Time-Resolved Saxs and Waxs Studies on Ordering Process in Oriented Crystallization of Polymers

1986 ◽  
Vol 79 ◽  
Author(s):  
Kenji Saijo ◽  
Takeji Hashimoto
Keyword(s):  
Structure Evolution ◽  
X Ray Diffraction ◽  
Time Resolved ◽  
X Ray ◽  
X Ray Scattering ◽  
Oriented Crystallization ◽  
Polybutadiene Rubber ◽  
Integrated Intensity ◽  
Crystallization Of Polymers ◽  
As Stress

AbstractMechanism and dynamics of the ordering process in oriented crystallization of polymers were investigated by time-resolved small-angle X-ray scattering (SAXS) and wide-angle X-ray diffraction (WAXS). As a model system for the oriented crystallization, a cross-linked polybutadiene rubber with a high cis-1,4-linkage was chosen, and the structure evolution during the isothermal crystallization was investigated under constant elongations by real time and in situ analyses of the microscopic observables such as long spacing, crystallite size, SAXS integrated intensity, WAXS crystallinity and WAXS line width as well as a macroscopic observable such as stress. The isothermal ordering processes were explored in three different crystallization regimes: crystallization from (i) unoriented melts, (ii) weakly-to-moderately oriented melts and (iii) highly oriented melts.

Time-resolved isothermal crystallization of absorbable PGA-co-PLA copolymer by synchrotron small-angle X-ray scattering and wide-angle X-ray diffraction

Polymer ◽  
2001 ◽  
Vol 42 (21) ◽  
pp. 8965-8973 ◽  
Author(s):  
Zhi-Gang Wang ◽  
Xuehui Wang ◽  
Benjamin S. Hsiao ◽  
Saša Andjelić ◽  
Dennis Jamiolkowski ◽  
...  
Keyword(s):  
Small Angle ◽  
Isothermal Crystallization ◽  
Wide Angle ◽  
X Ray Diffraction ◽  
Time Resolved ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Oriented crystallization of cross-linked polybutadiene rubber. 2. Small-angle and wide-angle x-ray scattering studies of crystal orientation

1985 ◽  
Vol 18 (3) ◽  
pp. 472-482 ◽  
Author(s):  
Takeji Hashimoto ◽  
Kenji Saijo ◽  
Michl Kosc ◽  
Hiromichi Kawai ◽  
Andrzej Wasiak ◽  
...  
Keyword(s):  
Small Angle ◽  
Crystal Orientation ◽  
Wide Angle ◽  
X Ray ◽  
X Ray Scattering ◽  
Oriented Crystallization ◽  
Polybutadiene Rubber ◽  
Ray Scattering

A method of material design for systematic absence of X-ray diffraction

2010 ◽  
Vol 25 (S1) ◽  
pp. S48-S51
Author(s):  
Huan-hua Wang
Keyword(s):  
Solid Solution ◽  
Structure Factor ◽  
Material Design ◽  
Unit Cell ◽  
X Ray Diffraction ◽  
Time Resolved ◽  
Xrd Pattern ◽  
X Ray ◽  
X Ray Scattering ◽  
Calculation Process

Materials with systematic absence of X-ray diffraction (XRD) peaks are desirable for conducting some special researches using X-ray diffraction or time-resolved X-ray scattering. This paper proposes a method for designing this kind of materials. It utilizes solid solution to reduce the structure factor of a selected reflection to zero by choosing proper components and their contents to let the reflection amplitudes from different atomic layers in a unit cell of the solid solution cancel each other completely. This method on how to select a solid solvent and how to calculate its content was illustrated using SrTiO3 as an example. A solid solution Sr1−xCaxTiO3 with a systematic absence of the (001) diffraction can be designed, and the value of x can be determined to be x=0.54 using an iteration calculation process. This result was verified by the experimental XRD pattern of a Sr0.46Ca0.54TiO3 sample.

scholarly journals On the possibility of the Observation of Intramolecular Reaction Dynamics in Liquids by Time-resolved X-ray Scattering

2002 ◽  
Vol 216 (5) ◽  
Author(s):  
S. Techert ◽  
S. Schmatz
Keyword(s):  
Gas Phase ◽  
Free Electron Laser ◽  
Structural Changes ◽  
Reaction Dynamics ◽  
Structural Studies ◽  
X Ray Diffraction ◽  
Time Resolved ◽  
X Ray ◽  
X Ray Scattering ◽  
Trans Stilbene

The feasibility of time-resolved structural studies using pulsed X-ray radiation from a 3rd generation synchrotron is discussed and compared with scattering experiments which might be possible with a future free electron laser (X-FEL). As an example, it is shown that the structural changes during the isomerisation process of trans-stilbene into cis-stilbene can be observed using time-resolved X-ray diffraction in the gas-phase as well as in solution.

New Insight of Isothermal Melt Crystallization in Poly(aryl ether ether ketone) via Time-Resolved Simultaneous Small-Angle X-ray Scattering/Wide-Angle X-ray Diffraction Measurements

1995 ◽  
Vol 28 (20) ◽  
pp. 6931-6936 ◽  
Author(s):  
Benjamin S. Hsiao ◽  
Bryan B. Sauer ◽  
Ravi K. Verma ◽  
H. Gerhard Zachmann ◽  
Soenke Seifert ◽  
...  
Keyword(s):  
Small Angle ◽  
Wide Angle ◽  
Melt Crystallization ◽  
Aryl Ether ◽  
X Ray Diffraction ◽  
Time Resolved ◽  
X Ray ◽  
X Ray Scattering ◽  
Ether Ether Ketone ◽  
Ether Ketone

scholarly journals Probing Electronic Strain Generation by Separated Electron-Hole Pairs Using Time-Resolved X-ray Scattering

2019 ◽  
Vol 9 (22) ◽  
pp. 4788
Author(s):  
Sooheyong Lee ◽  
Wonhyuk Jo ◽  
Anthony D. DiChiara ◽  
Timothy P. Holmes ◽  
Stephen Santowski ◽  
...  
Keyword(s):  
Charge Carriers ◽  
Excess Charge ◽  
X Ray Diffraction ◽  
Electron Hole ◽  
Time Resolved ◽  
Transient Conditions ◽  
Strain Measurements ◽  
X Ray ◽  
X Ray Scattering ◽  
Photoinduced Charge

Photogeneration of excess charge carriers in semiconductors produces electronic strain. Under transient conditions, electron-hole pairs may be separated across a potential barrier. Using time-resolved X-ray diffraction measurements across an intrinsic AlGaAs/n-doped GaAs interface, we find that the electronic strain is only produced by holes, and that electrons are not directly observable by strain measurements. The presence of photoinduced charge carriers in the n-doped GaAs is indirectly confirmed by delayed heat generation via recombination.

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