X-Ray Diffuse Scattering from Cobalt Precipitates in Copper

1986 ◽  
Vol 82 ◽  
Author(s):  
B. C. Larson ◽  
S. Iida ◽  
J. Z. Tischler ◽  
J. D. Lewis ◽  
G. E. Ice ◽  
...  
Keyword(s):  
Crystal Lattice ◽  
Size Distribution ◽  
Diffuse Scattering ◽  
Large Angle ◽  
Host Lattice ◽  
Internal Strain ◽  
X Rays ◽  
X Ray ◽  
Scattering Measurements

ABSTRACTLarge-angle diffuse scattering has been investigated for the purpose of studying coherent precipitates in a crystal lattice. Detailed calculations have been made of the scattering near Bragg reflections from cobalt precipitates in a copper host lattice. These calculations have been compared to x-ray diffuse scattering measurements made on aged (570°C for 17 hr.) Cu-0.95%Co crystals with x-rays of three different wavelengths at the NSLS. The results indicate that the size distribution, the concentration, and the internal strain of the precipitates can be determined from such diffuse scattering measurements.

scholarly journals Interface Evolution in a W/Si Multilayer after Rapid Thermal Annealing Studied by X-ray Reflectivity and Diffuse Scattering

1997 ◽  
Vol 30 (5) ◽  
pp. 642-646 ◽  
Author(s):  
M. Jergel ◽  
V. Holý ◽  
E. Majková ◽  
S. Luby ◽  
R. Senderák
Keyword(s):  
Thermal Annealing ◽  
Rapid Thermal Annealing ◽  
Diffuse Scattering ◽  
Grazing Incidence ◽  
Interface Roughness ◽  
X Rays ◽  
Interface Evolution ◽  
X Ray ◽  
Scattering Measurements ◽  
Highly Correlated

An interface study of the effect of rapid thermal annealing (RTA) in the temperature range 523–1273 K for 5–40 s on a nominally [(50 Å Si/10 Å W) × 9] amorphous multilayer (ML) deposited on an Si(100) wafer was performed by X-ray reflectivity and diffuse-scattering measurements at grazing incidence. The results of the X-ray reflectivity and diffuse-scattering measurements were evaluated by Fresnel optical computational code and within the distorted-wave Born approximation, respectively. Up to the 773 K/5 s annealing step, the r.m.s. interface roughness decreases by 30%, which brings about a reflectivity increase of 20% on the first Bragg maximum. There is a small overall increase of the r.m.s. interface roughness across the ML in the as-deposited state and the interface profiles are highly correlated. From the very beginning of RTA, the fractal interface behaviour is gradually lost and the lateral correlation length increases, this process being accompanied by a decrease of the interface conformality. This tendency continues during the 773 K/20 s annealing; however, the r.m.s. roughness evolution is reversed. During the 1023 K/5 s annealing, the interfaces are no longer `seen' by the X-rays and, during the 1273 K/5 s annealing, a total collapse of the ML structure takes place.

Structural dynamics of PZT thin films at the nanoscale

2005 ◽  
Vol 902 ◽  
Author(s):  
Alexei Grigoriev ◽  
Dal-Hyun Do ◽  
Dong Min Kim ◽  
Chang-Beom Eom ◽  
Bernhard Adams ◽  
...  
Keyword(s):  
Crystal Lattice ◽  
Lattice Distortion ◽  
Piezoelectric Effect ◽  
Polarization Switching ◽  
X Rays ◽  
Time Resolved ◽  
X Ray ◽  
Converse Piezoelectric Effect ◽  
Ferroelectric Capacitors ◽  
Crystal Lattice Distortion

AbstractWhen an electric field is applied to a ferroelectric the crystal lattice spacing changes as a result of the converse piezoelectric effect. Although the piezoelectric effect and polarization switching have been investigated for decades there has been no direct nanosecond-scale visualization of these phenomena in solid crystalline ferroelectrics. Synchrotron x-rays allow the polarization switching and the crystal lattice distortion to be visualized in space and time on scales of hundreds of nanometers and hundreds of picoseconds using ultrafast x-ray microdiffraction. Here we report the polarization switching visualization and polarization domain wall velocities for Pb(Zr0.45Ti0.55)O3 thin film ferroelectric capacitors studied by time-resolved x-ray microdiffraction.

scholarly journals X-ray and Neutron Diffuse Scattering Measurements

2012 ◽  
Author(s):  
Gene E. Ice ◽  
James L. Robertson ◽  
Cullie J. Sparks
Keyword(s):  
Diffuse Scattering ◽  
X Ray ◽  
Scattering Measurements

Diffuse scattering and phason modes in the i-AlPdMn quasicrystalline phase

2005 ◽  
Vol 220 (12) ◽  
Author(s):  
Marc de Boissieu ◽  
Sonia Francoual
Keyword(s):  
Elastic Constant ◽  
Elastic Constants ◽  
Intensity Distribution ◽  
Diffuse Scattering ◽  
Hydrodynamic Theory ◽  
Quasicrystalline Phase ◽  
X Rays ◽  
X Ray ◽  
Long Wavelength ◽  
Diffusive Modes

AbstractWe review results obtained in the study of the diffuse scattering in the i-AlPdMn quasicrystal. Most of the diffuse scattering is the result of long wavelength phason modes. The shape and intensity distribution of the diffuse scattering is well reproduced using the generalised elasticity theory and two phason elastic constants. The temperature dependence of the diffuse scattering indicates a softening of the phason elastic constant as the temperature is lowered. Using coherent X-rays and photo-correlation X-ray spectroscopy, it is shown that phason modes are collective diffusive modes, in agreement with the hydrodynamic theory of long wavelength fluctuations in quasicrystals.

X-Ray Diffuse Scattering Investigation of Defects in Ion Implanted and Annealed Silicon

1998 ◽  
Vol 524 ◽  
Author(s):  
C. H. Chang ◽  
U. Beck ◽  
T. H. Metzger ◽  
J. R. Patel
Keyword(s):  
Ion Implantation ◽  
Point Defect ◽  
Point Defects ◽  
Diffuse Scattering ◽  
Grazing Incidence ◽  
X Rays ◽  
Scattered Intensity ◽  
X Ray ◽  
Defect Clusters ◽  
Point Defect Clusters

ABSTRACTTo characterize the point defects and point defect clusters introduced by ion implantation and annealing, we have used grazing incidence x-rays to measure the diffuse scattering in the tails of Bragg peaks (Huang Scattering). An analysis of the diffuse scattered intensity will allow us to characterize the nature of point defects or defect clusters introduced by ion implantation. We have also observed unexpected satellite peaks in the diffuse scattered tails. Possible causes for the occurrence of the peaks will be discussed.

scholarly journals X-Ray Diffuse Scattering Measurements of Nucleation Dynamics at Femtosecond Resolution

2008 ◽  
Vol 100 (13) ◽  
Author(s):  
A. M. Lindenberg ◽  
S. Engemann ◽  
K. J. Gaffney ◽  
K. Sokolowski-Tinten ◽  
J. Larsson ◽  
...  
Keyword(s):  
Diffuse Scattering ◽  
X Ray ◽  
Scattering Measurements

scholarly journals X-Ray and Neutron Diffuse Scattering Measurements

2002 ◽  
Author(s):  
Gene E. Ice ◽  
James L. Robertson ◽  
Cullie J. Sparks
Keyword(s):  
Diffuse Scattering ◽  
X Ray ◽  
Scattering Measurements

scholarly journals High-Precision X-ray Total Scattering Measurements Using a High-Accuracy Detector System

2021 ◽  
Vol 7 (1) ◽  
pp. 2
Author(s):  
Kenichi Kato ◽  
Kazuya Shigeta
Keyword(s):  
High Precision ◽  
Dynamic Range ◽  
Atomic Displacement ◽  
High Accuracy ◽  
Detector System ◽  
Scattering Method ◽  
X Rays ◽  
Total Scattering ◽  
X Ray ◽  
Scattering Measurements

The total scattering method, which is based on measurements of both Bragg and diffuse scattering on an equal basis, has been still challenging even by means of synchrotron X-rays. This is because such measurements require a wide coverage in scattering vector Q, high Q resolution, and a wide dynamic range for X-ray detectors. There is a trade-off relationship between the coverage and resolution in Q, whereas the dynamic range is defined by differences in X-ray response between detector channels (X-ray response non-uniformity: XRNU). XRNU is one of the systematic errors for individual channels, while it appears to be a random error for different channels. In the present study, taking advantage of the randomness, the true sensitivity for each channel has been statistically estimated. Results indicate that the dynamic range of microstrip modules (MYTHEN, Dectris, Baden-Daettwil, Switzerland), which have been assembled for a total scattering measurement system (OHGI), has been successfully restored from 104 to 106. Furthermore, the correction algorithm has been optimized to increase time efficiencies. As a result, the correcting time has been reduced from half a day to half an hour, which enables on-demand correction for XRNU according to experimental settings. High-precision X-ray total scattering measurements, which has been achieved by a high-accuracy detector system, have demonstrated valence density studies from powder and PDF studies for atomic displacement parameters.

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