Raman Spectra of Srm-3Bi4TimO3m+3 Thin Films
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ABSTRACTA series of bismuth layer-structured ferroelectrics thin films Srm-3Bi4TimO3m+3(m=3, 4, 5, and 6) were deposited by pulsed laser deposition (PLD) on (001) LaAlO3 single crystal substrate. XRD and Raman studies have been performed. The more sensitive Raman spectra lead to a different understanding on the layer structure of Sr3Bi4Ti6O21 from XRD. This can be attributed to the lager c-axis constant of Sr3Bi4Ti6O21 due to more layers. More layers lead to increasing disorder in the local scale of the average grain.
2013 ◽
Vol 229
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pp. 162-164
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2005 ◽
Vol 15
(2)
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pp. 3046-3049
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2015 ◽
Vol 135
(9)
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pp. 1096-1097
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2017 ◽
Vol 5
(31)
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pp. 7720-7725
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