Interdiffusion in Coherent Si0.90Ge0.10/Si0.95Ge0.05 Superlattices

2003 ◽  
Vol 795 ◽  
Author(s):  
D. B. Aubertine ◽  
P. C. McIntyre
Keyword(s):  
Concentration Dependence ◽  
Activation Enthalpy ◽  
High Sensitivity ◽  
Epitaxial Thin Films ◽  
X Ray Diffraction ◽  
Strained Si ◽  
X Ray ◽  
Compositional Modulation ◽  
X Ray Scattering ◽  
Ray Scattering

ABSTRACTWe present the use of x-ray scattering from Si1-XGeX/Si1-YGeY superlattices as a tool for measuring the concentration dependence of interdiffusivity in Si/SiGe epitaxial thin films. Although x-ray scattering from compositionally modulated films is an ultra-high-sensitivity technique for measuring interdiffusion in a variety of systems, the concentration dependence of Si/SiGe interdiffusion complicates its interpretation. We show that these complications can be avoided using Si1-XGeX/Si1-YGeY superlattices with a small compositional modulation. This strategy is assessed using numerical simulations of both interdiffusion and dynamical x-ray diffraction. We demonstrate its effectiveness by measuring the activation enthalpy and exponential prefactor for interdiffusion in compressively strained Si0.925Ge0.075. The results are 4.38 ± 0.05 eV and 36 ± 9 cm2/s respectively.

Time-resolved isothermal crystallization of absorbable PGA-co-PLA copolymer by synchrotron small-angle X-ray scattering and wide-angle X-ray diffraction

Polymer ◽  
2001 ◽  
Vol 42 (21) ◽  
pp. 8965-8973 ◽  
Author(s):  
Zhi-Gang Wang ◽  
Xuehui Wang ◽  
Benjamin S. Hsiao ◽  
Saša Andjelić ◽  
Dennis Jamiolkowski ◽  
...  
Keyword(s):  
Small Angle ◽  
Isothermal Crystallization ◽  
Wide Angle ◽  
X Ray Diffraction ◽  
Time Resolved ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

A high-throughput assembly of beam-shaping channel-cut monochromators for laboratory high-resolution X-ray diffraction and small-angle X-ray scattering experiments

2021 ◽  
Vol 54 (3) ◽  
Author(s):  
Peter Nadazdy ◽  
Jakub Hagara ◽  
Petr Mikulik ◽  
Zdenko Zaprazny ◽  
Dusan Korytar ◽  
...  
Keyword(s):  
High Resolution ◽  
Small Angle ◽  
Photon Flux ◽  
Photon Flux Density ◽  
X Ray Diffraction ◽  
High Beam ◽  
X Ray ◽  
X Ray Scattering ◽  
Beam Collimation ◽  
Ray Scattering

A four-bounce monochromator assembly composed of Ge(111) and Ge(220) monolithic channel-cut monochromators with V-shaped channels in a quasi-dispersive configuration is presented. The assembly provides an optimal design in terms of the highest transmittance and photon flux density per detector pixel while maintaining high beam collimation. A monochromator assembly optimized for the highest recorded intensity per detector pixel of a linear detector placed 2.5 m behind the assembly was realized and tested by high-resolution X-ray diffraction and small-angle X-ray scattering measurements using a microfocus X-ray source. Conventional symmetric and asymmetric Ge(220) Bartels monochromators were similarly tested and the results were compared. The new assembly provides a transmittance that is an order of magnitude higher and 2.5 times higher than those provided by the symmetric and asymmetric Bartels monochromators, respectively, while the output beam divergence is twice that of the asymmetric Bartels monochromator. These results demonstrate the advantage of the proposed monochromator assembly in cases where the resolution can be partially sacrificed in favour of higher transmittance while still maintaining high beam collimation. Weakly scattering samples such as nanostructures are an example. A general advantage of the new monochromator is a significant reduction in the exposure time required to collect usable experimental data. A comparison of the theoretical and experimental results also reveals the current limitations of the technology of polishing hard-to-reach surfaces in X-ray crystal optics.

Evidence of a single-q incommensurate phase in quartz by synchrotron X-ray diffraction

1988 ◽  
Vol 21 (1) ◽  
pp. 72-74 ◽  
Author(s):  
A. Zarka ◽  
B. Capelle ◽  
M. Petit ◽  
G. Dolino ◽  
P. Bastie ◽  
...  
Keyword(s):  
Neutron Scattering ◽  
Uniaxial Stress ◽  
Incommensurate Phase ◽  
X Ray Diffraction ◽  
X Ray ◽  
X Ray Scattering ◽  
Good Agreement ◽  
Ray Scattering

X-ray scattering is used to demonstrate the existence in quartz of an incommensurate phase with a single modulation when a uniaxial stress is applied in the X Y plane. Good agreement with earlier neutron scattering experiments is found.

Structural Study of a Decagonal Al75Fe15Ni10 Alloy by Anomalous X-ray Scattering (AXS) Method

1991 ◽  
Vol 46 (7) ◽  
pp. 605-608 ◽  
Author(s):  
E. Matsubara ◽  
Y. Waseda ◽  
A. P. Tsai ◽  
A. Inoue ◽  
T. Masumoto
Keyword(s):  
Structural Study ◽  
Radial Distribution ◽  
Distribution Functions ◽  
Radial Distribution Functions ◽  
X Ray Diffraction ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

A structural study of an as-quenched decagonal Al75Fe15Ni10 alloy has been carried out by anomalous x-ray scattering (AXS) as well as ordinary x-ray diffraction. The environmental radial distribution functions (RDFs) for Fe and Ni determined by the AXS measurements turned out to resemble each other and to be similar to the ordinary RDF obtained by ordinary x-ray diffraction. These results clearly show that the Ni and Fe atoms are homogeneously distributed and occupy the same sites in the decagonal structure of Al75Fe15Ni10.

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