junction, which splits the input power between the sensor and a reference branch to minimize the effect of optical power variations. The waveguide were optimized at a wavelength of 1550 nm and fabricated according to the design rule of 0.45 delta%, which is the difference of refractive index between the core and clad. The fabrication of PS-MZI optical waveguides was performed by a conventional planar lightwave circuit (PLC) fabrication process. The PS-MZI optical waveguides were measured of the optical characteristics for the application of biosensors.

Optical Properties of Silica Films Prepared on Sapphire

2005 ◽  
Vol 475-479 ◽  
pp. 3709-3712 ◽  
Author(s):  
Li Ping Feng ◽  
Zheng Tang Liu
Keyword(s):  
Refractive Index ◽  
Optical Properties ◽  
Photoelectron Spectroscopy ◽  
Gas Flow ◽  
Silica Films ◽  
Sio2 Films ◽  
X Ray ◽  
Gas Flow Ratio ◽  
Optical And Mechanical Properties ◽  
Deposited Films

As a coating material with excellent optical and mechanical properties, silica films can be used as anti-reflective and protective layers on the windows and domes of sapphire. In this paper, the designed films of SiO2 have been prepared on sapphire wafers and hemisphere dome of sapphire by radio frequency magnetron reactive sputtering. Compositions and structure of SiO2 films were analyzed by X-ray photoelectron spectroscopy (XPS) and X-ray diffraction (XRD). The refractive index of deposited films was measured and effects of the coatings on optical properties of sapphire have been studied. The results express that the refractive index of the films can be varied between 3.4 and 1.4 by changing the gas flow ratio. The deposited films can increase the transmission of sapphire in mid-wave IR greatly. The average transmittance of sapphire wafers coated with SiO2 films on both sides can be increased to 96.43 % in 3～5 µm.

Sign in / Sign up

Export Citation Format

Share Document