Advances in AlGaN-based Deep UV LEDs

2004 ◽  
Vol 831 ◽  
Author(s):  
M. H. Crawford ◽  
A. A. Allerman ◽  
A. J. Fischer ◽  
K. H. A. Bogart ◽  
S. R. Lee ◽  
...  

ABSTRACTMaterials studies of high Al-content (> 30%) AlGaN epilayers and the performance of AlGaN-based LEDs with emission wavelengths shorter than 300 nm are reported. N-type AlGaN films with Al compositions greater than 30% reveal a reduction in conductivity with increasing Al composition. The reduction of threading dislocation density from the 1–5 × 1010 cm-2 range to the 6–9 × 109cm-2 range results in an improvement of electrical conductivity and Al0.90Ga0.10N films with n= 1.6e17 cm-3 and μ=20 cm2/Vs have been achieved. The design, fabrication and packaging of flip-chip bonded deep UV LEDs is described. Large area (1 mm × 1 mm) LED structures with interdigitated contacts demonstrate output powers of 2.25 mW at 297 nm and 1.3 mW at 276 nm when operated under DC current. 300 μm × 300 μm LEDs emitting at 295 nm and operated at 20 mA DC have demonstrated less than 50% drop in output power after more than 2400 hours of operation. Optimization of the electron block layer in 274 nm LED structures has enabled a significant reduction in deep level emission bands, and a peak quantum well to deep level ratio of 700:1 has been achieved for 300 μm × 300 μm LEDs operated at 100 mA DC. Shorter wavelength LED designs are described, and LEDs emitting at 260 nm, 254nm and 237 nm are reported.

2004 ◽  
Vol 201 (12) ◽  
pp. 2803-2807 ◽  
Author(s):  
Toshiyuki Obata ◽  
Hideki Hirayama ◽  
Yoshinobu Aoyagi ◽  
Koji Ishibashi

2009 ◽  
Vol 6 (S2) ◽  
pp. S356-S359 ◽  
Author(s):  
Hideki Hirayama ◽  
Sachie Fujikawa ◽  
Jun Norimatsu ◽  
Takayoshi Takano ◽  
Kenji Tsubaki ◽  
...  

AIP Advances ◽  
2013 ◽  
Vol 3 (5) ◽  
pp. 052103 ◽  
Author(s):  
Weihuang Yang ◽  
Jinchai Li ◽  
Wei Lin ◽  
Shuping Li ◽  
Hangyang Chen ◽  
...  

RSC Advances ◽  
2017 ◽  
Vol 7 (87) ◽  
pp. 55157-55162 ◽  
Author(s):  
Jinjian Zheng ◽  
Jinchai Li ◽  
Zhibai Zhong ◽  
Wei Lin ◽  
Li Chen ◽  
...  

The light extraction from AlGaN deep ultraviolet light-emitting diodes (UV LEDs) is known to be limited by the fundamental valence band crossover issue.


2006 ◽  
Vol 955 ◽  
Author(s):  
Serguei A Chevtchenko ◽  
J. Xie ◽  
Y. Fu ◽  
X. Ni ◽  
H. Morkoç

ABSTRACTThe dependence of traps and their concentration in GaN on the quality of templates, on which the layers are grown, has been studied by deep-level transient spectroscopy (DLTS). Thin GaN layers studied were grown on GaN templates employing conventional epitaxial lateral overgrowth (ELO) and nano-ELO with SiNx nanonetwork. The concentrations of traps found in these layers were compared with a reference sample grown on a standard GaN template not utilizing ELO. Two traps A (0.55 eV – 0.58 eV) and B (0.20 eV – 0.23 eV) were detected in the temperature range from 80 K to 400 K. A reduction of traps in layers grown on the ELO and nano-ELO templates was noted. We attribute this reduction to the reduction of threading dislocation density and as a result reduced capture of point defects and complexes as part of dislocation core structure and/or reduced formation of defects and complexes in the vicinity of line defects where the formation can be energetically favorable.


2011 ◽  
Vol 679-680 ◽  
pp. 694-697 ◽  
Author(s):  
Fujiwara Hirokazu ◽  
Masaki Konishi ◽  
T. Ohnishi ◽  
T. Nakamura ◽  
Kimimori Hamada ◽  
...  

The impacts of threading dislocations, surface defects, donor concentration, and schottky Schottky barrier height on the reverse IV characteristic of silicon carbide (SiC) junction barrier schottky Schottky (JBS) diodes were investigated. The 100 A JBS diodes were fabricated on 4H-SiC 3-inch N-type wafers with two types of threading dislocation density. The typical densities are were 0.2×104 and 3.8×104 cm-2, respectively. The improvement of vIt was found that variations in the leakage current and the high yield of large area JBS diodes werecould be were obtained improved by using a wafer with a low threading dislocation density. In the range of low leakage current, the investigation shows showed a correlation between leakage current and threading dislocation density.


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