Yield of InxGa1-xAs Superlattices Under Bending and Nanoindentation

2003 ◽  
Vol 778 ◽  
Author(s):  
Stephen J. Lloyd ◽  
Ken M.Y. P'ng ◽  
Andy J. Bushby ◽  
David J. Dunstan ◽  
William J. Clegg
Keyword(s):  
Room Temperature ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Misfit Dislocations ◽  
Thin Sections ◽  
Transmission Electron ◽  
Inp Substrate ◽  
Highly Strained ◽  
Inp Substrates ◽  
Coherency Strains

AbstractA series of InxGa1-xAs superlattices grown on InP substrates with differing coherency strains have been deformed by bending at 500°C and by nanoindentation at room temperature. The deformation was characterised by transmission electron microscopy through examination of thin sections machined in a focused ion beam microscope. The bent samples sheared along {111} planes, and the most highly strained samples partially relaxed through the formation of misfit dislocations. Under indentation the majority of the plastic strain in the multilayers is accommodated by twinning whereas no twins were observed under indents in the InP substrate. The overall dimensions of the plastic zone increased linearly with indent load.

Using the Focused Ion Beam to Perform Serial Sectioning of Micron-Sized Particles for Coordinated Nanoscale Analysis

2008 ◽  
Vol 1089 ◽  
Author(s):  
Nabil D. Bassim ◽  
Bradley T. De Gregorio ◽  
Rhonda M. Stroud
Keyword(s):  
Focused Ion Beam ◽  
Electronic Device ◽  
Ion Beam ◽  
Forensic Analysis ◽  
Dust Particles ◽  
Serial Sectioning ◽  
Tem Analysis ◽  
Thin Sections ◽  
Transmission Electron ◽  
Section Form

AbstractStandard Focused Ion Beam (FIB) lift-out methods for production of transmission electron microscopy (TEM) thin sections destroy many cubic microns of material in order to produce a single 100-nm thick section. Microtome sectioning, in contrast, allows serial sectioning of adjacent multiple 100-nm sections, without loss of materials between sections, but lacks site specificity. In order to maximize the yield of analyzable material in thin section form from valuableone-of-a kind- micron-sized samples, we have developed serial sectioning techniques that combine FIB lift-out with microtomy. In this paper, we show an example of sectioning and subsequent TEM analysis of simulated cometary residues which resemble impact craters collected during the NASA Stardust Mission. These techniques may be generalized to any one-of-a-kind sample for which preserving analyzable volume is critical, such as forensic analysis of dust particles, failure analysis and electronic device sectioning.

Toughening of Brittle Materials by Dislocation Cells

2001 ◽  
Vol 7 (S2) ◽  
pp. 420-421
Author(s):  
H. Saka ◽  
W.-J. Moon ◽  
S. Horiuchi ◽  
S. Uchimura
Keyword(s):  
Fracture Toughness ◽  
Room Temperature ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Brittle Materials ◽  
Thin Foil ◽  
Vickers Indentation ◽  
Transmission Electron ◽  
Dislocation Cells ◽  
Metallurgical Processes

Many attempts have been made to improve the fracture toughness of brittle materials such as ceramics. Most of the methods developed so far make use of metallurgical processes, for example, phase transformation, refining of grains, formation of composite materials. However, these methods can not be applied universally to brittle materials which do not have such a useful metallurgical processes.Moon and Saka (1) recently showed that the fracture toughness Klc of a YAG single crystal the sub-surface of which is damaged by micro-Vickers indentation at room temperature, followed by annealing at high temperatures is improved by a factor 2 from 1.13 to 2.26MPam1/2. The fracture toughness Klc was evaluated by measuring the length of cracks which initiate at the corner of Vickers indentation(2). Transmission electron microscopy of the subsurface reveals the healing of cracks introduced by room-temperature indentation and formation of dislocation cells. The thin foil specimens were prepared using a focused ion beam (FIB) technique(3).

TEM Sample Preparation of Polymer Based Nanocomposites using Focused Ion Beam Technique

2001 ◽  
Vol 7 (S2) ◽  
pp. 946-947
Author(s):  
H. Miyagawa ◽  
W.-A. Chiou ◽  
I.M. Daniel
Keyword(s):  
Sample Preparation ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Polymer Nanocomposite ◽  
Clay Nanocomposites ◽  
Thin Sections ◽  
Clay Particles ◽  
Reinforced Plastics ◽  
Chemical Company ◽  
Transmission Electron

Recently, several studies have been conducted to investigate the behavior of polymer based composites reinforced with clay particles, which can remarkably improve the properties of the polymers. Studies using transmission electron microscopy (TEM) are necessary to understand the role of clay minerals/particles in the reinforcing effect in the polymer based materials. TEM sample preparation of polymer/clay nanocomposites using conventional techniques has been difficult and tedious. Nevertheless, the focused ion beam (FIB) technique for preparing metal and ceramic samples provides another method for preparing polymer nanocomposite samples. This paper presents a new approach for preparing TEM specimens of the polymer nanocomposites using the FIB technique.Two types of epoxy (Dow Chemical Company, DER 331) nanocomposite samples were investigated: one containing 7.5 wt.% organomontmorillonite clay (Southern Clay Products Inc., Cloisite 30B) and the other (carbon fiber reinforced plastics; CFRP) containing carbon fibers (Hexel Fibers, AS4) in addition to 5 wt. % clay. Details of preparing the epoxy based clay nanocomposites will be published elsewhere. Procedures for preparing TEM thin sections using FIB were based on techniques developed by Ramirez de Arellano et al.

Sectioning of Individual Hematite Pseudocubes with Focused Ion Beam Enables Quantitative Structural Characterization at Nanometer Length Scales

2014 ◽  
Vol 20 (2) ◽  
pp. 635-644 ◽  
Author(s):  
Emily Asenath-Smith ◽  
Lara A. Estroff
Keyword(s):  
Electron Diffraction ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Thin Sections ◽  
Selected Area Electron Diffraction ◽  
Dual Beam ◽  
Transmission Electron ◽  
Lattice Misorientation ◽  
The Individual ◽  
Electron Microanalysis

AbstractA dual-beam focused ion beam microscope equipped with a nanomanipulator was used to fabricate slices from within individual hematite (α-Fe2O3) pseudocubes with selected orientations with respect to the original pseudocubes. Transmission electron microanalysis through selected area electron diffraction enabled assignment of each thin section to a particular zone of the hematite lattice. While the pseudocubes are composed of numerous crystallites, 25–50 nm in size, they are not simply polycrystalline particles. Electron diffraction of thin sections showed that while the pseudocubic hematite particles are composed of numerous coherent domains, the individual thin sections display a net crystallographic orientation to the underlying hematite lattice. Quantitative analysis of the lattice misorientation between coherent domains was calculated from the azimuthal spread of electron diffraction peaks and is consistent with a structure that contains small-angle grain boundaries. Based upon this analysis, we conclude that the pseudocubic hematite particles are mosaic crystals, composed of highly oriented coherent domains.

A TEM study of the interface between organic matrix and aragonite in a biological hard tissue, nacre

1992 ◽  
Vol 50 (2) ◽  
pp. 1024-1025
Author(s):  
Jun Liu ◽  
Katie E. Gunnison ◽  
Mehmet Sarikaya ◽  
Ilhan A. Aksay
Keyword(s):  
Mechanical Properties ◽  
Ion Beam ◽  
Laminated Composite ◽  
Organic Matrix ◽  
Pearl Oyster ◽  
Interfacial Structure ◽  
Interfacial Region ◽  
Thin Sections ◽  
Organic Layers ◽  
Transmission Electron

The interfacial structure between the organic and inorganic phases in biological hard tissues plays an important role in controlling the growth and the mechanical properties of these materials. The objective of this work was to investigate these interfaces in nacre by transmission electron microscopy. The nacreous section of several different seashells -- abalone, pearl oyster, and nautilus -- were studied. Nacre is a laminated composite material consisting of CaCO3 platelets (constituting > 90 vol.% of the overall composite) separated by a thin organic matrix. Nacre is of interest to biomimetics because of its highly ordered structure and a good combination of mechanical properties. In this study, electron transparent thin sections were prepared by a low-temperature ion-beam milling procedure and by ultramicrotomy. To reveal structures in the organic layers as well as in the interfacial region, samples were further subjected to chemical fixation and labeling, or chemical etching. All experiments were performed with a Philips 430T TEM/STEM at 300 keV with a liquid Nitrogen sample holder.

Observations of thick and thin sections in a field-emission SEM

1994 ◽  
Vol 52 ◽  
pp. 1018-1019
Author(s):  
W. P. Wergin ◽  
S. Roy ◽  
E. F. Erbe ◽  
C. A. Murphy ◽  
C. D. Pooley
Keyword(s):  
Electron Microscope ◽  
Field Emission ◽  
Room Temperature ◽  
Osmium Tetroxide ◽  
Uranyl Acetate ◽  
Chemical Fixation ◽  
Thin Sections ◽  
Transmission Electron ◽  
Conventional Transmission Electron Microscope ◽  
Scanning Electron

Larvae of the nematode, Steinernema carpocapsae Weiser strain All, were cryofixed and freezesubstituted for 3 days in acetone containing 2% osmium tetroxide according to established procedures. Following chemical fixation, the nematodes were brought to room temperature, embedded in Spurr's medium and sectioned for observation with a Hitachi S-4100 field emission scanning electron microscope that was equipped with an Oxford CT 1500 Cryotrans System. Thin sections, about 80 nm thick, similar to those generally used in conventional transmission electron microscope (TEM) studies were mounted on copper grids and stained with uranyl acetate for 30 min and lead citrate for 5 min. Sections about 2 μm thick were also mounted and stained in a similar fashion. The grids were mounted on an Oxford grid holder, inserted into the microscope and onto a cryostage that was operated at ambient temperature. Thick and thin sections of the larvae were evaluated and photographed in the SEM at different accelerating voltages. Figs. 4 and 5 have undergone contrast conversion so that the images would resemble transmitted electron micrographs obtained with a TEM.

Nanocomposite Polyurethane Foams Via POSS Blends

2002 ◽  
Vol 733 ◽  
Author(s):  
Brock McCabe ◽  
Steven Nutt ◽  
Brent Viers ◽  
Tim Haddad
Keyword(s):  
High Temperature ◽  
Sample Preparation ◽  
Room Temperature ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Polyurethane Foams ◽  
Development Projects ◽  
Polymer Systems ◽  
Polyurethane Resin ◽  
Military Development

AbstractPolyhedral Oligomeric Silsequioxane molecules have been incorporated into a commercial polyurethane formulation to produce nanocomposite polyurethane foam. This tiny POSS silica molecule has been used successfully to enhance the performance of polymer systems using co-polymerization and blend strategies. In our investigation, we chose a high-temperature MDI Polyurethane resin foam currently used in military development projects. For the nanofiller, or “blend”, Cp7T7(OH)3 POSS was chosen. Structural characterization was accomplished by TEM and SEM to determine POSS dispersion and cell morphology, respectively. Thermal behavior was investigated by TGA. Two methods of TEM sample preparation were employed, Focused Ion Beam and Ultramicrotomy (room temperature).

Low Energy Ar Ion Milling of FIB TEM Specimens from 14 nm and Future FinFET Technologies

2018 ◽  
Author(s):  
C.S. Bonifacio ◽  
P. Nowakowski ◽  
M.J. Campin ◽  
M.L. Ray ◽  
P.E. Fischione
Keyword(s):  
Field Effect Transistor ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Specimen Preparation ◽  
Ion Milling ◽  
Transmission Electron ◽  
High Resolution Tem ◽  
Effect Transistor ◽  
20 Nm ◽  
Argon Ion

Abstract Transmission electron microscopy (TEM) specimens are typically prepared using the focused ion beam (FIB) due to its site specificity, and fast and accurate thinning capabilities. However, TEM and high-resolution TEM (HRTEM) analysis may be limited due to the resulting FIB-induced artifacts. This work identifies FIB artifacts and presents the use of argon ion milling for the removal of FIB-induced damage for reproducible TEM specimen preparation of current and future fin field effect transistor (FinFET) technologies. Subsequently, high-quality and electron-transparent TEM specimens of less than 20 nm are obtained.

TEM Sample Preparation Tricks for Advanced DRAMs

2015 ◽  
Author(s):  
Ching Shan Sung ◽  
Hsiu Ting Lee ◽  
Jian Shing Luo
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Sample Preparation ◽  
Integrated Circuit ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Tem Analysis ◽  
Cross Sectional ◽  
Transmission Electron ◽  
Characterization Of Materials

Abstract Transmission electron microscopy (TEM) plays an important role in the structural analysis and characterization of materials for process evaluation and failure analysis in the integrated circuit (IC) industry as device shrinkage continues. It is well known that a high quality TEM sample is one of the keys which enables to facilitate successful TEM analysis. This paper demonstrates a few examples to show the tricks on positioning, protection deposition, sample dicing, and focused ion beam milling of the TEM sample preparation for advanced DRAMs. The micro-structures of the devices and samples architectures were observed by using cross sectional transmission electron microscopy, scanning electron microscopy, and optical microscopy. Following these tricks can help readers to prepare TEM samples with higher quality and efficiency.

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